Image acquisition device and image acquisition method

    公开(公告)号:US11921277B2

    公开(公告)日:2024-03-05

    申请号:US16772983

    申请日:2018-11-06

    发明人: Satoshi Takimoto

    摘要: An image acquisition device includes: a stage on which a sample is placed; a drive unit; a first irradiation optical system; a second irradiation optical system; a beam splitter; a pupil dividing element; a first imaging lens; a first imaging element; an analysis unit; a control unit; a second imaging lens; and a second imaging element, a first irradiation light irradiation range captured by the first irradiation optical system includes a second imaging region captured by the second imaging element, the second imaging region is located behind a first imaging region in a scanning direction, and the control unit controls a focus position of an objective lens based on focus information before capturing the second imaging region by the second imaging element.

    Dark-field microscope apparatus utilizing portable electronic communication device

    公开(公告)号:US11543638B2

    公开(公告)日:2023-01-03

    申请号:US16637733

    申请日:2018-08-09

    申请人: Ye Hu Dali Sun

    发明人: Ye Hu Dali Sun

    摘要: A mobile phone-based dark field microscope (MDFM) apparatus suitable for quantifying nanoparticle signals is provided. The MDFM apparatus includes an electrically operated light source, a dark-field condenser, a slide housing configured to receive an analytical slide, and an adapter housing configured to receive an objective lens and receive a portable electronic communication device. The slide housing positions the analytical slide between the objective lens and the dark-field condenser. The adapter housing registers the objective lens with a camera lens of the portable electronic communication device. A method for performing a biological quantitative study using the dark-field microscope apparatus is further provided.

    DARK FIELD MICROSCOPE
    4.
    发明申请

    公开(公告)号:US20220229278A1

    公开(公告)日:2022-07-21

    申请号:US17608038

    申请日:2020-04-02

    摘要: A dark field metrology device includes an objective lens arrangement and a zeroth order block to block zeroth order radiation. The objective lens arrangement directs illumination onto a specimen to be measured and collects scattered radiation from the specimen, the scattered radiation including zeroth order radiation and higher order diffracted radiation. The dark field metrology device is operable to perform an illumination scan to scan illumination over at least two different subsets of the maximum range of illumination angles; and simultaneously perform a detection scan which scans the zeroth order block and/or the scattered radiation with respect to each other over a corresponding subset of the maximum range of detection angles during at least part of the illumination scan.

    METHOD AND APPARATUS FOR IMAGING SELF-LUMINOUS OBJECT ON BIOLOGICAL SAMPLE FILM

    公开(公告)号:US20220171177A1

    公开(公告)日:2022-06-02

    申请号:US17599529

    申请日:2020-03-27

    发明人: Yinghao Zhang Yan Xi

    IPC分类号: G02B21/36 G02B21/10

    摘要: Provided are a method and apparatus for imaging a self-luminous object on a biological sample film (A); said imaging apparatus comprises a housing (1), an optical-electrical conversion element (2), and an image correction device (3); the inside of the housing (1) constitutes a darkroom space; the optical-electrical conversion element (2) is arranged in the housing (1); the optical-electrical conversion element (2) is used, when the biological sample film (A) is not inserted, for obtaining a first dark field image inside the housing (1); after affixing the biological sample film (A) to the surface of the optical-electrical conversion element (2), the optical-electrical conversion element (2) is also used for obtaining a second dark field image inside the housing (1); the image correction device (3) is used for correcting the second dark field image according to the first dark field image to obtain a target image corresponding to the self-luminous object. The imaging apparatus and imaging method can effectively and more accurately obtain a higher-definition target image of the self-luminous object; the operation process is simple and the time required for imaging is short; furthermore, the imaging apparatus has the advantages of a small structure, low cost of manufacture, convenient operation, and portability.

    Method and apparatus for examining a sample using structured light-sheet illumination

    公开(公告)号:US11092792B2

    公开(公告)日:2021-08-17

    申请号:US15766375

    申请日:2016-10-10

    摘要: A method for examining a sample in light sheet fluorescence microscopy includes generating an illumination light beam using a light source. The illumination light beam is spatially split into at least two partial illumination light beams using a splitter. The partial illumination light beams are guided through an illumination objective shared by the partial illumination light beams. After the partial illumination light beams have passed through the illumination objective, at least one of the partial illumination light beams is deflected using at least one deflector such that the partial illumination light beams interfere with one another in an illumination plane so as to generate an illumination pattern in the illumination plane. An image of a sample region illuminated by the illumination pattern is produced, wherein detection light that emanates from the sample region reaches a position-sensitive detector through a detection objective.

    Device and method for capturing images

    公开(公告)号:US10948705B2

    公开(公告)日:2021-03-16

    申请号:US16065263

    申请日:2016-12-22

    摘要: A device for recording images is provided, an image-recording device and an illumination device being arranged on the same side of a specimen plane in said device. The image-recording device has illumination portions, for example individual light sources, which are actuatable independently of one another in order to be able to illuminate a specimen in the specimen plane at different angles and/or from different directions. In this way, it is possible to record a plurality of images with different illuminations, which can be combined to form a results image with improved properties.

    POSITION DETECTION APPARATUS, EXPOSURE APPARATUS, AND ARTICLE MANUFACTURING METHOD

    公开(公告)号:US20200319447A1

    公开(公告)日:2020-10-08

    申请号:US16826458

    申请日:2020-03-23

    IPC分类号: G02B21/10 G01B11/26 G03F9/00

    摘要: Position detection apparatus includes illumination optical system for illuminating target, detection optical system for forming image of the illuminated target illuminated on photoelectric converter, first array having first aperture stops, second array having second aperture stops, first driving mechanism for arranging the selected first aperture stop on pupil of the illumination optical system by driving the first array such that first aperture stop crossing optical axis of the illumination optical system moves in first direction, second driving mechanism for arranging the selected second aperture stop on pupil of the detection optical system by driving the second array such that second aperture stop crossing optical axis of the detection optical system moves in second direction. The first and second driving mechanisms fine-tune positions of the selected first and second aperture stops in the first and second directions, respectively.

    Method for detecting defects and associated device

    公开(公告)号:US10509214B2

    公开(公告)日:2019-12-17

    申请号:US15374902

    申请日:2016-12-09

    申请人: Soitec

    摘要: A method for determining the size of a void-type defect in a top side of a structure comprising a top layer placed on a substrate, the defect being located in the top layer, includes introducing the structure into a reflected darkfield microscopy device in order to generate, from a light ray scattered by the top side, a defect-related first signal and a roughness-related second signal. The intensity of the roughness-related second signal is captured with a plurality of pixels. The intensity captured by each pixel is compared with the intensities captured by neighboring pixels. It is defined whether or not the pixel is contained in an abnormal zone. The standard deviation of the intensity values captured by the pixels of the abnormal zone is extracted, and the size of the void-type defect associated with the abnormal zone is determined from the extracted standard deviation. A new device may be used for carrying out such a method.