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    MATERIAL WEIGHT MEASUREMENT SYSTEM
    3.
    发明申请
    MATERIAL WEIGHT MEASUREMENT SYSTEM 有权

    公开(公告)号：US20220228906A1

    公开(公告)日：2022-07-21

    申请号：US17576542

    申请日：2022-01-14

    申请人： Scale-Tec, Ltd.

    发明人： Nicholas VON MUENSTER

    IPC分类号： G01G23/14 ,  G01G21/22 ,  H04N7/18 ,  G06T7/00

    摘要： A machine vision camera combined to one of the first storage carrier and the second storage carrier for detecting an offloading event. A sensor for measuring the weight of the material offloaded from the first storage carrier to the second storage carrier. A scale controller in communication with the machine vision camera and the sensor. The scale controller enters a tear mode in response to the beginning of offloading event and records and stores the weight of material offloaded from the first storage carrier to the second storage carrier as measured by the sensor.

    METHOD FOR CALCULATING THE QUANTITY OF GOODS BASED ON WEIGHING
    4.
    发明申请
    METHOD FOR CALCULATING THE QUANTITY OF GOODS BASED ON WEIGHING 有权

    公开(公告)号：US20210156727A1

    公开(公告)日：2021-05-27

    申请号：US17263400

    申请日：2019-07-26

    申请人： Yang BAI

    发明人： Yang BAI

    IPC分类号： G01G19/00 ,  G01G23/01 ,  G01G23/14

    摘要： A method for calculating the quantity of goods based on weighing includes the following steps: Step 1, Weight Conversion; accurately convert the weighing reading to the corresponding weight value W; Step 2, Weight Scaling; that is, the conversion of weight units; Step 3, Zero Point Correction; calibrate the weight reading; Step 4, Tare; remove the weight of non-goods objects in the weight value; Step 5, Anti-Mutation Filtering; anti-mutation filtering on the weight value; Step 6, Quantity Conversion; convert the weight value after calibration and correction of steps 1 to 5 above into the approximate (rough) quantity of the goods; Step 7, Quantity Calibration; calibrate the rough quantity of the above-mentioned goods.

    COMPUTER-READABLE STORAGE MEDIUM FOR WEIGHING ITEMS
    9.
    发明申请
    COMPUTER-READABLE STORAGE MEDIUM FOR WEIGHING ITEMS 有权
    用于称重项目的计算机可读存储介质

    公开(公告)号：US20150362357A1

    公开(公告)日：2015-12-17

    申请号：US14740506

    申请日：2015-06-16

    申请人： Axel Kieser ,  Volker Baum ,  Andreas Blume ,  Karsten Von der Waydbrink

    发明人： Axel Kieser ,  Volker Baum ,  Andreas Blume ,  Karsten Von der Waydbrink

    IPC分类号： G01G19/00 ,  G01G23/14 ,  G01G11/16 ,  G01G21/22

    CPC分类号： G01G19/005 ,  G01G11/16 ,  G01G19/002 ,  G01G21/22 ,  G01G21/23 ,  G01G23/06 ,  G01G23/14

    摘要： In a dynamic scale and a weighing method therefor, an object to be weighed is received on a weighing unit of the dynamic scale and weight information of the object on the weighing unit is detected by the weighing unit. The weight information includes a number of items of weight information, which are supplied to a processor, and a derived weight value is determined in the processor by evaluation of a predetermined number of the items of weight information, and a quality value for the derived weight value is also determined in the processor by evaluation of the predetermined number of items of weight information. Depending on the quality value, it is established, in the processor, that the derived weight value is a valid weight value and, when it is established that the derived weight value is a valid weight value, the weighing unit is then fed with a new object.

    摘要翻译： 在动态规模和称重方法中，被称重的物体被接收在动态刻度的称重单元上，称重单元检测到称重单元上的物体的重量信息。 权重信息包括提供给处理器的多个权重信息项目，并且通过对预定数量的权重信息项进行评估来确定处理器中的推导权重值，以及所得到的权重的质量值 还通过对预定数量的权重信息项进行评估，在处理器中确定值。 根据质量值，在处理器中确定导出的权重值是有效的权重值，并且当确定导出的权重值是有效的权重值时，然后向称重单元馈送新的 目的。

    Semiconductor Wafer Metrology Apparatus and Method
    10.
    发明申请
    Semiconductor Wafer Metrology Apparatus and Method 审中-公开
    半导体晶圆计量仪器及方法

    公开(公告)号：US20140231152A1

    公开(公告)日：2014-08-21

    申请号：US14187422

    申请日：2014-02-24

    申请人： METRYX LIMITED

    发明人： Robert John WILBY

    IPC分类号： G01G23/14

    CPC分类号： G01G23/14 ,  G01G9/00 ,  G01G21/22 ,  G01G23/00 ,  H01L21/67253

    摘要： A semiconductor wafer metrology technique which corrects for the effect of electrostatic forces on an atmospheric buoyancy compensated weight force measurement of a semiconductor wafer. In one aspect a wafer is weighed in a faraday cage whose is measured independently. A change in the measured weight of the faraday cage can be used to correct the measure weight the wafer. In another aspect a direct electrostatic measurement can be converted into a weight correction using a predetermined correlation between an electrostatic charge measured by the charge meter and a weight error force. In another aspect the electrostatic measurement may be indirect, e.g. derived from varying the distance between the wafer and a grounded plate parallel to the wafer to effect a change in an electrostatic force between the grounded plate and the wafer.

    摘要翻译： 一种用于校正静电力对半导体晶片的大气浮力补偿重力测量的影响的半导体晶片测量技术。 在一个方面，在独立测量的法拉第笼中称重晶片。 可以使用法拉第笼的测量重量的变化来校正晶片的测量重量。 在另一方面，直接静电测量可以使用由计费表测量的静电电荷与重量误差力之间的预定相关性转换为权重校正。 在另一方面，静电测量可以是间接的，例如， 来自改变晶片与平行于晶片的接地板之间的距离，以实现接地板和晶片之间的静电力的变化。