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    OPTICAL COMPONENT OPERATING IN NEAR-FIELD TRANSMISSION
    1.
    发明申请
    OPTICAL COMPONENT OPERATING IN NEAR-FIELD TRANSMISSION 失效
    近场传输中的光学元件操作

    公开(公告)号：US20090205090A1

    公开(公告)日：2009-08-13

    申请号：US12304131

    申请日：2007-06-08

    申请人： Salim Mimouni ,  Ludovic Poupinet

    发明人： Salim Mimouni ,  Ludovic Poupinet

    IPC分类号： G12B21/06 ,  G01N13/14

    CPC分类号： G01Q60/22 ,  G01Q80/00 ,  G11B7/1353 ,  G11B7/1381 ,  G11B7/1387

    摘要： This is a near-field detection optical component operating in transmission. It includes at least one portion (11b) forming at least one grating (11) of diffraction microstructures (11a) succeeding one another over several periods (p), this grating (11) being capable of converting evanescent waves (16), which are established between the component and an object (12) located in the near field, when it reflects or emits radiation having a wavelength, into propagating waves (16′) by a diffraction effect during transmission through the portion (11b) forming the grating (11) of diffraction microstructures (11a). The period (p) of the grating (11) being of the order of magnitude of the wavelength of the radiation.Application to near-field detection devices.

    摘要翻译： 这是在传输中工作的近场检测光学部件。 它包括至少一个部分（11b），其形成在几个周期（p）之后彼此相继的衍射微结构（11a）的至少一个光栅（11），该光栅（11）能够转换ev逝波（16） 当通过形成光栅（11）的部分（11b）的透射期间，位于近场中的物体（12）当其反射或发射具有波长的辐射时，通过衍射效应将其传播到传播波（16'）中 ）的衍射微结构（11a）。 光栅（11）的周期（p）为辐射波长的数量级。 应用于近场检测装置。

    Near-field aperture having a fractal iterate shape
    2.
    发明授权
    Near-field aperture having a fractal iterate shape 失效
    具有分形迭代形状的近场光圈

    公开(公告)号：US07423265B2

    公开(公告)日：2008-09-09

    申请号：US11666063

    申请日：2005-10-21

    申请人： Joseph A. Matteo ,  Lambertus Hesselink ,  Yin Yuen

    发明人： Joseph A. Matteo ,  Lambertus Hesselink ,  Yin Yuen

    IPC分类号： G12B21/06

    CPC分类号： H01Q1/36 ,  Y10S977/862

    摘要： Near-field electromagnetic devices having an opaque metallic screen with a fractal iterate aperture are provided. More specifically, the aperture is obtained by application of a self-similar replacement rule to an initial shape two or more times. Alternatively, the aperture can be obtained by application of a self-similar replacement rule one or more times to an initial C-shape. Such apertures tend to have multiple transmission resonances due to their multiple length scales. Fractal iterate apertures can provide enhanced transmission and improved spatial resolution simultaneously. Enormous improvement in transmission efficiency is possible. In one example, a checkerboard fractal iterate aperture provides 1011 more intensity gain than a square aperture having the same spatial resolution. Efficient transmission for fractal iterate apertures having spatial resolution of λ/20 is also shown. The effect of screen thickness and composition can be included in detailed designs, but do not alter the basic advantages of improved transmission and spatial resolution provided by the invention.

    摘要翻译： 提供具有分形迭代孔径的不透明金属屏幕的近场电磁装置。 更具体地，通过将​​自相似的替换规则应用于初始形状两次或更多次来获得孔径。 或者，可以通过将自相似替换规则一次或多次应用于初始C形来获得孔径。 这样的孔由于其多个长度尺度而倾向于具有多个传输谐振。 分形迭代孔径可以同时提供增强的传输和改进的空间分辨率。 传输效率的巨大提高是可能的。 在一个示例中，棋盘分形迭代孔径具有比具有相同空间分辨率的方形孔径更多的强度增益10 11。 还示出了具有λ/ 20的空间分辨率的分形迭代孔的有效传输。 屏幕厚度和组成的效果可以包括在详细的设计中，但不改变本发明提供的改进的传输和空间分辨率的基本优点。

    Surface texture measuring probe and microscope utilizing the same
    4.
    发明申请
    Surface texture measuring probe and microscope utilizing the same 有权
    表面纹理测量探针和显微镜利用它

