公开(公告)号：US4874939A

公开(公告)日：1989-10-17

申请号：US101170

申请日：1987-09-25

申请人： Yoshiro Nishimoto ,  Yasuji Yoneda ,  Shinichi Imaoka ,  Yasuhide Nakai ,  Akimitsu Nakaue ,  Yoshihiko Onishi ,  Hiroyuki Tachibana ,  Takayoshi Inoue ,  Takuya Kusaka ,  Hiroyuki Takamatsu ,  Shigeki Tojyo ,  Hiroshi Kajikawa ,  Kozo Nishimura

发明人： Yoshiro Nishimoto ,  Yasuji Yoneda ,  Shinichi Imaoka ,  Yasuhide Nakai ,  Akimitsu Nakaue ,  Yoshihiko Onishi ,  Hiroyuki Tachibana ,  Takayoshi Inoue ,  Takuya Kusaka ,  Hiroyuki Takamatsu ,  Shigeki Tojyo ,  Hiroshi Kajikawa ,  Kozo Nishimura

IPC分类号： G01B11/00 ,  G01J1/02 ,  G01M11/00 ,  G01N21/88 ,  H01L27/14 ,  H01L31/02 ,  H01L31/0216 ,  H01L31/16

CPC分类号： H01L31/02164 ,  H01L31/02024

摘要： An apparatus for detecting position/variance of input light is disclosed which includes a photoelectric conversion device receiving input light constituted of a first resistive layer formed of a first photoelectric conversion material and a second resistive layer formed of a second photoelectric conversion material connected with the first resistive layer through a depletion layer or directly, wherein the first resistive layer is provided with uniform resistivity throughout its surface so that a linear output proportional to the average of the distances between one end of the photoelectric conversion device and positions of the input light is detected and the second resistive layer is provided with resistivity dependent upon the distance from its one end so that a quandratic ouput proportional to the average of the squares of the distances between one end of the photoelectric conversion device and positions of the input light is detected.

摘要翻译： 公开了一种用于检测输入光的位置/方差的装置，其包括：光电转换装置，其接收由第一光电转换材料形成的第一电阻层和由与第一光电转换材料连接的第二光电转换材料形成的第二电阻层构成的输入光; 电阻层通过耗尽层或直接地，其中第一电阻层在整个表面上具有均匀的电阻率，使得与光电转换装置的一端之间的距离的平均值与输入光的位置的平均值成比例的线性输出被检测到 并且第二电阻层具有取决于其一端的距离的电阻率，使得与光电转换装置的一端之间的距离的平方的平均值和输入光的位置的平均值成正比的quandratic输出。

公开(公告)号：US06815962B2

公开(公告)日：2004-11-09

申请号：US10216836

申请日：2002-08-13

申请人： Takayuki Hirano ,  Yasuji Yoneda ,  Hiroshi Gotoh ,  Eiji Iwamura ,  Susumu Takeuchi

发明人： Takayuki Hirano ,  Yasuji Yoneda ,  Hiroshi Gotoh ,  Eiji Iwamura ,  Susumu Takeuchi

IPC分类号： G01R3104

CPC分类号： G01R1/07307

摘要： There is provided an electric connection-inspection device which does not impair a freedom of selection of using materials from a viewpoint of restriction in terms of product's function with the aptitude of electric features of electric resistance and physical properties of internal stress, and restriction in terms of manufacture as to the appropriation or not of employment of a plating method, and which has a fine construction provided with the excellent durability that an electrode element is hard to adhere and coagulate. An electric connection-inspection device for coming into electrically contact with an object to be inspected to input and output a signal, comprising a plurality of contact terminals, a coating of a second layer having the Young's modulus higher than that of a wiring base-material layer and whose specific resistance is not more than 1×10−4 &OHgr;cm being formed on the surface of the wiring base-material layer positioned at the extreme end of the contact terminal, and a coating of a third layer having a low coagulating property being formed on the surface of the second layer.