Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures
    1.
    发明授权
    Method for fabricating integrated circuit (IC) dies with multi-layered interconnect structures 失效
    具有多层互连结构的集成电路(IC)芯片的制造方法

    公开(公告)号:US06423558B1

    公开(公告)日:2002-07-23

    申请号:US09512780

    申请日:2000-02-25

    IPC分类号: G01R3126

    摘要: In a method for fabricating an LSI in which primitive devices such as transistors are formed on a semiconductor substrate and a plurality of interconnect layers are formed thereover to provide sub-circuits of successively larger scale and increasing complexity including sub-circuits which are formed by a connection of the primitive devices and sub-circuits of a larger scale which are formed by a connection of the sub-circuits, under a condition that an intermediate interconnect layer is formed, an exhaustive test, a functional test, a stuck-at fault test, a quiescent power supply current test or the like takes place with respect to the primitive devices or the sub-circuits which are wired together by the intermediate interconnect layer, and subsequently, a wiring connection test takes place after the formation of each subsequent interconnect layer. A fault coverage is improved while a testing cost and a fabricating cost are reduced.

    摘要翻译: 在制造LSI的方法中,其中在半导体衬底上形成诸如晶体管的基本器件,并在其上形成多个互连层,以提供连续更大规模的子电路和增加复杂性的子电路,包括由 在形成中间互连层的条件下,通过子电路的连接形成的较大规模的原始器件和子电路的连接,穷举测试,功能测试,卡入故障测试 ,相对于通过中间互连层连接在一起的原始器件或子电路进行静态电源电流测试等,随后在形成每个后续互连层之后进行布线连接测试 。 提高了故障覆盖率,同时降低了测试成本和制造成本。

    Apparatus for measuring jitter and method of measuring jitter
    2.
    发明授权
    Apparatus for measuring jitter and method of measuring jitter 有权
    用于测量抖动的装置和测量抖动的方法

    公开(公告)号:US07496137B2

    公开(公告)日:2009-02-24

    申请号:US11137786

    申请日:2005-05-25

    IPC分类号: H04B3/46

    CPC分类号: G01R31/31709

    摘要: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.

    摘要翻译: 提供了一种用于测量测量信号中的抖动的抖动测量装置,包括:脉冲发生部分,具有用于检测数据信号低于测量值的边缘的第一脉冲发生装置,以输出具有脉冲宽度的第一脉冲信号 对于边缘进行预先设定的第二脉冲发生装置,用于检测在数据信号不足测量中数据值不变化的数据部分的边界,以输出预先设定在边缘定时上的脉冲宽度的第二脉冲信号 检测数据部分的边界和抖动计算部分,用于基于第一和第二脉冲信号计算测量数据信号中的定时抖动。

    Apparatus for and method of measuring jitter
    3.
    发明授权
    Apparatus for and method of measuring jitter 有权
    测量抖动的装置和方法

    公开(公告)号:US07203229B1

    公开(公告)日:2007-04-10

    申请号:US09882290

    申请日:2001-06-14

    IPC分类号: H04B17/00 G01R13/02

    CPC分类号: G01R31/31709 G01R29/26

    摘要: A signal under measurement is band-limited, and frequency components around a fundamental frequency of the signal under measurement are extracted. Waveform data (approximated zero-crossing data) close to zero-crossing timings of the band-limited signal are sampled, and phase error data between the approximated zero-crossing points and the corresponding zero-crossing points of the signal under measurement are calculated from the approximated zero-crossing data to obtain a zero-crossing phase error data sequence δ[k]. Then an instantaneous period sequence T(k) of the signal under measurement is obtained from the zero-crossing phase error data and sampling intervals Tk,k+1 of the approximated zero-crossing data sequence. Then a period jitter sequence is obtained from differences between the T(k) and a fundamental period T0 of the signal under measurement, and then the period jitter sequence is multiplied by T0/Tk,k+1 to correct the period jitter sequence.

    摘要翻译: 被测信号被限制频带,提取测量信号的基频周围的频率分量。 对接近频带限制信号的零交叉定时的波形数据(近似过零数据)进行采样,并计算近似过零点与测量信号的相应过零点之间的相位误差数据, 近似的过零数据以获得过零相位误差数据序列delta [k]。 然后,根据近似的过零数据序列的过零相位误差数据和采样间隔T k,k + 1,获得测量信号的瞬时周期序列T(k)。 然后,从测量信号的T(k)和基波周期T 0 <0>之间的差值获得周期抖动序列,然后将周期抖动序列乘以T 0 SUB / T k,k + 1 以校正周期抖动序列。

    Phase difference detecting apparatus
    4.
    发明申请
    Phase difference detecting apparatus 审中-公开
    相位差检测装置

    公开(公告)号:US20060087346A1

    公开(公告)日:2006-04-27

    申请号:US10971716

    申请日:2004-10-22

    IPC分类号: H03D13/00

    CPC分类号: H03D13/004 H03L7/0891

    摘要: There is provided a phase difference detecting apparatus operable to detect the phase difference between a first input signal and a second input signal. The phase detecting apparatus includes: a first divider operable to generate a first divided signal, which is the first input signal divided by two, so that all rising edges of the first input signal correspond to a rising edge and a falling edge of the first divided signal; a second divider operable to generate a second divided signal, which is the second input signal divided by two, so that the first divided signal corresponds to edges; a first phase detector operable to detect a phase difference between a rising edge of the first divided signal and an edge corresponding to the rising edge in the second divided signal; and a second phase detector operable to detect a phase difference between a falling edge of the first divided signal and an edge corresponding to the falling edge in the second divided signal.

