Abstract:
A laser-based material processing method, system and subsystem for use therein for precision energy control are provided, wherein a bulk attenuator is switched across an RF driver output to greatly lower the overall RF output and resulting laser energy per pulse. The value of the attenuator determines the range of energies achievable, pj or fractions of pj's. More than one attenuator and switch can be used to achieve multiple energy ranges. After the bulk attenuator is switched in, the laser energy is greatly reduced and the RF driver can then be run again near full RF power where the SNR is much better. The input voltage from a DAC is also much higher so it is also not at the low end of its range where it is also noisy due to poor SNR. The method and system provides increased dynamic range, greater extinction (lower possible energies), better accuracy and stability due to higher SNR of the DAC input voltage and higher SNR in the RF driver.
Abstract:
Methods and systems for laser soft marking, especially for semiconductor wafers and devices, are provided. A laser-marking system for marking a semiconductor wafer to form a softmark on the wafer is provided. The system includes a laser subsystem for generating one or more laser pulses and a controller operatively connected to the laser subsystem. The controller sets a laser pulse width of the one or more laser pulses to selectively provide one or more laser output pulses having one or more set pulse widths that affect the depth of a softmark that is to be formed. The mark depth is substantially dependent on the one or more set pulse widths. The controller further sets a pulse energy of the one or more output pulses to selectively provide the one or more output pulses having a set total output energy that is within an acceptable process energy window for producing the softmark. The system further includes a beam delivery system that includes an optical subsystem for delivering the one or more output pulses having the one or more set pulse widths and the set total output energy into a region of the wafer such that energy density within the region, as determined by the one or more set pulse widths and the set total pulse energy, modifies wafer material and thereby produces the softmark having the mark depth within a predetermined range.
Abstract:
A method and system for laser hard marking is provided. The lasermarking system produces a hard mark on a semiconductor wafer. The system includes a pulsed laser subsystem that produces a pulsed laser output for marking at a location on the wafer. The pulsed laser subsystem is controlled so that output pulse width remains substantially constant with a variation in at least one of pulse repetition rate and output energy over a range. A beam delivery system delivers the pulsed laser output to the location on the wafer.
Abstract:
A method and system for locally processing a predetermined microstructure (10) formed on a substrate without causing undesirable changes in electrical or physical characteristics of the substrate (13) or other structures formed on the substrate. The method includes providing information based on a model of laser pulse (13) interactions with the predetermined microstructure (10), the substrate (13) and other structures. At least one characteristic of at least one pulse (13) is determined based on the information. A pulsed laser beam (3) is generated including the at least one pulse (3). The method further includes irradiating the at least one pulse (3) having the at least one determined characteristic into a spot on the predetermined microstructure (10). The at least one determined characteristic and other characteristics of the at least one pulse (3) are sufficient to locally process the predetermined microstructure (10) without causing the undesirable changes.
Abstract:
A method, system and scan lens system are provided for high-speed, laser-based, precise laser trimming at least one electrical element. The method includes generating a pulsed laser output having one or more laser pulses at a repetition rate. Each laser pulse has a pulse energy, a laser wavelength within a range of laser wavelengths, and a pulse duration. The method further includes selectively irradiating the at least one electrical element with the one or more laser pulses focused into at least one spot having a non-uniform intensity profile along a direction and a spot diameter as small as about 6 microns to about 15 microns so as to cause the one or more laser pulses to selectively remove material from the at least one element and laser trim the at least one element while avoiding substantial microcracking within the at least one element. The wavelength is short enough to produce desired short-wavelength benefits of small spot size, tight tolerance and high absorption, but not so short so as to cause microcracking.
Abstract:
A mirror mounting unit is disclosed for use in a limited rotation motor system. The mirror mounting unit includes a mirror, and a tapered base for coupling the mirror mounting unit to an output shaft of a limited rotation motor. In various embodiments, the tapered base may be male or female, the mirror may be formed integral with the tapered base, and the taper may be linear or non-linear.
Abstract:
An expandable sealed chamber and method for contact bonding optical components, suitable for electronic and optical applications such as a closed core tunable etalon. There is a spring bellows tube core (12) with open end collars where the collar spacing is controlled by external piezo elements (11). Opposing tophat components (3) are contact bonded to the collars so as to define an airgap within the chamber. The collars are fabricated of material having a coefficient of thermal expansion closely matched to that of the tophat components, and the collar end planes are prepared with a sputtered deposition layer of the same material as the tophats and then milled to an optically smooth finish for contact bonding.
Abstract:
An optimization system is disclosed for optimizing the performance of a laser processing system that employs a limited rotation motor. The optimization system includes an input unit for receiving input parameters including stroke speed, stroke delay, jump speed and jump delay, and includes an evaluation unit for identifying one of an optimal stroke speed or stroke quality for achieving a desired processing performance.
Abstract:
An optical element is disclosed for use in a scanning system. The optical element comprises a carbon-based substrate having a first specific stiffness, and a titanium carbide coating having a second specific stiffness. The carbon-based substrate and the titanium carbide coating form a composite having a desired shape. The composite has a third specific stiffness that is greater than the first specific stiffness and greater than the second specific stiffness.
Abstract:
An optical element is disclosed for use in a scanning system. The optical element comprises a carbon-based substrate having a first specific stiffness, and a titanium carbide coating having a second specific stiffness. The carbon-based substrate and the titanium carbide coating form a composite having a desired shape. The composite has a third specific stiffness that is greater than the first specific stiffness and greater than the second specific stiffness.