Abstract:
An imaging system includes an array of photodetectors and electronic circuitry associated with the photodetectors to read intensity values from the photodetectors. The electronic circuitry can include an integrator with an integrator capacitor having a nominal capacitance, wherein a gain of the electronic circuitry associated with a photodetector can depend at least in part on the actual capacitance of the integrator capacitor, the actual capacitance differing from the nominal capacitance. The imaging system can be configured to determine a gain factor that depends at least in part on the actual capacitance and/or a signal voltage input to the integrator. The imaging system can be configured to apply the gain factor based at least in part on the actual capacitance of the integrator capacitor calculated. The imaging system can be a thermal imaging system and may include an infrared camera core.
Abstract:
In embodiments of object presence and condition detection, a light (108) is emitted that is directed at a first edge (110) of a translucent object (106) to pass through the translucent object, such as a lens. An intensity of the light is detected proximate an opposing, second edge (112) of the translucent object. A presence and/or a condition of the translucent object can then be determined based on the detected intensity of the light that passes through the object. The translucent object can be implemented as a multi-lens array, and a laser light is directed through optic surfaces of the multi-lens array with a laser. The presence and the condition of the multi-lens array can be continuously determined as a safety compliance of the laser light being directed through the multi-lens array.
Abstract:
Es wird ein Lichtsensor (101) für eine Beleuchtungseinrichtung (113), ein Beleuchtungssystem umfassend mindestens einen Lichtsensor (101) und ein Verfahren zur Einstellung einer Helligkeit eines Beleuchtungssystems umfassend mindestens einen Lichtsensor (101) vorgeschlagen. Diese ermöglichen eine Anpassung des Lichtsensors (101) an einen Abstand (115) zu einem entfernten Boden oder einem sonstigen entfernten, zu beleuchtenden Bereich (114), worunter insbesondere auch Hallenböden mit einer Deckenhöhe von mehr als 5 m fallen.
Abstract:
The invention discloses a pulsed-laser obstacle avoidance device incorporating a high intensity LED illuminator consisting of a pulsed-laser detector 101, pulsed-laser beam emitting source 102, high intensity and efficiency LED illuminator 103, microcontroller 104 and a user interface 105. Obstacle avoidance process is based upon the methods of time- of -flight of a laser pulse or echo signal strength. Process increases operator or vehicle safety by visually indicating or illuminating a detected obstacle. Same device embodiment trough expansion and prioritizing of a microcontroller algorithm simultaneously performs other tasks also, such as automatic fog lamp activation, foreign pulsed-laser signal detection and disruption with automatic camouflaging of the disruption signal source and communication with foreign pulsed-laser transponders.
Abstract:
A display device includes a pixel which includes a first photosensor portion having a first photodiode for detecting visible light, which is provided together with a display element portion; and a pixel which includes a second photosensor portion having a second photodiode for detecting infrared rays, which is provided together with another display element portion. The second photosensor portion detects infrared rays included in external light, and selects an imaging element and adjusts sensitivity in accordance with the amount of infrared rays detected by the second photosensor portion.
Abstract:
Method and systems related to obstructing a first predefined portion of at least one defined wavelength of light incident upon a first photo-detector array; and detecting the at least one defined wavelength of light with a photo-detector in a second photo-detector array.
Abstract:
Inspection systems, circuits and methods are provided to enhance defect detection by addressing anode saturation as a limiting factor of the measurement detection range of a photomultiplier tube (PMT) detector. Inspection systems, circuits and methods are also provided to enhance defect detection by addressing saturation levels of the amplifier and analog-digital circuitry as a limiting factor of the measurement detection range of an inspection system. In addition, inspection systems, circuits, and methods are provided to enhance defect detection by reducing thermal damage to large particles by dynamically altering the incident laser beam power level supplied to the specimen during a surface inspection scan.
Abstract:
In a self-referencing instrument for measuring electromagnetic radiation, a mounting member to which a sample can be coupled moves the sample such that, in a first position, the electromagnetic radiation impinges on the sample, and, in a second position, the electromagnetic radiation does not impinge on the sample. A detection unit receives the electromagnetic radiation from the sample and generates a sample signal when the sample is in the first position, and the detection unit receives the electromagnetic radiation from the source and generates a reference signal when the sample is in the second position. A processor coupled to the detection unit processes the reference signal and the sample signal. This results in a continuous, accurate reference measurement, and permits the instrument to efficiently compensate for error, while offering accurate measurements.
Abstract:
A method and apparatus for compensating for systematic error a wavelength measure device, providing values for the wavelengths reflected from fiber Bragg gratings (FBGs) being used as sensors. The invention uses a high-precision temperature sensing and measuring circuit to measure the temperature of a reference FBG. The wavelength reflected by the reference FBG changes with temperature in a known way and the temperature of the reference FBG must be measured to know what wavelength is in fact being reflected. This wavelength is then provided to a dynamic compensator, which also receives the wavelength of light reflected from the sensor FBGs, and adjusts the wavelengths of the sensors FBGs using a correction based on the correction required to adjust the wavelength of the reference FBG so as to agree with the wavelength in fact reflected from the reference FBG. The circuit uses a reference resistor, unaffected by temperature, and a thermistor, and measures both resistances using the same exact circuit components by switching either the thermistor or the reference resistor in to the same temperature sensing and measuring circuit.