摘要:
An exposure apparatus includes a movable stage, a chuck device which is arranged on the stage and holds a substrate, a first gas supply device for supplying a gas to a position of the substrate to be exposed, and a plurality of divided planar members which are arranged adjacent to a periphery of the substrate such that at least a part of the divided planar members covers a position measurement mirror of the movable stage, and are flush with or substantially flush with a surface of the substrate or a substrate holding surface of the chuck device.
摘要:
Apparatus and methods are disclosed for detecting and measuring a tool-induced shift in a microlithography apparatus (“stepper”). The apparatus and methods are set forth in the context of microlithography apparatus that include a wafer stage and a holding member to which the wafer is mounted for exposure. The holding member can include, for example, a wafer table and wafer chuck, wherein the wafer table desirably includes a respective movable mirror for each of X- and Y-directions of movement. The holding member is rotatable, relative to the wafer stage, from a first rotational position to a second rotational position, which can be angularly displaced, e.g., 90° and/or 180° from each other. At each of the first and second rotational positions, a respective location of an alignment feature on the holding member (e.g., on the substrate, wafer chuck, or wafer table) is determined. The respective locations at the first and second rotational positions are compared, and a corresponding tool-induced shift is determined from a detected difference between the respective locations. Rotation of the holding member desirably is effected using a rotary actuator.
摘要:
A scanning exposure apparatus for exposing a substrate with a pattern formed on an original while scanning the original and the substrate. The apparatus includes a chuck for holding a substrate, a stage for moving the chuck to align the substrate, a mechanism for purging an exposure optical path near the stage with inert gas, the mechanism having a cover covering the exposure optical path between a substrate-side lower end of an optical system and a vicinity of the stage, and a supply port for supplying inert gas into the cover, and a top plate which is mounted on the stage and has a surface substantially flush with a surface of the substrate. The top plate is arranged to form a gap between the top plate and a side surface of the substrate, a depth of the gap is not less than a width of the gap, and a dimension from the side surface of the substrate to an outer edge of the top plate is larger than that of a substrate-side opening of the cover in a scanning direction.
摘要:
A flexible chuck for supporting a substrate during lithographic processing is described. This flexible chuck includes an electrode layer, a piezoelectric layer disposed on the electrode layer, and a substrate support layer disposed above the piezoelectric layer. By providing electrical signals to the piezoelectric layer through the electrode layer, the support layer can be flexed, thereby changing surface topography on a substrate disposed on the flexible chuck. The contact layer can include projections, each of the projections corresponding to a respective electrode within the electrode layer. Furthermore, the substrate support layer can be formed of a conductive material and thus serve as the ground layer. Alternatively, separate substrate support and ground layers can be provided. The flexible chuck in accordance with the instant invention can be a vacuum chuck. Also described is a method of monitoring topographic changes in a flexible chuck in accordance with the instant invention.
摘要:
A lithographic stage includes a platen having a top face and a bottom face and a holder for holding an optical component on the top face of the platen. The platen is made of a light-weight material such as high purity fused silica or ultra low expansion glass. The bottom face of the platen may further include means for connecting to a positioning device in an extreme ultraviolet lithography system.
摘要:
A system for holding substrates in microlithography to prevent flatness errors. Deflections cause by gravity bend the surface of the substrate. Spacer elements are provided between the table and the substrate to hold the substrate in a horizontal position. The rim of the substrate is sealed, so that a chamber is formed containing air. Different air pressure can be provided on different sides of the substrate in order to prevent deflection.
摘要:
A stacker apparatus is disclosed which includes a plurality of trays for receiving sheet-like media discharged from two or more medium exits. Between two upper and lower medium exits (4C, 4D) included in the two or more medium exits (4A to 4F), a tray holder (8C) on which the upper side tray (7C) for receiving sheet-like media (20) discharged from the upper side medium exit (4C) of the two upper and lower medium exits (4C, 4D) in a stacked state can be removably and securely held is disposed. The tray holder (8C) is selectively changed over to one of a first state wherein the tray holder (8C) securely holds the upper side tray (7C) when the upper side tray (7C) is mounted thereon and a second state wherein the tray holder (8C) releases the upper side tray (7C) and operates integrally with the lower side tray (7D) provided for receiving the sheet-like media (20) discharged from the lower side medium exit (4D) of the two upper and lower medium exits (4C, 4D) in a stacked state to function as part of a tray for receiving sheet-like media (20) from the upper side medium exit (4C) in a stacked state together with the lower side tray (7D).
摘要:
A multi-beam scanning apparatus including a light source unit having a plurality of light emitting parts configured to emit a plurality of divergent light fluxes, a deflector configured to deflect the plurality of divergent light fluxes emitted from the light source unit, and an imaging system configured to couple the plurality of divergent light fluxes from the light source unit with the deflector and to condense the deflected plurality of light fluxes into optical spots on a surface to be scanned. The light source unit is configured so the optical spots are separated from each other in a sub-scanning direction on the surface to be scanned, and optical axes of the light fluxes emitted from the plurality of light emitting parts are angled in a substantially same direction in the sub-scanning direction relative to optical axes of respective corresponding coupling lenses.
摘要:
An exposure holding apparatus includes a substrate holding section for holding a substrate. The substrate holding section includes a thin film, which causes a photocatalytic reaction upon irradiation with light. This substrate holding apparatus prevents adhesion of foreign materials, which causes a decrease in yield of device production, and provides a system for rapidly removing the foreign materials.
摘要:
A stage device includes a movable body, movable along a guide surface, for moving an element mounted on the movable body, a static pressure bearing, having at least one pad, for guiding the movable body along the guide surface, the at least one pad being attached to the movable body at a first position, and a linear motor, having a movable part and a relatively stationary part, for moving the movable body, the movable part of the linear motor being attached to the movable body at a second position. The movable body has a hollow structure at at least one of the first position and the second position. The hollow structure has an enclosure structure or a rib structure.