Invention Grant
- Patent Title: Assembling method and maintaining method for vertical probe device
- Patent Title (中): 垂直探针装置的组装方法和维护方法
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Application No.: US14643780Application Date: 2015-03-10
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Publication No.: US09465050B2Publication Date: 2016-10-11
- Inventor: Tsung-Yi Chen , Horng-Kuang Fan , Ching-Hung Yang , Chung-Tse Lee , Chia-Yuan Kuo , Tien-Chia Li , Ting-Ju Wu
- Applicant: MPI CORPORATION
- Applicant Address: TW Chu-Pei, Hsinchu Shien
- Assignee: MPI CORPORATION
- Current Assignee: MPI CORPORATION
- Current Assignee Address: TW Chu-Pei, Hsinchu Shien
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: TW103108187A 20140310
- Main IPC: G01R31/01
- IPC: G01R31/01 ; G01R3/00 ; G01R1/073 ; G01R31/26

Abstract:
An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.
Public/Granted literature
- US20150253358A1 ASSEMBLING METHOD AND MAINTAINING METHOD FOR VERTICAL PROBE DEVICE Public/Granted day:2015-09-10
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