公开(公告)号：US20240192145A1

公开(公告)日：2024-06-13

申请号：US18078392

申请日：2022-12-09

Applicant: Ford Global Technologies, LLC

Inventor： Walter LaPlante ,  Harry Kekedjian ,  Chetan Patel ,  Jyothi Gainadi ,  Kevin Bartholomew ,  Jim Birley ,  Scott Matthew King

IPC: G01N21/95 ,  G01N21/88

CPC classification number: G01N21/9515 ,  G01N21/8851 ,  G01N2021/888 ,  G01N2021/8887

Abstract: A system includes a station information system, a portable vision system, and a quality monitoring system. The station information system includes a station computing device configured to provide a notification related to a manufacturing operation performed on a component. The portable vision system includes a quality check module configured to include a station task module configured to execute a quality check task based on an image. The quality monitoring system includes a quality monitoring computing device configured to request the portable vision system to execute the quality check task based on a trigger message from the station information system and to provide a task data message related to the quality check task executed by the portable vision system to the station information system. The station computing device is configured to provide the notification based on the task data message from quality monitoring system via the user interface device.

公开(公告)号：US11959862B2

公开(公告)日：2024-04-16

申请号：US17324377

申请日：2021-05-19

Applicant: FUJIFILM Corporation

Inventor： Shuhei Horita ,  Masafumi Tomono

IPC: G01N21/88

CPC classification number: G01N21/8851 ,  G01N21/8803 ,  G01N2021/8864 ,  G01N2021/888 ,  G01N2021/8887

Abstract: Provided are a damage figure creation supporting apparatus, a damage figure creation supporting method, a damage figure creation supporting program, and a damage figure creation supporting system that enable efficient creation of a damage figure using marking colors. The damage figure creation supporting method includes a step of acquiring an image obtained by photographing a surface of a structure in color, a step of analyzing the acquired image and detecting markings applied to damaged portions on the surface of the structure for respective colors, and a step of creating a damage figure, based on detection results of the markings for the respective colors. The damage figure is configured as a diagram of tracing the markings and has a layered structure with layers each corresponding to a color.

公开(公告)号：US20240068952A1

公开(公告)日：2024-02-29

申请号：US17823806

申请日：2022-08-31

Applicant: Micron Technology, Inc.

Inventor： Theodore G. DOROS

IPC: G01N21/88 ,  G06T7/00

CPC classification number: G01N21/8851 ,  G06T7/0004 ,  G01N2021/8864 ,  G01N2021/888

Abstract: In some implementations, a test device may initiate a set of measurements by a set of sensors of the test device and of a device under test (DUT), wherein the DUT is a memory device. The test device may obtain the set of measurements of the DUT from the set of sensors based on initiating the set of measurements. The test device may analyze the set of measurements of the DUT, using a first model, to identify one or more defects present with the DUT. The test device may determine, using a second model, that the one or more defects present with the DUT satisfy a failure threshold. The test device may provide, based on the failure threshold being satisfied for the DUT, an output indicating that the failure threshold is satisfied for the DUT.

公开(公告)号：US11828711B2

公开(公告)日：2023-11-28

申请号：US17497211

申请日：2021-10-08

Applicant: VIRTEK VISION INTERNATIONAL, INC.

Inventor： Kurt D. Rueb ,  Jeff Erbrecht ,  Beth McAndless ,  Vincent Tran

IPC: G01N21/88

CPC classification number: G01N21/8806 ,  G01N2021/888 ,  G01N2021/8861

Abstract: A method of identifying an item on a surface of a workpiece is disclosed. An optical device identifies an item on the surface of a workpiece. An item identification system includes a light projector and a photogrammetry system. One of the light projector and the photogrammetry system generates a three-dimensional coordinate system within the work cell. One of the light projector and the photogrammetry system identifies a location of the surface of the workpiece within the three-dimensional coordinates system. The controller calculates geometric location of the item on the surface of the work piece in the three-dimensional coordinate system as identified by the optical device. The controller signals the light projector to project a beam of light onto the surface of the workpiece identifying a disposition of the item disposed upon the surface of the workpiece.

公开(公告)号：US20170328846A1

公开(公告)日：2017-11-16

申请号：US15531066

申请日：2014-12-08

Applicant: Hitachi High-Technologies Corporation

Inventor： Hisashi HATANO ,  Koichi NAGOYA ,  Mamoru KOBAYASHI

IPC: G01N23/225 ,  G01N21/47 ,  G01N21/95 ,  G01N21/956 ,  G01N21/84

CPC classification number: G01N23/2251 ,  G01N21/47 ,  G01N21/9501 ,  G01N21/95607 ,  G01N2021/845 ,  G01N2021/8854 ,  G01N2021/8858 ,  G01N2021/8861 ,  G01N2021/8864 ,  G01N2021/888 ,  G01N2223/302 ,  G01N2223/6116 ,  G01N2223/643 ,  G01N2223/6466 ,  H01J37/24 ,  H01J37/28

Abstract: A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

公开(公告)号：US20150369749A1

公开(公告)日：2015-12-24

申请号：US14309713

申请日：2014-06-19

Applicant: The Boeing Company

Inventor： Morteza Safai ,  Ronald G. Turner

IPC: G01N21/88 ,  G01N21/21

CPC classification number: G01N21/8851 ,  G01N21/21 ,  G01N21/8422 ,  G01N21/8806 ,  G01N21/894 ,  G01N2021/845 ,  G01N2021/8848 ,  G01N2021/8861 ,  G01N2021/888

Abstract: A system and method is disclosed for detecting defects in the surface of a workpiece such as a fiberglass or composite part. A light source is positioned to direct light at the workpiece at an oblique angle with respect to the surface of the workpiece. At least one camera is positioned to detect light reflected from the workpiece and to generate a light signal corresponding to the reflected light. A polarizing lens is positioned between each of the at least one cameras and the workpiece. A processor is coupled to each of the at least one cameras to receive the corresponding light signals. The processor is programmed to process the light signals to detect any defects in the surface of the workpiece based on relative magnitudes of the received light signal. A video display and a printer are preferably coupled to the processor to show any detected defects.

