- 专利标题: Runtime measurement of process variations and supply voltage characteristics
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申请号: US16108596申请日: 2018-08-22
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公开(公告)号: US11585854B1公开(公告)日: 2023-02-21
- 发明人: Da Cheng , Nui Chong , Amitava Majumdar , Ping-Chin Yeh , Cheang-Whang Chang
- 申请人: Xilinx, Inc.
- 申请人地址: US CA San Jose
- 专利权人: Xilinx, Inc.
- 当前专利权人: Xilinx, Inc.
- 当前专利权人地址: US CA San Jose
- 代理机构: Crawford Maunu PLLC
- 主分类号: G01R31/319
- IPC分类号: G01R31/319 ; G01R31/3185 ; G01R31/317 ; G01R31/28 ; H03K3/03 ; G06F13/42 ; H03L7/099 ; H03K19/00 ; G06F1/324 ; G06F1/3206 ; H03K19/17784 ; G01R19/165 ; G06F1/26 ; G06F1/32 ; G06F1/3203 ; G06F1/3296
摘要:
Circuits and methods involve an integrated circuit (IC) device, a plurality of application-specific sub-circuits, and a plurality of instances of a measuring circuit. The application-specific sub-circuits are disposed within respective areas of the IC device. Each instance of the measuring circuit is associated with one of the application-specific sub-circuits and is disposed within a respective one of the areas of the device. Each instance of the measuring circuit further includes a ring oscillator and a register for storage of a value indicative of an interval of time. Each instance of the measuring circuit is configured to measure passage of the interval of time based on a first clock signal, count oscillations of an output signal of the ring oscillator during the interval of time, and output a value indicating a number of oscillations counted during the interval of time.
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