METHOD AND APPARATUS FOR INSPECTION OF MATERIALS
    1.
    发明申请
    METHOD AND APPARATUS FOR INSPECTION OF MATERIALS 审中-公开
    材料检验方法与装置

    公开(公告)号:WO2008142448A2

    公开(公告)日:2008-11-27

    申请号:PCT/GB2008050360

    申请日:2008-05-19

    CPC classification number: G01N23/04 G01N23/2076 G01V5/0016

    Abstract: A method of and apparatus for obtaining radiation transmission data and especially an image of an object which involves providing a radiation source such as an x-ray or gamma-ray source and a radiation detector system such as an x-ray or gamma-ray detection system spaced therefrom to define a scanning zone therebetween, the detector system being capable of detecting and collecting spectroscopically resolvable information about incident radiation; collecting a dataset of information about radiationincident at the detector and hence transmissivity of an object in the scanning zone at at least one and preferably a plurality of scanning positions from radiation transmitted through the object and received at the detector system; resolving each such dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; wherein at least one of the said plurality of frequency bands corresponds to a characteristically scattered wavelength of a target species to be identified, andwherein the absence of or substantial reduction in a transmitted signal intensity at the frequency band is interpreted as the presence of the said target species. The resolved data is preferably resolved as one or more images.

    Abstract translation: 一种用于获得辐射透射数据的方法和装置,特别是涉及提供诸如x射线或γ射线源的辐射源和诸如x射线或γ射线检测之类的放射线检测器系统的物体的图像 系统与其隔开以限定它们之间的扫描区域,所述检测器系统能够检测和收集关于入射辐射的光谱可解析信息; 收集关于在检测器处发生的辐射的信息的数据集,并且因此从穿过物体的辐射的至少一个且优选多个扫描位置收集在扫描区域中的物体的透射率,并在检测器系统处接收; 在光谱范围内的多个频带内光谱地解析每个这样的数据集; 其中所述多个频带中的至少一个频带对应于要识别的目标物种的特征散射波长,并且其中在频带处的发射信号强度的不存在或实质上减少被解释为存在所述目标 种类。 解析的数据优选地被解析为一个或多个图像。

    TRACKING DEVICE, SYSTEM AND METHOD
    3.
    发明申请
    TRACKING DEVICE, SYSTEM AND METHOD 审中-公开
    跟踪装置,系统和方法

    公开(公告)号:WO2010058202A1

    公开(公告)日:2010-05-27

    申请号:PCT/GB2009/051542

    申请日:2009-11-16

    CPC classification number: G01T7/00

    Abstract: A tracking device for tracking with a radioactive material, a container including such a device, a system using such devices, and a tracking method are described. The device has a radiation detector (10) associatable with a radioactive material (14) adapted to be placed in use within a container (1) defining a radiation-shielded enclosure (7) for containing a radioactive material, to detect radiation activity from the material (14); a RF identification module (12) associatable with the container (1), comprising a data register to store a unique product identification code, a processor with a data transfer link (11) to each of the radiation detector (10) and data register to receive and process a live data stream of activity data from the detector (10) and associate this with the unique product identification code in a processed data packet, and an antenna (13) to enable transmission of a data item comprising both the unique product identification code and processed activity data to a remote data capture means (16), at least the antenna (13) being adapted to sit outside the radiation-shielded enclosure.

    Abstract translation: 描述了使用放射性物质跟踪的跟踪装置,包括这种装置的容器,使用这种装置的系统以及跟踪方法。 该装置具有辐射探测器(10),该放射线检测器(10)可与放射性物质(14)相关联,放射性材料(14)适于被放置在容器(1)内,所述容器(1)限定用于容纳放射性物质的辐射屏蔽外壳(7) 材料(14); 与容器(1)相关联的RF识别模块(12),包括用于存储唯一产品识别码的数据寄存器,具有数据传输链路(11)到每个辐射检测器(10)的处理器和数据寄存器 接收并处理来自检测器(10)的活动数据的实时数据流,并将其与经处理的数据分组中的唯一产品识别码相关联,以及天线(13),以便能够传输包括唯一产品标识 代码和处理的活动数据到远程数据捕捉装置(16),至少天线(13)适于位于辐射屏蔽外壳之外。

    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF
    4.
    发明申请
    SEMICONDUCTOR DEVICE STRUCTURE AND METHOD OF MANUFACTURE THEREOF 审中-公开
    半导体器件结构及其制造方法

    公开(公告)号:WO2009004376A3

    公开(公告)日:2009-02-26

    申请号:PCT/GB2008050521

    申请日:2008-06-30

    CPC classification number: H01L31/0336 H01L31/03529 H01L31/1828 Y02E10/543

    Abstract: A semiconductor device structure comprising a first bulk crystal semiconductor material and a second bulk crystal semiconductor material provided on a surface of the first bulk crystal semiconductor material with or without a deliberate intermediate region, the second bulk crystal semiconductor material being a Group II-VI material dissimilar to the first bulk crystal semiconductor material, wherein portions of the first and/or second bulk crystal semiconductor material have been selectively removed to produce a patterned area of reduced thickness of the first and/or second bulk crystal semiconductor and preferably to expose a patterned area of the said surface of the first and/or second bulk crystal semiconductor material.

