Soil microorganism-housing biosensors and their uses
    1.
    发明申请
    Soil microorganism-housing biosensors and their uses 审中-公开
    土壤微生物生物传感器及其用途

    公开(公告)号:US20070148725A1

    公开(公告)日:2007-06-28

    申请号:US10579670

    申请日:2004-11-05

    IPC分类号: C12Q1/04

    CPC分类号: C12Q1/02

    摘要: Microorganism sensors used in environment assessment technologies and the like, instead of being used to detect environmental components and determine their concentrations, were used as tools to evaluate the ability of target soil microorganisms to adapt to various field soil environments, and comparative studies were performed. As a result, the present inventors found that by using the microorganism sensors to examine the growth potential of general soil microorganisms and pathogenic microorganisms in ecosystems, the balance in the soil ecosystems could be monitored, and further, the risk of disease occurrence and the bio-controlling effect of general soil microorganisms could also be determined.

    摘要翻译: 用于环境评估技术等的微生物传感器,而不是用于检测环境成分并确定其浓度,被用作评估目标土壤微生物适应各种田间土壤环境的能力的工具,并进行了比较研究。 结果发现,通过使用微生物传感器检测生态系统中一般土壤微生物和致病微生物的生长潜力,可以监测土壤生态系统的平衡,进一步监测疾病发生的风险和生物 也可以确定一般土壤微生物的控制效应。

    Test apparatus, additional circuit and test board for judgment based on peak current
    2.
    发明授权
    Test apparatus, additional circuit and test board for judgment based on peak current 失效
    测试装置,附加电路和测试板,用于根据峰值电流进行判断

    公开(公告)号:US08558560B2

    公开(公告)日:2013-10-15

    申请号:US12876057

    申请日:2010-09-03

    IPC分类号: G01R27/26

    摘要: Provided is a test apparatus that measures a peak in a current supplied to a device under test via a transmission path which transmits power from a power supply to a device under test, the peak including a frequency component higher than a frequency corresponding to a product of an inductance component from the power supply to the device under test and a capacitance component between the transmission path and a ground potential, and judges acceptability of the device under test based on the peak measured by the current measuring section.

    摘要翻译: 提供了一种测试装置,其通过从电源向被测设备发送电力的传输路径来测量提供给被测设备的电流中的峰值,所述峰值包括高于对应于被测设备的频率的频率的频率分量 从电源到被测器件的电感分量以及传输路径和接地电位之间的电容分量,并根据由电流测量部分测得的峰值来判断被测器件的可接受性。

    MANAGEMENT SYSTEM AND COMPUTER SYSTEM MANAGEMENT METHOD
    4.
    发明申请
    MANAGEMENT SYSTEM AND COMPUTER SYSTEM MANAGEMENT METHOD 有权
    管理系统与计算机系统管理方法

    公开(公告)号:US20110307591A1

    公开(公告)日:2011-12-15

    申请号:US12866880

    申请日:2010-06-14

    IPC分类号: G06F15/173

    摘要: A system management apparatus for managing a computer system receives plug-in distribution data from a plug-in distribution apparatus. The plug-in distribution data comprises plug-in definition information and template definition information. The system management apparatus uses the plug-in definition information to acquire information from the management target apparatus, and determines whether or not to issue an alert based on the template definition information. The distribution of the plug-in and the template at the same time means that the user can avoid confusion regarding the threshold setting.

