Abstract:
A level-shifter is provided with PMOS stacks that are selectively weakened or strengthened depending upon the binary state of an input signal.
Abstract:
In certain aspects, a circuit includes a dynamic differential logic gate having first and second outputs, and a first static differential logic gate having first and second outputs, and first and second inputs coupled to the first and second outputs, respectively, of the dynamic differential logic gate. The dynamic differential logic gate is configured to receive a clock signal and to preset both the first and second outputs of the dynamic differential logic gate to a first preset value during a first phase of the clock signal. The first static differential logic gate is configured to preset both the first and second outputs of the first static differential logic gate to a second preset value when the first preset value is input to both the first and second inputs of the first static differential logic gate.
Abstract:
In an aspect of the disclosure, a method and an apparatus are provided. The apparatus is a register array including first and second flip-flop latch arrays. The first flip-flop latch array includes a first set of master latches, a first set of slave latches coupled to the first set of master latches, and a first address port. The second flip-flop latch array includes a second set of master latches, a second set of slave latches coupled to the second set of master latches, and a second address port. The register array includes an address counter, coupled to the first flip-flop latch array and the second flip-flop latch array. The address counter is shared by the first flip-flop latch array and the second flip-flop latch array and configured to address, in parallel in a test mode, the first flip-flop latch array through the first address port and the second flip-flop latch array through the second address port.
Abstract:
A memory and a method for operating the memory having a sleep mode are provided. The memory one or more storage elements and a bitline coupled to the one or more storage elements. A precharge circuit is configured to precharge the bitline during a precharge period and float the bitline during a sleep mode. An operating circuit coupled to the one or more storage elements, wherein at least one of the operating circuit and the one or more storage elements being configured to remain electrically coupled to a supply voltage in the sleep mode.
Abstract:
An apparatus and method of employing mutually exclusive write and read clocks in scan capture mode for testing digital interfaces. The apparatus includes a first circuit and a first clock generator configured to generate a first clock signal for transferring a test sample from an input to an output of the first circuit in response to the first clock signal during each of a first set of scan capture cycles; a second circuit and a second clock generator configured to generate a second clock signal for transferring the test sample from an input to an output of the second circuit in response to the second clock signal during each of a second set of scan capture cycle; the first clock signal being suppressed during each scan capture cycle of the second set, and the second clock signal being suppressed during each scan capture cycle of the first set.
Abstract:
A write assist driver circuit is provided that assists a memory cell (e.g., volatile memory bit cell) in write operations to keep the voltage at the memory core sufficiently high for correct write operations, even when the supply voltage is lowered. The write assist driver circuit may be configured to provide a memory supply voltage VddM to a bit cell core during a standby mode of operation. In a write mode of operation, the write assist driver circuit may provide a lowered memory supply voltage VddM lower to the bit cell core as well as to at least one of the local write bitline (lwbl) and local write bitline bar (lwblb). Additionally, the write assist driver circuit may also provide a periphery supply voltage VddP to a local write wordline (lwwl), where VddP ≥ VddM > VddM lower .
Abstract:
A static, ternary content addressable memory (TCAM) includes a key cell and a mask cell coupled to intermediate match lines. The key cell is coupled to a first pull-down transistor and a first pull-up transistor. The mask cell is coupled to a second pull-down transistor and a second pull-up transistor. The first pull-down transistor and second pull-down transistor are connected in parallel and the first pull-up transistor and second pull-up transistor are connected in series. A match line output is also coupled to the first pull-down transistor and second pull-down transistor and further coupled to the first pull-up transistor and second pull-up transistor.
Abstract:
In one embodiment, a voltage level shifter (810) includes a first p-type metal-oxide-semiconductor transistor (835) having a gate configured to receive an input signal (D) in a first power domain, and a second PMOS transistor (840), wherein the first and second PMOS transistors are coupled in series between a supply voltage (vddout) of a second power domain and a node (820). The voltage level shifter also includes an inverter (850) having an input coupled to the node and an output (Z) coupled to a gate of the second PMOS transistor, and a first n-type metal-oxide-semiconductor transistor (830) having a gate configured to receive the input signal in the first power domain, wherein the first NMOS transistor is coupled between the node and a ground.
Abstract:
A voltage level shifter includes a first NOR gate (250) having a first input (252) configured to receive a first input signal (D_N) in a first power domain, a second input (255) configured to receive an enable signal (ENB) in a second power domain, a third input (257), and an output (Z). The voltage level shifter also includes a second NOR gate (220) having a first input (222) configured to receive a second input signal (D) in the first power domain, a second input (225) configured to receive the enable signal in the second power domain, a third input (227) coupled to the output of the first NOR gate, and an output (Z_N) coupled to the third input of the first NOR gate. The first and second NOR gates are powered by a supply voltage of the second power domain.
Abstract:
A method within a hybrid ternary content addressable memory (TCAM) includes comparing a first portion of a search word to a first portion of a stored word in a first TCAM stage. The method further includes interfacing an output of the first TCAM stage to an input of the second TCAM stage. The method also includes comparing a second portion of the search word to a second portion of the stored word in a second TCAM stage when the first portion of the search word matches the first portion of the stored word. The first TCAM stage is different from the second TCAM stage.