Abstract:
Embodiments of the present disclosure describe methods, apparatus, and system configurations for cyclic redundancy check circuits using Galois-field arithmetic.
Abstract:
Each realization of an electric circuit design defines a frequency response. For a test lot of the design, frequency responses are measured, each at a stable value of an environment parameter, wherein the totality of the values are distributed over a parameter range. Based on the measurements, a de- sign-specific model is defined that describes a frequency response of the de- sign in dependence of the environment parameter. For a unit in a main lot of realizations of the design, a unit-specific frequency response is measured at a stable value of the environment parameter; the model is fitted to the response, whereby a unit-specific model is obtained; data representing the unit- specific model is stored in association with the unit; and the unit is operated in conjunction with a compensation stage configured to determine a present value of the environment parameter and compensate drift in relation to a parameter-independent reference frequency response.
Abstract:
Automatic test equipment (ATE) includes circuitry configured to pass a signal in a channel of the ATE, and memory configured to store a first look-up table (LUT) and a second LUT. The first LUT is configured to provide a first correction value based on a first version of the signal, where the first correction value are for use in correcting static non-linearity associated with the channel. The second LUT is configured to provide a second correction value based on a second version of the signal, where the second correction value are for use in correcting dynamic non-linearity associated with the channel. Digital signal processing logic is configured to use the first correction value, the second correction value, and the signal in order to compensate for harmonic distortion from the channel.
Abstract:
Automatic test equipment (ATE) includes circuitry configured to pass a signal in a channel of the ATE, and memory configured to store a first look-up table (LUT) and a second LUT. The first LUT is configured to provide a first correction value based on a first version of the signal, where the first correction value are for use in correcting static non-linearity associated with the channel. The second LUT is configured to provide a second correction value based on a second version of the signal, where the second correction value are for use in correcting dynamic non-linearity associated with the channel. Digital signal processing logic is configured to use the first correction value, the second correction value, and the signal in order to compensate for harmonic distortion from the channel.
Abstract:
Polyphase nonlinear digital predistorters (pNDPs) mitigate nonlinear distortions generated by time-interleaved digital-to-analog converters (TIDACs). Processors in an example pNDP compute nonlinear and linear compensation terms representative of channel mismatches and other imperfections in the TIDAC based on the digital input to the TIDAC. The pNDP subtracts these compensation terms from a delayed copy of the digital input to yield a predistorted digital input. The TIDAC converts on the predistorted digital input into a fullband analog output that is substantially free of nonlinear distortion.
Abstract:
A system having: a digital pre-distortion circuit fed by a digital signal for distorting the digital signal; a digital to analog converter (DAC) core section coupled to an output of the calibration circuit for converting the distorted digital signal into a corresponding analog signal, the DAC core section performing the conversion in accordance with a control signal fed to the DAC core section; a power amplifier (PA) section coupled to an output of the DAC core section for amplifying power in the analog signal; and a calibration circuit coupled to the output of the power amplifier for producing, in response to the power in the power amplified analog signal, the control signal for the DAC core section.
Abstract:
L'invention concerne un procédé de génération d'un signal numérique représentatif de l'erreur d'appariement entre les canaux d'un système de conversion analogique numérique à entrelacement temporel, un procédé de suppression des erreurs ainsi calculées et un système de conversion analogique numérique à entrelacement temporel l'utilisant. La présente invention propose une solution numérique moins complexe car ne nécessitant pas l'extraction des défauts du signal à la sortie du convertisseur. Elle permet de corriger les erreurs d'appariement par la création directe de signaux numériques représentatifs de ces erreurs, et leur soustraction du signal numérisé en sortie du système de conversion. Un objet de l'invention est un procédé de génération d'un signal numérique représentatif de l'erreur d'appariement entre les canaux d'un système de conversion analogique numérique à entrelacement temporel (CAN 10) comportant un convertisseur analogique numérique (CAN 1 , CAN 2 ,.... CAN N ) sur chaque canal. Ledit procédé comporte la détermination du spectre (11-12) dudit signal numérique en fonction de la réponse fréquentielle du système de conversion analogique numérique à entrelacement temporel (CAN 10) à au moins un signal de calibration analogique (IC).
Abstract:
An analogue-digital or digital-analogue converter is provided with an internal reference voltage selection device (7). Several reference voltages (VREF0...VREFi) are applied to said selection device which selects one of said reference voltages according to a selection signal (VREF_SEL) and transmits said reference voltage to a conversion device (1, 3) of the converter. A correction network (2) can be provided to correct offset and linearity errors regardless of the use of several reference voltages that can be freely selected.
Abstract:
An analogue-digital or digital-analogue converter is provided with an internal reference voltage selection device (7). Several reference voltages (VREF0...VREFi) are applied to said selection device which selects one of said reference voltages according to a selection signal (VREF_SEL) and transmits said reference voltage to a conversion device (1, 3) of the converter. A correction network (2) can be provided to correct offset and linearity errors regardless of the use of several reference voltages that can be freely selected.