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公开(公告)号：US12000694B2
公开(公告)日：2024-06-04
申请号：US17201912
申请日：2021-03-15
IPC分类号： G01B21/20
CPC分类号： G01B21/20
摘要： A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.
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2.发明公开公开(公告)号：US20240176313A1
公开(公告)日：2024-05-30
申请号：US18435977
申请日：2024-02-07
发明人： Jonas Frank
CPC分类号： G05B13/041 , G01B5/012 , G01B11/005 , G06F17/18 , G06F30/20
摘要： A method for selecting a measurement sequence for a coordinate measuring machine includes obtaining multiple surface regions of an object to be measured by at least one measurement sensor in respect of at least one predetermined property. The measurement sensor is arranged by the coordinate measuring machine at at least one specific position and/or with at least one specific orientation for the purposes of measuring a respective surface region. The method includes changing a measurement sequence, in which the surface regions should be measured, multiple times using at least one algorithm. The algorithm respectively ascertains a changed measurement sequence and an assessment variable for the changed measurement sequence within the scope of each change. The method includes selecting one of the measurement sequences based on the ascertained assessment variables. A relative relationship of at least two surface regions is specified as a condition to be observed by each measurement sequence
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公开(公告)号：US20240142213A1
公开(公告)日：2024-05-02
申请号：US18496904
申请日：2023-10-29
发明人： Johannes Geiger , Tobias Perkhuhn , Alwine Schroll , Matthias Wahl , Sabrina Rau , Malte Langmack
CPC分类号： G01B5/012 , G01K1/026 , G01K15/007 , H05B3/0033
摘要： A measurement device includes a measurement head configured to capture dimensional measurement data of a measurement object. A guide structure is configured to move and guide at least one of the measurement head and the measurement object in a measurement volume of the measurement device. A measurement unit is configured to capture positional data of the guide structure based on which a pose of the measurement head can be calculated. Multiple temperature sensor units are configured to capture temperature data about the measurement volume. Each temperature sensor unit includes a carrier element, a temperature sensor connected to the carrier element, and a heating element connected to the carrier element. A control system is configured to process the dimensional measurement data and the positional data and, based on the temperature data, correct at least one of the dimensional measurement data and the positional data.
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公开(公告)号：US20240003674A1
公开(公告)日：2024-01-04
申请号：US18216552
申请日：2023-06-29
发明人： Aksel Göhnermeier
CPC分类号： G01B11/005 , G02B26/0833 , G02B13/22 , H04N23/56 , H04N23/12
摘要： A photogrammetric camera for the two-dimensional measurement of objects has a lens, an image sensor and a pupil filter configured as a micromirror, each of which is transferable into a first and second tilted position. An illumination system produces light. A micromirror in the first tilt position reflects light produced by the illumination system such that the light cannot reach the object while light reflected at the object is guided to the image sensor. Conversely, a micromirror in the second tilt position reflects light such that the light can reach the object while light reflected at the object is supplied to the image sensor. To implement a recording of an image with coaxial dark or coaxial reflected light illumination, the micromirror device is controlled such that the light produced by the illumination system is incident on the surface at different angles within an angular range of at least arcsin(NA).
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公开(公告)号：US11774228B2
公开(公告)日：2023-10-03
申请号：US17119854
申请日：2020-12-11
发明人： Günter Haas , Florian Dotschkal , Tobias Schramm
CPC分类号： G01B5/016 , G01B11/005
摘要： A method is described for measuring workpieces, each having structural features that form test features for measurement. The method determines an unstable one and a stable one of the test features, based on expected violation or satisfaction, respectively, of a statistical control rule. The method measures workpieces such that the unstable test feature is measured more frequently than the stable test feature. The method ascertains whether the unstable test feature remains unstable and whether the stable test feature remains stable. The method measures additional workpieces if the unstable test feature remained unstable and the stable test feature remaining stable. The determining is repeated if the unstable test feature is no longer unstable, the stable test feature is no longer stable, or any other measurement feature changes, such as if a new batch of workpieces is to be measured, environmental conditions change, or measurement has proceeded longer than a predefined threshold.
