利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

25 条记录 (耗时 0.028 秒)

    SEMICONDUCTOR LSI AND SEMICONDUCTOR DEVICE
    1.
    发明申请
    SEMICONDUCTOR LSI AND SEMICONDUCTOR DEVICE 审中-公开
    半导体LSI和半导体器件

    公开(公告)号：US20100321060A1

    公开(公告)日：2010-12-23

    申请号：US12816684

    申请日：2010-06-16

    申请人： Yoji Nishio ,  Yutaka Uematsu ,  Hideki Oosaka ,  Akihiro Namba ,  Satoshi Nakamura

    发明人： Yoji Nishio ,  Yutaka Uematsu ,  Hideki Oosaka ,  Akihiro Namba ,  Satoshi Nakamura

    IPC分类号： H03K19/003

    CPC分类号： H03K19/003

    摘要： In a signal transmission system, performing signal transmission via signal interconnections 4-1 to 4-3 between a memory 1 and a memory controller 2 mounted on a printed circuit board 3, noise or jitter may tend to be increased in the memory 1 and in the memory controller 2 at a specified data rate due to interconnection length resonance. Registers 6-1 and 6-2 are provided to hold information on the data rate. These registers 6-1 and 6-2 are provided in the signal transmission system along with a control system that modifies the relationship between clock frequency and interconnection length. The data rate or the propagation delay time is controlled to allow for avoiding the resonance.

    摘要翻译： 在信号传输系统中，通过安装在印刷电路板3上的存储器1和存储器控制器2之间的信号互连4-1至4-3执行信号传输，在存储器1中可能倾向于增加噪声或抖动 存储器控制器2由于互连长度共振而以指定的数据速率。 提供寄存器6-1和6-2以保存关于数据速率的信息。 这些寄存器6-1和6-2与调制时钟频率和互连长度之间的关系的控制系统一起提供在信号传输系统中。 控制数据速率或传播延迟时间以避免共振。

    Light-receiving unit and measuring apparatus including the same
    4.
    发明申请
    Light-receiving unit and measuring apparatus including the same 有权
    光接收单元和包括其的测量装置

    公开(公告)号：US20060109546A1

    公开(公告)日：2006-05-25

    申请号：US11290225

    申请日：2005-11-30

    申请人： Akihiro Namba ,  Ryuji Sawada

    发明人： Akihiro Namba ,  Ryuji Sawada

    IPC分类号： G02B21/06

    CPC分类号： G01N21/76 ,  G01N21/6458 ,  G02B21/0076

    摘要： A measuring apparatus includes a confocal optical microscopy, an excitation light source unit that emits excitation light for generating fluorescence from a fluorescent material, and a light-receiving unit. The confocal optical microscope includes an excitation light input port for taking in excitation light from the excitation light source unit, and an output port for outputting fluorescence generated by the excitation light. The light-receiving unit includes an input portion for taking in signal light containing fluorescence from the confocal optical microscope. An input portion of the light-receiving unit is optically connected to the output port of the confocal optical microscope through an optical fiber.

    摘要翻译： 测量装置包括共焦光学显微镜，发射用于从荧光材料产生荧光的激发光的激发光源单元和光接收单元。 共焦光学显微镜包括用于从激发光源单元获取激发光的激发光输入端口和用于输出由激发光产生的荧光的输出端口。 光接收单元包括用于从共聚焦光学显微镜摄取含有荧光的信号光的输入部。 光接收单元的输入部分通过光纤与共焦光学显微镜的输出端口光学连接。

    Light quantity detection method and device therefor
    5.
    发明授权
    Light quantity detection method and device therefor 有权
    光量检测方法及其装置

    公开(公告)号：US08797522B2

    公开(公告)日：2014-08-05

    申请号：US13701399

    申请日：2011-07-01

    申请人： Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

    发明人： Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

    IPC分类号： G01J1/44 ,  G01J1/42

    CPC分类号： G01J1/44 ,  G01J1/10 ,  G01J1/42

    摘要： To enable measurement over a wide dynamic range from weak light quantity to strong light quantity in a light quantity detection device for detecting the light quantity, a detection signal from a photon counting light detector is A/D converted. When the A/D converted detection signal has a preset threshold value or more, the detection signal is transmitted as it is to a number-of-photons calculation circuit in a subsequent stage, and when the detection signal has the threshold value or less, threshold value processing for transmitting a preset reference value to the subsequent stage is performed. In the number-of-photons calculation circuit, the number of photons or the light quantity incident on the photon counting light detector is acquired from the dimension of an acquired detection signal waveform until the light quantity measurement ends.