    Abstract translation: 一种半导体器件结构,包括第一体晶半导体材料和第二体晶半导体材料,所述第一体晶半导体材料设置在具有或不具有有意中间区域的第一块状半导体材料的表面上,所述第二体晶半导体材料为II-VI族材料 不同于第一块体晶体半导体材料,其中第一和/或第二块状半导体材料的部分已被选择性地去除以产生第一和/或第二块状半导体的厚度减小的图案化区域,并且优选地暴露图案化 第一和/或第二块体半导体材料的所述表面的面积。

    APPARATUS FOR CRYSTAL GROWTH
    6.
    发明申请
    APPARATUS FOR CRYSTAL GROWTH 审中-公开
    晶体生长装置

    公开(公告)号:WO2008142395A1

    公开(公告)日:2008-11-27

    申请号:PCT/GB2008/001713

    申请日:2008-05-16

    Abstract: Apparatus for vapour phase growing of crystals having a single multi-zone heater arranged to heat a heated zone to give a predetermined temperature profile along the length of the heated zone. A generally U-shaped tube having a first limb, a second limb, and a linkage connecting the first alid second limbs is located on the heated zone. The first limb contains a source material. The second limb supports a seed such that the source material and seed are spaced longitudinally within the heated zone to provide a predetermined temperature differential between the source and seed. The crystal is grown on the seed.

    Abstract translation: 用于气相生长具有单个多区加热器的晶体的装置,其布置成加热加热区以沿着加热区的长度给出预定的温度分布。 具有第一肢体,第二肢体和连接第一齿状第二肢体的连接件的大致U形管位于加热区域上。 第一肢含有源材料。 第二肢支撑种子,使得源材料和种子在加热区域内纵向隔开,以在源和种子之间提供预定的温差。 晶体生长在种子上。

    INSPECTION OF MATERIALS BY EVALUATING, THE CONTRIBUTION OF BRAGG SCATTERING TO ENERGY DISPERSIVE X-RAY ATTENUATION
    10.
    发明申请
    INSPECTION OF MATERIALS BY EVALUATING, THE CONTRIBUTION OF BRAGG SCATTERING TO ENERGY DISPERSIVE X-RAY ATTENUATION 审中-公开
    通过评估对材料进行检查,分析散射对能量分散X射线衰减的贡献

    公开(公告)号:WO2008142448A4

    公开(公告)日:2009-03-05

    申请号:PCT/GB2008050360

    申请日:2008-05-19

    CPC classification number: G01N23/04 G01N23/2076 G01V5/0016

    Abstract: A method of and apparatus for obtaining radiation transmission data and especially an image of an object which involves providing a radiation source such as an x-ray or gamma-ray source and a radiation detector system such as an x-ray or gamma-ray detection system spaced therefrom to define a scanning zone therebetween, the detector system being capable of detecting and collecting spectroscopically resolvable information about incident radiation; collecting a dataset of information about radiationincident at the detector and hence transmissivity of an object in the scanning zone at at least one and preferably a plurality of scanning positions from radiation transmitted through the object and received at the detector system; resolving each such dataset spectroscopically across a plurality of frequency bands within the spectrum of the source; wherein at least one of the said plurality of frequency bands corresponds to a characteristically scattered wavelength of a target species to be identified, andwherein the absence of or substantial reduction in a transmitted signal intensity at the frequency band is interpreted as the presence of the said target species. The resolved data is preferably resolved as one or more images.

    Abstract translation: 一种用于获得辐射透射数据的方法和装置,特别是涉及提供诸如x射线或γ射线源的辐射源和诸如x射线或γ射线检测之类的放射线检测器系统的物体的图像 系统与其隔开以限定它们之间的扫描区域,所述检测器系统能够检测和收集关于入射辐射的光谱可解析信息; 收集关于在检测器处发生的辐射的信息的数据集,并且因此从穿过物体的辐射的至少一个且优选多个扫描位置收集在扫描区域中的物体的透射率,并在检测器系统处接收; 在光谱范围内的多个频带内光谱地解析每个这样的数据集; 其中所述多个频带中的至少一个频带对应于要识别的目标物种的特征散射波长,并且其中在频带处的发射信号强度的不存在或实质上减少被解释为存在所述目标 种类。 解析的数据优选地被解析为一个或多个图像。

Patent Agency Ranking