    摘要翻译: 用于管理计算机系统的系统管理装置从插件分配装置接收插件分发数据。 插件分发数据包括插件定义信息和模板定义信息。 系统管理装置使用插件定义信息从管理目标装置获取信息,并且基于模板定义信息来确定是否发出警报。 同时插件和模板的分发意味着用户可以避免与阈值设置有关的混淆。

    PLANAR LIGHT SOURCE DEVICE
    6.
    发明申请
    PLANAR LIGHT SOURCE DEVICE 审中-公开
    平面光源设备

    公开(公告)号:US20110228558A1

    公开(公告)日:2011-09-22

    申请号:US13130758

    申请日:2009-10-13

    IPC分类号: F21V7/22

    摘要: Conventional planar light source devices have a problem that increasing a utilization ratio of light results in a very narrow angle distribution of light. A planar light source device of the present invention has a light source (1), a light guide plate (2) for introducing light coming from the light source via a light-incident plane of the light guide plate and emits the light from almost all area of a light emission plane, and a light source side reflector (3) for reflecting the light coming from the light source and light which comes from the light source and is reflected by the light-incident plane of the light guide plate so that the reflected light is emitted to the light-incident plane of the light guide plate. The planar light source device further includes a lower side reflector (5) for introducing light emitted from the lower plane of the light guide plate into the light guide plate again, and an optical member (4) for changing a traveling direction of first light (10) which is introduced via the light-incident plane to pass through the light guide plate and is emitted from an upper plane of the light guide plate to a vertical upper direction. The lower side reflector is inclined by an angle of 5°-60° with respect to the lower plane of the light guide plate, and θ2=90°−θ1±10° is met where θ1 (°) represents a maximum angle between the upper plane and a direction in which the first light is emitted from the upper plane and θ2 (°) represents an apex angle of the optical member.

    摘要翻译: 传统的平面光源装置具有提高光的利用率导致光的非常窄的角度分布的问题。 本发明的平面光源装置具有:光源(1),导光板(2),用于经由导光板的入射面导入来自光源的光,并从几乎全部发射光 光源侧反射器(3),用于反射来自光源的光和来自光源的光,并被导光板的光入射面反射,使得 反射光被发射到导光板的光入射面。 平面光源装置还包括用于将从导光板的下平面发射的光再次引入导光板的下侧反射器(5),以及用于改变第一光的行进方向的光学部件(4) 10),其经由光入射面引入以穿过导光板,并且从导光板的上平面发射到垂直上方。 下侧反射器相对于导光板的下平面倾斜5°-60°,和2θ= 90° - 角度; 1±10°,其中&1;(°) 表示上平面与第一光从上平面发射的方向和角度之间的最大角度; 2(°)表示光学构件的顶角。

    Method, computer, and recording medium storing a program for computing an optimal solution to engine design variables
    7.
    发明授权
    Method, computer, and recording medium storing a program for computing an optimal solution to engine design variables 有权
    存储用于计算发动机设计变量的最优解的程序的方法,计算机和记录介质

    公开(公告)号:US07860584B2

    公开(公告)日:2010-12-28

    申请号:US12214113

    申请日:2008-06-17

    摘要: A method, computer, and recording medium storing a program are provided which, based on local optimal solutions, more efficiently calculate an optimal global optimal solution in a global operating area. System calculates the global optimal solution by solving, using a genetic algorithm based on the local optimal solutions and the initial values, an equation, which should be satisfied by the plurality of design variables, by obtaining the plurality of combinations of design variables composing local optimal solutions for each design variable respectively calculated for each of a plurality of combinations of a plurality of operating states, and by obtaining initial values for the plurality of combinations of design variables used for calculating the global optimal solution.

    摘要翻译: 提供一种存储程序的方法,计算机和记录介质,其基于局部最优解,更有效地计算全局操作区域中的最佳全局最优解。 系统通过使用基于局部最优解的遗传算法和初始值来求解全局最优解,通过获得构成局部最优的设计变量的多个组合,由多个设计变量满足的方程 分别针对多个操作状态的多个组合中的每一个计算出的每个设计变量的解,以及通过获得用于计算全局最优解的设计变量的多个组合的初始值。

    Optical component using optical transmission element joining metal holder
    8.
    发明授权
    Optical component using optical transmission element joining metal holder 有权
    使用光传输元件接合金属支架的光学部件

