LOCALIZATION OF DETECTION SPOTS
    5.
    发明申请
    LOCALIZATION OF DETECTION SPOTS 审中-公开
    检测点的本地化

    公开(公告)号:WO2012101539A1

    公开(公告)日:2012-08-02

    申请号:PCT/IB2012/050156

    申请日:2012-01-12

    CPC classification number: G01N21/552 G01N33/54313 G01N33/54366 G01N33/54373

    Abstract: The invention relates to a method and a sensor device(100) that allow for the determination of geometrical properties like the position and/or area of at least one detection spot(153) on a contact surface(152), wherein said detection spot(153) has a height that is different from the height of the residual surface. The detection spot(153) may for example be a region coated with binding sites for target molecules. The localization of the detection spot(153) is achieved by illuminating the contact surface(152) with evanescent waves and by observing an output light beam(L2, L2') which is affected by an interaction between test particles(1), which cover the detection spot(153) and the contact surface(152), and said evanescent waves. The test particles may for example be magnetic particles(1) that are attracted to the contact surface(152) by magnetic forces, or they may be transported to the contact surface(152) by sedimentation. The location of the detection spot(153) may be determined at the end or at the beginning of an assay and be used during the evaluation of measurements.

    Abstract translation: 本发明涉及一种方法和传感器装置(100),其允许确定诸如接触表面(152)上的至少一个检测点(153)的位置和/或面积的几何特性,其中所述检测点 153)具有与残余表面的高度不同的高度。 检测点(153)可以例如是涂覆有靶分子的结合位点的区域。 通过用ev逝波照射接触表面(152)并且通过观察被测试颗粒(1)之间的相互作用影响的输出光束(L2,L2')来实现检测点(153)的定位,其覆盖 检测点(153)和接触表面(152)以及所述ev逝波。 测试颗粒可以是例如通过磁力吸引到接触表面(152)的磁性颗粒(1),或者它们可以通过沉降被输送到接触表面(152)。 检测点(153)的位置可以在测定结束或开始时确定,并且在评估测量期间使用。

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