公开(公告)号：WO2017127719A1

公开(公告)日：2017-07-27

申请号：PCT/US2017/014392

申请日：2017-01-20

Applicant: IONFIELD HOLDINGS, LLC

Inventor： HENSLEY, Paul, F.

IPC: C12Q1/02 ,  C12Q1/68 ,  G01N21/17 ,  G01N33/48 ,  G01N33/50

CPC classification number: B01L3/5085 ,  B01L3/545 ,  B01L2300/021 ,  B01L2300/022 ,  G01N21/253 ,  G01N21/274 ,  G01N21/6452 ,  G01N35/00693

Abstract: A system and method to perform calibrated assays in reusable microplates, the method including steps of illuminating a microplate having wells and a microplate identifier, with a probe signal, detecting an uncalibrated return signal, reading the microplate identifier, retrieving, from a database by use of the microplate identifier, a calibration factor for each well in the microplate, calibrating the return signal for each well by use of the respective calibration factor for said well, and outputting the calibrated return signal as said calibrated assay. The system includes a microplate, comprising a plurality of wells and a microplate identifier, a reader to read the microplate identifier, a probe signal source and return signal detector, wherein a return signal comprises a probe signal after interaction with the plurality of wells, a calibration database to store the microplate identifier associated with return signal measurements, and a processor to perform the method.

Abstract translation: 用于在可重复使用的微孔板中执行校准测定的系统和方法，所述方法包括以下步骤：用探针信号照射具有孔和微孔板标识物的微孔板，检测未校准的返回信号，读取微孔板标识符 ，通过使用微孔板标识符从数据库中检索微孔板中每个孔的校准因子，通过使用所述孔的相应校准因子校准每个孔的返回信号，并且输出校准的返回信号作为所述校准的 检测。 该系统包括：包含多个孔和微孔板标识物的微孔板，读取微孔板标识符的读数器，探针信号源和返回信号检测器，其中返回信号包括与多个孔相互作用后的探针信号， 校准数据库以存储与返回信号测量相关联的微孔板标识符，以及处理器执行该方法。

公开(公告)号：WO2016127110A2

公开(公告)日：2016-08-11

申请号：PCT/US2016/016859

申请日：2016-02-05

Applicant: IONFIELD HOLDINGS, LLC

Inventor： HENSLEY, Paul, F. ,  GABRIEL, David

IPC: H01J37/32

CPC classification number: H01J37/32348 ,  H01J37/32018 ,  H01J37/32532 ,  H01J37/32568 ,  H01J2237/335 ,  H05H1/2406 ,  H05H2001/2418 ,  H05H2001/2437

Abstract: A system to generate plasma to clean at least one object, the apparatus comprising a microplate with an electrode support array comprising a plurality of matched pairs of elongated dielectric barrier members connected to a plurality of electrodes, with said dielectric barrier members of said matched pair being spaced at a pre-determined non-uniform gap, a variable time scale pulsed power source electrically coupled to said electrodes to provide electrical pulses and a plurality of electronic components to control polarity of said electrical pulses, such that said pulses produce electron streamers from opposing elongated dielectric barrier members of said plurality of matched pairs and charge on a surface of said dielectric barrier member is substantially evenly distributed.

Abstract translation: 一种用于产生等离子体以清洁至少一个物体的系统，所述装置包括具有电极支撑阵列的微板，所述电极支撑阵列包括连接到多个电极的多个匹配成对的细长电介质阻挡构件，所述匹配对的所述电介质阻挡构件为 以预定的非均匀间隙间隔开，电可耦合到所述电极的可变时标脉冲电源以提供电脉冲和多个电子部件来控制所述电脉冲的极性，使得所述脉冲从相对的方向产生电子拖缆 所述多个匹配对中的细长电介质阻挡构件并且在所述电介质阻挡构件的表面上充电基本上均匀分布。

公开(公告)号：WO2016127096A1

公开(公告)日：2016-08-11

申请号：PCT/US2016/016841

申请日：2016-02-05

Applicant: IONFIELD HOLDINGS, LLC

Inventor： HENSLEY, Paul, F.

IPC: B08B7/00

CPC classification number: G01N21/359 ,  B01L99/00 ,  B01L2200/141 ,  B01L2200/143 ,  B01L2300/0829 ,  B08B13/00 ,  G01N21/94 ,  G01N35/1004 ,  G01N2035/00277 ,  G01N2035/00633 ,  G01N2201/10

Abstract: An apparatus and method to clean a substrate and to verify an effectiveness of the cleaning is disclosed. The method includes scanning substrate to generate a pre-cleaning data by using a first mechanism; cleaning substrate by using a second mechanism; scanning substrate to generate a post-cleaning data by using the first mechanism; and generating at least one contamination characteristic based on a comparison between the pre-cleaning data and the post-cleaning data. The contamination characteristic is analyzed for evidence of a contaminant in order to verify effectiveness of the cleaning. Process parameters may be adjusted based upon feedback from the effectiveness of the cleaning.

Abstract translation: 公开了一种清洁基板并验证清洁效果的装置和方法。 该方法包括通过使用第一机构扫描基板以产生预清洗数据; 通过使用第二机构清洁衬底; 扫描基板以通过使用第一机构产生后清洗数据; 并且基于预清洗数据和后清洗数据之间的比较产生至少一个污染特征。 分析污染特征以获得污染物的证据，以验证清洁的有效性。 过程参数可以根据清洁效果的反馈进行调整。