    公开(公告)号:US07313292B2

    公开(公告)日:2007-12-25

    申请号:US10941940

    申请日:2004-09-16

    IPC分类号: G02B6/12 G02B6/32 G02B6/02

    CPC分类号: G02B7/025 G02B7/008 G02B7/028

    摘要: An optical component comprises an optical transmission element (e.g., an optical lens) whose circumferential wall partially joins a metal holder via a joining material (e.g., a low melting point glass), wherein stress is normally applied to the optical transmission element in a compression direction when joining the metal holder. The optical transmission element is inserted into a through hole of the metal holder, and the joining material is kept in a bank actualized by a tapered portion formed in proximity to one end of the through hole of the metal holder. This prevents tensile stress from being applied to the optical transmission element; thus, it is possible to avoid the occurrence of cracks and separations in the optical transmission element; and it is possible to avoid the occurrence of errors in optical characteristics, regardless of variations of the environmental temperature, so that, the optical component is improved in reliability.

    摘要翻译: 光学部件包括光学传输元件(例如,光学透镜),其周壁通过接合材料(例如,低熔点玻璃)部分地连接金属保持器,其中应力通常以压缩方式施加到光传输元件 连接金属支架时的方向。 光传输元件插入到金属保持器的通孔中,并且接合材料保持在由金属保持器的通孔的一端附近形成的锥形部分实现的堤岸中。 这防止了拉伸应力施加到光传输元件上; 因此,可以避免在光传输元件中发生裂纹和分离; 并且不管环境温度的变化如何,可以避免出现光学特性的误差,从而提高了光学部件的可靠性。

    Optical waveguide element
    9.
    发明申请
    Optical waveguide element 失效
    光波导元件

    公开(公告)号:US20050157970A1

    公开(公告)日:2005-07-21

    申请号:US11066446

    申请日:2005-02-28

    摘要: A first branched optical waveguide and a second branched optical waveguide, to constitute a Mach-Zehnder type optical waveguide, are formed at the surface of a substrate. A first ground electrode, a signal electrode and a second ground electrode are provided on a buffer layer formed on the substrate. The second ground electrode is partially cut away and divided, to form a ditch therein, so that the modulating electrode composed of the signal electrode, the first and the second ground electrodes are substantially symmetrized on the center line between the first and the second optical waveguides. Then, the ratio (d2/d1) of the distance d2 between the signal electrode and the second branched optical waveguide to the distance d1 between the signal electrode and the first electrode is set within 3.5-7.5.

    摘要翻译: 在基板的表面形成有构成马赫 - 曾德尔型光波导的第一分支光波导和第二分支光波导。 第一接地电极,信号电极和第二接地电极设置在形成在基板上的缓冲层上。 第二接地电极被部分地切除并分开,以在其中形成沟槽,使得由信号电极,第一和第二接地电极构成的调制电极在第一和第二光波导之间的中心线上基本对称 。 然后,将信号电极和第二分支光波导之间的距离d2与信号电极和第一电极之间的距离d1的比率(d2 / d1)设定为3.5〜7.5。

    Method and apparatus for defect analysis of semiconductor integrated circuit

    公开(公告)号:US06801049B2

    公开(公告)日:2004-10-05

    申请号:US09980891

    申请日:2001-12-03

    IPC分类号: G01R3126

    CPC分类号: G01R31/3004 G01R31/3181

    摘要: A fault analysis method and apparatus which is able to improve the reliability of fault analysis of semiconductor integrated circuit. In case of supplying a test pattern sequence having a plurality of test patterns to the semiconductor IC, an analysis point whose electric potential changes according to the change of supplied test pattern is placed corresponding to the test pattern sequence. Then, a transient power supply current generated on the semiconductor IC according to the change of the test pattern is measured and determined whether the measured transient power supply current is abnormal or not. A defection point is presumed based on the test pattern sequence where the transient power supply current is abnormal, and the analysis point placed corresponding to the test pattern sequence.