摘要:
A method for inspecting objects such as semiconductor wafers. A staging platform and an optical platform are arranged so that the object may be staged and its surface scanned by optical equipment situated on the optical platform. During the scanning process, the surface is illuminated with light of a plurality of wavelengths, each strobed at a predetermined rate so that multiple images may be collected using time and frequency multiplexing. The multiple images are stored in a database for analysis, which includes processing selected ones of the multiple images according to one or more algorithms. The defect-detection algorithms used for each object are determined by referenced to a predetermined or calculated defect detection protocol, then a defect mask is created for each pixel in the images that is suspected to be defective. The defect mask is then compared to threshold parameters to determine which if any of the suspected defects should be reported.
摘要:
A method of collating and using captured semiconductor-wafer image data in an automated defect analysis. The method includes the steps of receiving image data and, if necessary, converting it to a digital format. Once the data is in pixel-by-pixel form, each pixel is assigned a slope value derived from the direction of the structure edge, if any, on which it lies. The pixel-slope data is then evaluated to determine whether a photo-resist anomaly is present. The method may also include evaluated an average pixel slope value for each inspected wafer. Dependant claims further define the invention to claim an inspection system for employing the method.
摘要:
A system and method for performing optical inspection of structures on the surface of a semiconductor wafer. The wafer surface is illuminated with a polychromatic light source. A multiple-charged couple-device (CCD) camera is positioned to capture light diffracted by the structures on the wafer surface at the first order of diffraction. The captured light is then separated into a plurality of component wavelengths which are directed onto the CCDs. A digital filter creates a plurality of digitized diffractive images of the wafer surface at different component wavelengths. The diffractive images may be integrated and analyzed to detect defects in the structures, or may be, analyzed individually. An image at a particular wavelength may be selected and analyzed by using the known grating pitch of the structures to calculate the wavelength.
摘要:
A method for inspecting objects such as semiconductor wafers. A staging platform and an optical platform are arranged so that the object may be staged and its surface scanned by optical equipment situated on the optical platform. During the scanning process, the surface is illuminated with light of a plurality of wavelengths, each strobed at a predetermined rate so that multiple images may be collected using time and frequency multiplexing. The multiple images are stored in a database for analysis, which includes processing selected ones of the multiple images according to one or more algorithms. The defect-detection algorithms used for each object are determined by referenced to a predetermined or calculated defect detection protocol, then a defect mask is created for each pixel in the images that is suspected to be defective. The defect mask is then compared to threshold parameters to determine which if any of the suspected defects should be reported.
摘要:
The present disclosure provides an addressing method, an addressing apparatus, a fabric manager, a switch, and a data routing method for data center networks. The addressing apparatus includes a tree creating unit for, sequentially with each of switches as a root, creating a tree containing all hosts by means of network topology discovery function, to obtain a plurality of trees; a tree selecting unit for selecting a tree having a minimum height among the created plurality of trees; and an address assigning unit for assigning addresses to each of switches and each of hosts in a network with respect to each selected tree having a minimum height. The present disclosure is adaptable to various topologies employed by the data center. The present disclosure can achieve aggregation of locator addresses so that a forwarding table can be shortened, and can achieve load balance of the network.
摘要:
A lead frame sheet made of an electrically conductive material has lead frames integrally formed on it. Spacing members also are formed from the sheet. A first one of the spacing members is proximal to a first longitudinal edge of the sheet and a second one of the spacing members is proximal to a second longitudinal edge of the sheet. The spacing members extend from an underside surface of the sheet and, in use, space the underside surface from a planar support such as a surface of a heating block.
摘要:
A first request is sent from a station to an access point. The station receives a first response from the access point that includes a first sequence number, and stores the first sequence number. The station sends a second request to the access point and sets a waiting period for receiving a response from the access point. The station receives a second response from the access point and a third response from a second access point during the waiting period. The second response includes a second sequence number and the third response includes a third sequence number. The station determines that the second response is a legitimate response by comparing the second and third sequence numbers to the first sequence number.
摘要:
There are disclosed a network interference evaluating method, a dynamic channel assignment method and apparatus used in wireless networks. The dynamic channel assignment method used in a wireless network, comprising steps of: calculating each pair of visual delayed time for each pair of basic service sets based on received signal strength indicators, traffic information and rate information, and evaluating an overall network interference under a current channel allocation based on the calculated visual delayed time; constructing an undirected graph so that each basic service set is located at a vertex, and each connection line between each pair of basic service sets has a weight obtained from the pair of visual delayed time for this pair of basic service sets; coloring the undirected graph to get a new channel allocation approach and an optimized minimal overall network interference under this new channel allocation approach; comparing a difference between the evaluated overall network interference under the current channel allocation and the optimized minimal overall network interference with a predetermined threshold; and changing channel allocation for the basic service sets according to the new channel allocation approach if the difference is larger than the predetermined threshold.
摘要:
The invention provides a server, a method and a system for providing node information for P2P network. A server in a peer-to-peer (P2P) network comprises: a location information storage unit which stores coordinate information indicating a coordinate of each data node in the P2P network in a coordinate system that is created based on communication delays among data nodes in the P2P network; and a node information providing unit which, upon receipt of a request for information on data nodes having a first data item, selects one or more data nodes from data nodes having the first data item based on the coordinate information, and provides information indicating the selected one or more data nodes.