    摘要翻译： 为了在用于检测光量的光量检测装置中的弱光量到强光量的宽动态范围内进行测量，来自光子计数光检测器的检测信号被A / D转换。 当A / D转换的检测信号具有预设的阈值或更大时，检测信号被原样发送到下一级中的光子数计算电路，并且当检测信号具有阈值或更小时， 执行用于将预设参考值发送到后级的阈值处理。 在光子数计算电路中，从所获取的检测信号波形的尺寸获取入射到光子计数光检测器上的光子数或光量直到光量测量结束。

    Light Quantity Detection Method and Device Therefor
    6.
    发明申请
    Light Quantity Detection Method and Device Therefor 有权
    光量检测方法及其设备

    公开(公告)号：US20130114073A1

    公开(公告)日：2013-05-09

    申请号：US13701399

    申请日：2011-07-01

    申请人： Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

    发明人： Akihiro Namba ,  Fujio Onishi ,  Yasushi Terui

    IPC分类号： G01J1/44

    CPC分类号： G01J1/44 ,  G01J1/10 ,  G01J1/42

    摘要： To enable measurement over a wide dynamic range from weak light quantity to strong light quantity in a light quantity detection device for detecting the light quantity, a detection signal from a photon counting light detector is A/D converted. When the A/D converted detection signal has a preset threshold value or more, the detection signal is transmitted as it is to a number-of-photons calculation circuit in a subsequent stage, and when the detection signal has the threshold value or less, threshold value processing for transmitting a preset reference value to the subsequent stage is performed. In the number-of-photons calculation circuit, the number of photons or the light quantity incident on the photon counting light detector is acquired from the dimension of an acquired detection signal waveform until the light quantity measurement ends.

    摘要翻译： 为了在用于检测光量的光量检测装置中的弱光量到强光量的宽动态范围内进行测量，来自光子计数光检测器的检测信号被A / D转换。 当A / D转换的检测信号具有预设的阈值或更大时，检测信号被原样发送到下一级中的光子数计算电路，并且当检测信号具有阈值或更小时， 执行用于将预设参考值发送到后级的阈值处理。 在光子数计算电路中，从所获取的检测信号波形的尺寸获取入射到光子计数光检测器上的光子数或光量直到光量测量结束。

    Method for manufacturing a thin film magnetic head
    7.
    发明授权
    Method for manufacturing a thin film magnetic head 有权
    薄膜磁头制造方法

    公开(公告)号：US07716811B2

    公开(公告)日：2010-05-18

    申请号：US11588866

    申请日：2006-10-27

    申请人： Takateru Seki ,  Akihiro Namba ,  Hideo Yamakura ,  Takahiro Noji

    发明人： Takateru Seki ,  Akihiro Namba ,  Hideo Yamakura ,  Takahiro Noji

    IPC分类号： G11B5/127 ,  H04R31/00

    CPC分类号： G11B5/3166 ,  G11B5/102 ,  G11B5/3169 ,  G11B5/3173 ,  Y10T29/49032 ,  Y10T29/49037 ,  Y10T29/49041 ,  Y10T29/49046 ,  Y10T29/49048 ,  Y10T29/49052 ,  Y10T29/49798

    摘要： Head elements are formed on a wafer to suppress deterioration in pinning strength of a pinned layer, which is caused by ESD generated during air bearing surface polishing of a thin film magnetic head. The wafer is cut into rovers in each of which are connected head elements. Rover air bearing surfaces are polished until an MR elements attain a predetermined height. A final polishing step finishes air bearing surfaces by applying an electroconductive polishing liquid to achieve a predetermined shape and surface roughness with high accuracy. A pinning defect occurrence rate is reduced by suppressing deterioration in pinning strength of a pinned layer of a read element. To achieve this, a specific resistance of the electroconductive polishing liquid is controlled to 5 GΩ·cm or less. A shallow rail and a deep rail are formed on the air bearing surfaces, and the rover is cut into thin film magnetic heads.