    摘要翻译: 提供了一种相位差检测装置,用于检测第一输入信号和第二输入信号之间的相位差。 相位检测装置包括:第一分频器,用于产生第一分频信号,第一分频信号是第二输入信号除以2,使得第一输入信号的所有上升沿对应于第一分频信号的上升沿和下降沿 信号; 第二分频器,用于产生第二分频信号,其是第二输入信号除以2,使得第一分频信号对应于边缘; 第一相位检测器,用于检测第一分频信号的上升沿和对应于第二分频信号中的上升沿的边沿之间的相位差; 以及第二相位检测器,其可操作以检测第一分频信号的下降沿和对应于第二分频信号中的下降沿的边沿之间的相位差。

    Jitter measurement apparatus and its method
    5.
    发明授权
    Jitter measurement apparatus and its method 有权
    抖动测量装置及其方法

    公开(公告)号:US06598004B1

    公开(公告)日:2003-07-22

    申请号:US09650000

    申请日:2000-08-28

    IPC分类号: G06F1900

    摘要: A signal under measurement is converted into a digital signal by an AD converter, and a band-pass filtering process is applied to the digital signal to take out only components around a fundamental frequency of the signal under measurement. A data around a zero-crossing of the components around the fundamental frequency is interpolated to estimate a timing close to a zero-crossing point. A difference between adjacent timings in the estimated zero-crossing timing sequence is calculated to obtain an instantaneous period data sequence. A period jitter is obtained from the instantaneous period data sequence.

    摘要翻译: 通过AD转换器将测量信号转换为数字信号,对数字信号施加带通滤波处理,仅取出测量信号的基频附近的分量。 围绕基本频率的分量的零交叉周围的数据被内插以估计接近零交叉点的时序。 计算估计过零定时序列中的相邻定时之间的差异以获得瞬时周期数据序列。 从瞬时周期数据序列获得周期抖动。

    Apparatus for measuring jitter and method of measuring jitter
    6.
    发明授权
    Apparatus for measuring jitter and method of measuring jitter 失效
    用于测量抖动的装置和测量抖动的方法

    公开(公告)号:US07460592B2

    公开(公告)日:2008-12-02

    申请号:US11122262

    申请日:2005-05-04

    IPC分类号: H04B3/46 H04B17/00 H03K9/00

    CPC分类号: G01R31/31709

    摘要: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, having a signal converting section for calculating a spectrum of the signal-under-measurement, a bandwidth calculating section for calculating frequency where a saturation rate of a value of the integrated spectrum of the signal-under-measurement becomes almost equal to a saturation rate set in advance in a band-to-be-measured set in advance as upper cutoff frequency of the band-to-be-measured to calculate the jitter and a jitter calculating section for measuring the jitter in the signal-under-measurement based on the spectaum in the band-to-be-measured of the signal-under-measurement.

    摘要翻译: 提供了一种用于测量测量信号中的抖动的抖动测量装置,具有用于计算测量信号的频谱的信号转换部分,用于计算频率的饱和率的频率的带宽计算部分, 信号未测量的综合频谱几乎等于预先设定在要测量的频带中的设定​​的饱和速率,作为要测量的频带的上限截止频率以计算抖动,并且 抖动计算部分,用于根据待测信号的测量范围内的光谱测量测量信号中的抖动。

    Apparatus for and method of measuring clock skew
    7.
    发明授权
    Apparatus for and method of measuring clock skew 失效
    仪器和测量时钟偏移的方法

    公开(公告)号:US07356109B2

    公开(公告)日:2008-04-08

    申请号:US11585526

    申请日:2006-10-23

    IPC分类号: H04L7/00

    摘要: Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).

    摘要翻译: (t)和x k(t),并且计算那些定时抖动序列之间的定时差异序列。 另外,x 0 和&lt; 0&lt; 0&gt; (t)和x(k)分别被估计。 计算出这些初始角度和定时差分序列之间的差值的和,以获得x j(t)和x k(t)之间的时钟偏移序列。

    Apparatus for and method of measuring clock skew
    8.
    发明申请
    Apparatus for and method of measuring clock skew 失效
    仪器和测量时钟偏移的方法

    公开(公告)号:US20070036256A1

    公开(公告)日:2007-02-15

    申请号:US11585526

    申请日:2006-10-23

    IPC分类号: H04L7/00

    摘要: Timing jitter sequences Δφj[n] and Δφk[n] of respective clock signals under measurement xj(t) and xk(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles φ0j and φ0k of linear instantaneous phases of the xj(t) and xk(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the xj(t) and xk(t).

    摘要翻译: (t)和x k(t),并且计算那些定时抖动序列之间的定时差异序列。 另外,x 0 和&lt; 0&lt; 0&gt; (t)和x(k)分别被估计。 计算出这些初始角度和定时差分序列之间的差值的和,以获得x j(t)和x k(t)之间的时钟偏移序列。

    Apparatus for measuring jitter and method of measuring jitter

    公开(公告)号:US20060268970A1

    公开(公告)日:2006-11-30

    申请号:US11137786

    申请日:2005-05-25

    IPC分类号: H04B3/46

    CPC分类号: G01R31/31709

    摘要: There is provided a jitter measuring apparatus for measuring jitter in a signal-under-measurement, including a pulse generating section having first pulse generating means for detecting edges of the data-signal-under-measurement to output a first pulse signal having a pulse width set in advance corresponding to the edge and second pulse generating means for detecting boundaries of data sections where data values do not change in the data-signal-under-measurement to output a second pulse signal having a pulse width set in advance over the edge timings of the boundaries of the detected data sections and a jitter calculating section for calculating timing jitter in the data-signal-under-measurement based on the first and second pulse signals.