Abstract translation: 公开了用于检测诸如玻璃纤维或复合部件的工件的表面中的缺陷的系统和方法。 光源被定位成相对于工件的表面以倾斜的角度引导工件的光。 定位至少一个照相机以检测从工件反射的光并产生对应于反射光的光信号。 偏振透镜位于至少一个照相机和工件的每一个之间。 处理器耦合到所述至少一个照相机中的每一个以接收相应的光信号。 处理器被编程为基于接收的光信号的相对大小来处理光信号以检测工件表面中的任何缺陷。 视频显示器和打印机优选地耦合到处理器以显示任何检测到的缺陷。

公开(公告)号：US08964174B2

公开(公告)日：2015-02-24

申请号：US13533015

申请日：2012-06-26

Applicant: Jose David Cano Cediel ,  Georgina Galera Cordoba

Inventor： Jose David Cano Cediel ,  Georgina Galera Cordoba

IPC: G01N21/00 ,  G01N21/89 ,  G01N21/88

CPC classification number: G01N21/8914 ,  G01N21/8851 ,  G01N2021/888

Abstract: A defect recognition procedure in prepreg materials (1) draws a first transversal cross line (4b) at the beginning boundary (3b) of a defective area (2) in a prepreg material (1). A second transversal cross line (4e) at the end boundary (3e) of a defective area (2) is drawn as well. The cross lines (4b, 4e) form an angle (α) with respect to the prepreg material (1) motion direction (5).Each transversal cross line (4b, 4e) delimiting the beginning and the end of a defective area (2) has identification codes (Bi, Ei).

Abstract translation: 预浸料材料（1）中的缺陷识别程序在预浸料材料（1）中的缺陷区域（2）的起始边界（3b）处绘制第一横向交叉线（4b）。 还描绘了在缺陷区域（2）的端部边界（3e）处的第二横向交叉线（4e）。 交叉线（4b，4e）相对于预浸料材料（1）的运动方向（5）形成角度（α）。 限定缺陷区域（2）的开始和结束的每个横向交叉线（4b，4e）具有识别码（Bi，Ei）。

公开(公告)号：US20130169956A1

公开(公告)日：2013-07-04

申请号：US13533015

申请日：2012-06-26

Applicant: Jose David CANO CEDIEL ,  Georgina Galera Cordoba

Inventor： Jose David CANO CEDIEL ,  Georgina Galera Cordoba

IPC: G01N21/89

CPC classification number: G01N21/8914 ,  G01N21/8851 ,  G01N2021/888

Abstract: A defect recognition procedure in prepreg materials (1) draws a first transversal cross line (4b) at the beginning boundary (3b) of a defective area (2) in a prepreg material (1). A second transversal cross line (4e) at the end boundary (3e) of a defective area (2) is drawn as well. The cross lines (4b, 4e) form an angle (α) with respect to the prepreg material (1) motion direction (5).Each transversal cross line (4b, 4e) delimiting the beginning and the end of a defective area (2) has identification codes (Bi, Ei).

Abstract translation: 预浸料材料（1）中的缺陷识别程序在预浸料材料（1）中的缺陷区域（2）的起始边界（3b）处绘制第一横向交叉线（4b）。 还描绘了在缺陷区域（2）的端部边界（3e）处的第二横向交叉线（4e）。 交叉线（4b，4e）相对于预浸料材料（1）的运动方向（5）形成角度（α）。 限定缺陷区域（2）的开始和结束的每个横向交叉线（4b，4e）具有识别码（Bi，Ei）。

公开(公告)号：US20030155280A1

公开(公告)日：2003-08-21

申请号：US10258444

申请日：2003-02-06

Inventor： Wataru Karasawa

IPC: B07C005/00 ,  B07C009/00

CPC classification number: H01L22/20 ,  G01N21/9501 ,  G01N2021/888 ,  H01L22/12

Abstract: A device inspection apparatus inspects a plurality of semiconductor devices on an individual device basis. An inspection target sorting part (8) omits an execution of an inspection to be applied to the semiconductor devices according to information which specifies a defective device that has been determined to be defective in a manufacturing process that has been applied to the device.

Abstract translation: 装置检查装置在各个装置的基础上检查多个半导体装置。 检查目标分类部件（8）根据指定在已经被应用于该设备的制造过程中被确定为有缺陷的缺陷设备的信息，省略对半导体器件应用的检查的执行。

公开(公告)号：US12085512B2

公开(公告)日：2024-09-10

申请号：US17677960

申请日：2022-02-22

Applicant: Lenovo (Beijing) Limited

Inventor： Wei Liu ,  Feng Xu ,  Lin Zhu ,  Dakun Yang

IPC: G01N21/88 ,  G06T7/00 ,  G06T7/73

CPC classification number: G01N21/8851 ,  G06T7/0004 ,  G06T7/73 ,  G01N2021/8877 ,  G01N2021/888 ,  G06T2207/30141

Abstract: A processing method includes obtaining a processing image of a apparatus and performing a second processing on the processing image to generate a target image to analyze the target image according to a target defect detection method to realize defect detection of the apparatus. The processing image is obtained by performing a first processing on an initial image of the apparatus. The first processing includes performing scale processing on the initial image according to defect parameters corresponding to the initial image.