    摘要翻译： 头元件形成在晶片上以抑制由薄膜磁头的空气轴承表面抛光期间产生的ESD引起的被钉扎层的钉扎强度的劣化。 将晶片切割成每个都连接的头元件的流动站。 流动车空气轴承表面被抛光直到MR元件达到预定高度。 最终的抛光步骤通过施加导电研磨液来完成空气轴承表面，以高精度实现预定的形状和表面粗糙度。 通过抑制读取元件的被钉扎层的钉扎强度的劣化来降低钉扎缺陷发生率。 为了达到这个目的，将导电研磨液的电阻值控制在5G＆OHgr·cm以下。 在空气轴承表面上形成浅轨和深轨，并将流动车切成薄膜磁头。

    Characteristic evaluating system and characteristic evaluating method
    8.
    发明授权
    Characteristic evaluating system and characteristic evaluating method 有权

    公开(公告)号：US07294996B2

    公开(公告)日：2007-11-13

    申请号：US11511295

    申请日：2006-08-29

    申请人： Akihiro Namba

    发明人： Akihiro Namba

    IPC分类号： G01R31/02 ,  G01R31/28 ,  G01R31/08

    CPC分类号： G01R31/022

    摘要： The characteristic evaluating system of the present invention includes: a cable-driving transmitter transmitting a signal to one end of a cable to be measured; a load connected to the other end of the cable; a probe detecting a common mode current of the cable; a receiver receiving a signal detected by the probe; and a controller controlling the cable-driving transmitter, the load, and the receiver. The cable-driving transmitter is constructed such that a plural transmission condition is selectable when transmitting the signal. The load is constructed such that plural termination conditions corresponding to the signals transmitted to the cable is selectable. The characteristic of the cable is measured by scanning relative positions of the probe and the cable in a longitudinal direction of the cable.

    Method for manufacturing a thin film magnetic head
    9.
    发明申请
    Method for manufacturing a thin film magnetic head 有权
    薄膜磁头制造方法

    公开(公告)号：US20070119046A1

    公开(公告)日：2007-05-31

    申请号：US11588866

    申请日：2006-10-27

    申请人： Takateru Seki ,  Akihiro Namba ,  Hideo Yamakura ,  Takahiro Noji

    发明人： Takateru Seki ,  Akihiro Namba ,  Hideo Yamakura ,  Takahiro Noji

    IPC分类号： G11B5/127

    CPC分类号： G11B5/3166 ,  G11B5/102 ,  G11B5/3169 ,  G11B5/3173 ,  Y10T29/49032 ,  Y10T29/49037 ,  Y10T29/49041 ,  Y10T29/49046 ,  Y10T29/49048 ,  Y10T29/49052 ,  Y10T29/49798

    摘要： Head elements are formed on a wafer in order to suppress deterioration in pinning strength of a pinned layer, which is caused by ESD generated during a thin film magnetic head production process, particularly in an air bearing surface polishing step. The wafer is cut line by line into rovers in each of which the head elements are connected; surfaces to be used as air bearing surfaces of the rover are polished until an MR element height reaches to a predetermined value. After this air bearing surface polishing, an electroconductive polishing liquid is used in a final bearing surface polishing step of finishing the air bearing surfaces to achieve a predetermined shape with high accuracy and a predetermined value of a surface roughness. In order to suppress a pinning defect occurrence rate by suppressing deterioration in pinning strength of a pinned layer of a read element, a specific resistance of the electroconductive polishing liquid is controlled to GΩ·cm or less, preferably 1 GΩ·cm or less. After that, a shallow rail and a deep rail are formed on the air bearing surfaces, and the rover is cut to accomplish thin film magnetic heads.

    摘要翻译： 头元件形成在晶片上，以便抑制在薄膜磁头制造过程中产生的ESD引起的钉扎层的钉扎强度的劣化，特别是在空气轴承表面抛光步骤中。 每个头元件连接的晶片被逐行切割成流动站; 用作流动站的空气轴承表面的表面被抛光直到MR元件高度达到预定值。 在这种空气轴承表面抛光之后，在最终的轴承表面抛光步骤中使用导电研磨液，以完成空气轴承表面，以高精度和预定的表面粗糙度值达到预定的形状。 为了通过抑制读取元件的被钉扎层的钉扎强度的劣化来抑制钉扎缺陷发生率，导电研磨液的比电阻被控制在GOmea.cm以下，优选为1Ggga.cm以下。 之后，在空气轴承表面上形成浅轨和深轨，并且切割流动站以实现薄膜磁头。