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6.发明授权公开(公告)号：US11713965B2
公开(公告)日：2023-08-01
申请号：US16870971
申请日：2020-05-10
发明人： Heinrich Mueller , Konrad Werner
摘要： An apparatus, a method, and a computer program for determining a chamfer property of a workpiece chamfer are provided. The method includes generating measurement points along at least a first measuring path, the first measuring path running over a first chamfer edge, determining at least one unadapted compensating element for the measurement points of the first measuring path, and determining a spatial position of the first chamfer edge depending on a deviation between the measurement points of the first measuring path and the at least one unadapted compensating element.
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公开(公告)号：US11675080B2
公开(公告)日：2023-06-13
申请号：US16249881
申请日：2019-01-16
IPC分类号： G01S17/42 , G01S7/481 , G01S17/875 , G01S7/48 , G01S17/66
CPC分类号： G01S17/42 , G01S7/4804 , G01S7/4818 , G01S17/875 , G01S17/66
摘要： An apparatus for determining at least one spatial position and orientation of at least one object with at least three retroreflectors is provided. The apparatus has at least one LIDAR unit with at least three measurement channels. The LIDAR unit has at least one illumination device, which is configured to produce at least one frequency modulated input light beam. The LIDAR unit has at least one first beam splitter, wherein the first beam splitter is configured to divide the input light beam among the measurement channels in parallel and/or in sequence. The measurement channels are each configured to produce at least one measurement signal. The LIDAR unit is configured to produce at least one LIDAR signal for the measurement signals. The apparatus has at least one evaluation unit, which is configured to determine the spatial position and orientation of the object from the LIDAR signal.
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公开(公告)号：US20230166457A1
公开(公告)日：2023-06-01
申请号：US18162456
申请日：2023-01-31
IPC分类号： B29C64/393 , B29C64/245 , B33Y50/02 , B33Y10/00 , B33Y30/00
CPC分类号： B29C64/393 , B29C64/245 , B33Y50/02 , B33Y10/00 , B33Y30/00
摘要： A method for additively manufacturing a workpiece having lateral workpiece dimensions includes obtaining a first data set defining the workpiece in layers arranged on top of the other. The method includes providing a manufacturing platform having lateral platform dimensions that are greater than the lateral workpiece dimensions. The method includes providing a structuring tool movable relative to the manufacturing platform. The method includes selecting an individual manufacturing region on the manufacturing platform. The method includes obtaining a second data set that represents individual layer deformations that are dependent on the selected manufacturing region. The method includes producing a defined material layer of the workpiece in the manufacturing region by controlling the structuring tool using the first and second data sets. The method includes repeating the producing in order to produce further defined material layers one on top of the other using the first data set and the second data set.
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公开(公告)号：US11662194B2
公开(公告)日：2023-05-30
申请号：US17236801
申请日：2021-04-21
摘要： A method for determining measurement points of an adapted measurement path for measuring a measurement object includes determining measurement points of an ideal measurement path. The method includes determining target measurement points of at least one guide path, which differs from the ideal measurement path. The method includes capturing actual measurement points along the at least one guide path using a coordinate measuring device. The method includes determining deviations between the target measurement points and the actual measurement points of the at least one guide path. The method includes determining the measurement points of the adapted measurement path by changing the measurement points of the ideal measurement path based on the deviations.
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公开(公告)号：US11659269B2
公开(公告)日：2023-05-23
申请号：US17192556
申请日：2021-03-04
发明人： Stephan Rieger , Lionel Martz , Tobias Feldengut , Erich Michler , Kilian Neumaier , Markus Ritter
CPC分类号： H04N5/23216 , G01B11/005 , H04N5/23299
摘要： An optical measuring device includes at least one optical sensor configured for optical capture of at least one measurement object at multiple image recording positions. The optical measuring device includes at least one display device configured to display, for multiple predetermined and/or determinable image recording positions, in each case a schematic representation of an image to be recorded at the respective image recording position. The optical measuring device includes at least one data processing unit and at least one interface. The interface is configured to provide at least one item of manipulation information to the data processing unit. The data processing unit is configured to, based on the manipulation information, adapt at least one of the image recording position and an image recording parameter of at least one of the images to be recorded.
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