摘要:
Circuits, integrated circuits, apparatuses, and methods, such as those for protecting circuits against electrostatic discharge events are disclosed. In an example method, a thyristor is triggered to conduct current from a signal node to a reference voltage node using leakage currents provided by a transistor formed in a semiconductor doped well shared with the base of the thyristor. The leakage currents are responsive to a noise event (e.g., electrostatic discharge (ESD) event) at the signal node, and increase the voltage of the semiconductor doped well to forward bias the base and the collector of the thyristor. The triggered thyristor conducts the current resulting from the ESD event to the reference voltage node.
摘要:
Circuits, integrated circuits, apparatuses, and methods, such as those for protecting circuits against electrostatic discharge events are disclosed. In an example method, a thyristor is triggered to conduct current from a signal node to a reference voltage node using leakage currents provided by a transistor formed in a semiconductor doped well shared with the base of the thyristor. The leakage currents are responsive to a noise event (e.g., electrostatic discharge (ESD) event) at the signal node, and increase the voltage of the semiconductor doped well to forward bias the base and the collector of the thyristor. The triggered thyristor conducts the current resulting from the ESD event to the reference voltage node.
摘要:
A cascode I/O driver is described that includes a barrier formed in the shared region between the two transistors. The barrier region allows the I/O driver to be designed to primarily meet I/O requirements. Accordingly, improved operating speeds are achieved. An system is described that includes an I/O driver in parallel with an ESD device. In an embodiment, the I/O driver may assist the ESD device in discharging electrostatic, after the ESD begins conducting.
摘要:
A cascode I/O driver is described that includes a barrier formed in the shared region between the two transistors. The barrier region allows the I/O driver to be designed to primarily meet I/O requirements. Accordingly, improved operating speeds are achieved. An system is described that includes an I/O driver in parallel with an ESD device. In an embodiment, the I/O driver may assist the ESD device in discharging electrostatic, after the ESD begins conducting.
摘要:
A method of reducing parasitic capacitance in an integrated circuit having three or more metal levels is described. The method comprises forming a bond pad at least partially exposed at the top surface of the integrated circuit, forming a metal pad on the metal level below the bond pad and forming an underlying metal pad on each of the one or more lower metal levels. In the illustrated embodiments, the ratio of an area of at least one of the underlying metal pads to the area of the bond pad is less than 30%. Parasitic capacitance is thus greatly reduced and signal propagation speeds improved.
摘要:
An integrated circuit includes a voltage supply internal to the integrated circuit and circuitry for sensing the voltage level of the internal voltage supply, the circuitry responsive to produce a flag signal, VPUEN, that is in a first logical state when the voltage level is below the desired level and in a second logical state when the voltage level is above the desired level. The integrated circuit also includes a buffer driver 406 having an input terminal and an output terminal, the input terminal being coupled to the circuitry for sensing the voltage level of the internal voltage supply. The operation of the circuit is such that the output terminal 400 of the buffer driver is in a high-impedance state when the flag signal is in the first logical state, and is responsive to data signals on the input terminal to produce corresponding output signals at the output terminal when the flag signal is in the second logical state.
摘要:
Apparatuses, circuits, and methods are disclosed for biased protection circuits for dual-direction nodes. In one such example apparatus, a protection circuit is coupled to a dual-direction node, and includes a positive protection component and a negative protection component. The protection circuit is configured to protect the dual-direction node during an over-limit electrical condition. The protection circuit is configured to control a turn-on condition of the protection circuit.
摘要:
An output driver circuit for a semiconductor device. In one embodiment, the output driver is coupled to an output terminal of the semiconductor device and consists of an N-channel pull-down transistor and a P-channel pull-up transistor formed in an N-well in a P-type substrate. A tie-down region formed in the N-well is selectively coupled to a supply potential by means of a decoupling transistor, and during normal operation of the driver maintains the supply voltage bias of the N-well. An overdrive detection circuit is coupled to the output terminal. Upon detection of an overdrive condition on the output terminal, such as a voltage exceeding a predetermined maximum, or excessive current injected into the output terminal (or both), the overdrive detection circuit deasserts a control signal applied to the gate of the decoupling transistor, thereby decoupling the N-well from the supply potential. In one embodiment, the decoupling transistor is not coupled to the output terminal.
摘要:
An embodiment of the instant invention is an ESD protection circuit (100) for protecting a circuit from negative stress, the ESD protection circuit comprising: a first terminal (102); a second terminal (104), the circuit to be protected connected between the first and the second terminals; a substrate (202) of a first conductivity type; a first doped region (206) of a second conductivity type opposite the first conductivity type and formed in the substrate, the first doped region forming the source of a transistor; a second doped region (208) of the second conductivity and formed in the substrate spaced from the first doped region by a channel region, the second doped region forming the drain of the transistor; a first diode region (210) of the first conductivity type and formed in the substrate, the first diode region being spaced a minimum distance from the second doped region and wherein the first diode region forms the anode of a diode (108) and the second doped region forms the cathode of the diode; and wherein the diode and the transistor (106) are connected between the first terminal and the second terminal, the diode protects the transistor and the circuit during the negative stress.
摘要:
Apparatuses, circuits, and methods are disclosed for biased protection circuits for dual-direction nodes. In one such example apparatus, a protection circuit is coupled to a dual-direction node, and includes a positive protection component and a negative protection component. The protection circuit is configured to protect the dual-direction node during an over-limit electrical condition. The protection circuit is configured to control a turn-on condition of the protection circuit.