    公开(公告)号：US20060090550A1

    公开(公告)日：2006-05-04

    申请号：US11263681

    申请日：2005-11-01

    申请人： Kazuhiko Hidaka

    发明人： Kazuhiko Hidaka

    IPC分类号： G01N13/10 ,  G01B21/30 ,  G12B21/02 ,  G12B21/06 ,  G01N13/14

    CPC分类号： G01Q60/38 ,  G01Q60/22 ,  G01Q70/04

    摘要： A surface texture measuring probe (60) includes a probe head (65), a first supporting body (61), a second supporting body (62), a piezoelectric element (63) and a balancer (64). The first supporting body includes a first supporter (611) having an inner space, and a plurality of beams (613) respectively extending from equiangular arrangement positions of the first supporter toward the center and supporting the probe head (65) at the tip end thereof. The second supporting body (62) includes a second supporter (621) and a holder (622) supported by a plurality of beams (623) respectively extending from equiangular arrangement positions of the second supporter towards the center. The piezoelectric element (63) is disposed between the probe head and the holder, and formed to vibrate in an axial direction.

    摘要翻译： 表面纹理测量探针（60）包括探头（65），第一支撑体（61），第二支撑体（62），压电元件（63）和平衡器（64）。 第一支撑体包括具有内部空间的第一支撑件（611）和分别从第一支撑件的等角布置位置朝向中心延伸的多个梁（613），并且在顶端处支撑探头（65） 。 第二支撑体（62）包括第二支撑件（621）和由分别从第二支撑件的等角位置向中心延伸的多个梁（623）支撑的支架（622）。 压电元件（63）设置在探针头和保持器之间，并形成为沿轴向振动。

    Near-field scanning optical microscopy with nanoscale resolution from microscale probes
    5.
    发明申请
    Near-field scanning optical microscopy with nanoscale resolution from microscale probes 有权
    近场扫描光学显微镜，采用微量探针的纳米级分辨率

    公开(公告)号：US20090276923A1

    公开(公告)日：2009-11-05

    申请号：US12387642

    申请日：2009-05-04

    申请人： Mikhail Sumetsky

    发明人： Mikhail Sumetsky

    IPC分类号： G12B21/06

    CPC分类号： G01Q60/22

    摘要： To date, the probes of scanning near-field optical microscopes were aimed at creating electromagnetic field characteristics that are maximally localized near a nano-sized point (miniature apertures and tips, fluorescent nano-particles and molecules, dielectric and metal corners). Alternatively, the probe field, which is distributed within a larger area, can ensure the super-resolution as well. For this purpose, the field spectrum should be enriched with high spatial frequencies corresponding to small sample dimensions. As examples of such near-field probes, we propose and theoretically study the models of optical fibers with end-faces containing sharp linear edges and randomly distributed nanoparticles. These probes are more robust than the conventional probes and their fabrication is not concerned with nanoscale precision. The probes enable waveguiding of light to and from the sample with marginal losses distributing and utilizing the incident light more completely. Numerical modeling shows that, even with substantial measurement noise, the suggested probes can resolve objects that are significantly smaller than the probe size and, in certain cases, can perform better than miniature nanoprobes.

    摘要翻译： 到目前为止，扫描近场光学显微镜的探针旨在创建最大限度地定位在纳米尺寸点附近（微型孔和尖端，荧光纳米颗粒和分子，电介质和金属角）的电磁场特性。 或者，分布在更大区域内的探针场也可以确保超分辨率。 为此，场谱应该富集与小样本维数对应的高空间频率。 作为这种近场探针的例子，我们提出并理论上研究具有包含尖锐线性边缘和随机分布的纳米颗粒的端面的光纤的模型。 这些探针比常规探针更坚固，其制造不涉及纳米级精度。 这些探头能够使光线与样品波导到边缘损耗，从而更均匀地分布和利用入射光。 数值模拟表明，即使具有实质的测量噪声，建议的探针可以解析明显小于探头尺寸的物体，并且在某些情况下，可以比微型纳米探针更好地执行。

    Near-Field Scanning Optical Microscope Probe Having a Light Emitting Diode
    6.
    发明申请
    Near-Field Scanning Optical Microscope Probe Having a Light Emitting Diode 失效
    具有发光二极管的近场扫描光学显微镜探头

    公开(公告)号：US20080054168A1

    公开(公告)日：2008-03-06

    申请号：US11848283

    申请日：2007-08-31

    申请人： Kazunori Hoshino ,  Xiaojing Zhang

    发明人： Kazunori Hoshino ,  Xiaojing Zhang

    IPC分类号： G12B21/06 ,  B44C1/22

    CPC分类号： G01Q60/22 ,  Y10S977/849 ,  Y10S977/86 ,  Y10S977/862

    摘要： An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.

    摘要翻译： 公开了一种改进的近场扫描光学显微镜探针。 近场扫描光学显微镜探针包括探针体和从探针体延伸以形成探针尖端的两个电极。 此外，在探针尖端的两个电极之间设置有发光二极管，作为近场扫描光学显微镜探针的光源。