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    Probe head of vertical probe card
    1.
    发明授权
    Probe head of vertical probe card 有权

    公开(公告)号：US10041974B2

    公开(公告)日：2018-08-07

    申请号：US15260326

    申请日：2016-09-09

    Applicant: MPI Corporation

    Inventor： Tien-Chia Li ,  Yi-Ching Chuo

    IPC: G01R1/067

    Abstract: A probe head includes a probe base, a film, and a probe assembly. The probe base includes first, second, and third guiding boards. The second guiding board is fixed between the first and third guiding boards. The film is fixed to the probe base and has a hole. The probe assembly passes through the first, second, and third guiding boards and the hole, and includes a probe and an outer spring sleeve. The probe has a tip passing out through the third guiding board. The outer spring sleeve is sleeved at the exterior of the probe and has a spring area and a plurality of non-spring areas. The spring area is disposed between adjacent two of the non-spring areas. One of the non-spring areas has a bonding section mounted to the probe and retained between the third guiding board and the film.

    POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD
    2.
    发明申请
    POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD 有权
    探索卡的位置和探针头的探头

    公开(公告)号：US20150377926A1

    公开(公告)日：2015-12-31

    申请号：US14558735

    申请日：2014-12-03

    Applicant: MPI Corporation

    Inventor： Tzu-Yang Chen ,  Shang-Jung Hsieh ,  Chung-Tse Lee ,  Tsung-Yi Chen ,  Tien-Chia Li ,  Chia-Yuan Kuo ,  Che-Wei Lin

    IPC: G01R1/073 ,  G01R31/28

    CPC classification number: G01R1/07364 ,  G01R1/07357 ,  G01R31/2891

    Abstract: A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

    Abstract translation: 提供探针卡的定位器和探针头。 定位器具有主开口，第一子开口，第二子开口，第三子开口，第四子开口，第一定位部分，第二定位部分，第一弹性部分和第二弹性部分 。 第一子开口，第二子开口，第三子开口和第四子开口依次布置在主开口的周边并且连通到主开口。 第一定位部的刚度和第二定位部的刚度高于第一弹性部的刚度和第二弹性部的刚度。

    Probe needle and probe module using the same
    3.
    发明授权
    Probe needle and probe module using the same 有权

    公开(公告)号：US09618536B2

    公开(公告)日：2017-04-11

    申请号：US14294958

    申请日：2014-06-03

    Applicant: MPI CORPORATION

    Inventor： Chia-Yuan Kuo ,  Tien-Chia Li ,  Ming-Chi Chen ,  Chien-Chou Wu ,  Tsung-Yi Chen

    IPC: G01D11/00 ,  G01R1/073 ,  G01R1/067

    CPC classification number: G01R1/07357 ,  G01R1/0675

    Abstract: A probe needle includes a head, a tail and a body connected between the head and the tail and provided with a first flat section curvedly extending from the head towards the tail for providing sufficient deformation when the tail is pressed on a device under test, and a second flat section neighbored to the first flat section for supporting the probe needle in between upper and lower dies. When the probe needles are used in a probe module, the probe needles can be arranged with a pitch same as that of the conventional probe needles even though the probe needles are formed from posts having a relatively greater diameter than that of the posts for making the conventional probe needles, such that the probe needles may have enhanced current withstanding capacity and prolonged lifespan.

    Assembling method and maintaining method for vertical probe device
    4.
    发明授权
    Assembling method and maintaining method for vertical probe device 有权
    垂直探针装置的组装方法和维护方法

    公开(公告)号：US09465050B2

    公开(公告)日：2016-10-11

    申请号：US14643780

    申请日：2015-03-10

    Applicant: MPI CORPORATION

    Inventor： Tsung-Yi Chen ,  Horng-Kuang Fan ,  Ching-Hung Yang ,  Chung-Tse Lee ,  Chia-Yuan Kuo ,  Tien-Chia Li ,  Ting-Ju Wu

    IPC: G01R31/01 ,  G01R3/00 ,  G01R1/073 ,  G01R31/26

    CPC classification number: G01R3/00 ,  G01R1/073 ,  G01R1/07307 ,  G01R1/07314 ,  G01R1/0735 ,  G01R31/2601 ,  Y10T29/49117 ,  Y10T29/49718 ,  Y10T29/49895

    Abstract: An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.

    Abstract translation: 垂直探针装置的组装方法包括以下步骤：通过将支撑柱插入下模的夹具孔，将下模设置在夹具上，将定位膜紧固在支撑柱上，安装探针和上模， 定位膜位于上模和下模之间，不接触上模，松开定位膜，并移除夹具，使上，下模，定位膜和探针构成装置。 该装置的保持方法包括以下步骤：将支撑柱插入夹具孔中，将定位膜紧固到夹具上，并移除上模。 探头针和上模容易拆卸和安装，探针可靠。 垂直探针装置适用于在其顶部容纳电子部件。

    Wafer testing probe card
    6.
    发明授权
    Wafer testing probe card 有权

    公开(公告)号：US09823272B2

    公开(公告)日：2017-11-21

    申请号：US14162766

    申请日：2014-01-24

    Applicant: MPI Corporation

    Inventor： Ming-Chi Chen ,  Tien-Chia Li ,  Dai-Jin Yeh ,  Tsung-Yi Chen ,  Chien-Kuei Wang

    IPC: G01R31/02 ,  G01R1/073 ,  G01R1/067

    CPC classification number: G01R1/0735 ,  G01R1/06733 ,  G01R1/07314

    Abstract: A wafer testing probe card includes a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. The flexible circuit board is electrically connected to the printed circuit board. The elastic piece is disposed between the printed circuit board and the flexible circuit board. The probe unit includes a probe head and a plurality of probes. The probe head is fixed on the printed circuit board and has a plurality of through holes. The probes respectively pass through the through holes and move up and down relative to the probe head.

    Probe device having spring probe
    8.
    发明授权
    Probe device having spring probe 有权
    探头装置有弹簧探针

    公开(公告)号：US09588141B2

    公开(公告)日：2017-03-07

    申请号：US14628658

    申请日：2015-02-23

    Applicant: MPI Corporation

    Inventor： Tsung-Yi Chen ,  Chien-Chou Wu ,  Tien-Chia Li ,  Ting-Hsin Kuo

    IPC: G01R1/067 ,  G01R1/073 ,  G01R3/00

    CPC classification number: G01R1/06722 ,  G01R1/06705 ,  G01R1/07342 ,  G01R3/00

    Abstract: A probe device includes a spring probe having a spring sleeve with at least a spring section and a connection segment fixed to a needle and having a convex portion protruding over an outer cylinder surface of the spring section, and a probe seat having stacked dies and at least a guiding hole through which the probe is inserted. The dies includes a lower die, a supporting die above the lower die and a non-circular supporting hole at the supporting die. The distance between a supporting surface and a center of the supporting hole is greater than the radius of the outer cylinder surface and smaller than the distance between a guiding surface of the supporting hole and the center, which is greater than the maximum distance between the convex portion and a needle center, thereby preventing the probe receiving external force from exceeding deflection and bending.

    Abstract translation: 探针装置包括：弹簧探针，其具有至少弹簧部分的弹簧套筒和固定到针头的连接部分，并且具有突出在弹簧部分的外筒表面上的凸出部分，以及具有堆叠模具的探针座 至少一个引导孔，探针插入该引导孔。 模具包括下模，下模上方的支撑模和在支撑模处的非圆形支撑孔。 支撑面和支撑孔的中心之间的距离大于外筒表面的半径，并且小于支撑孔的引导表面和中心之间的距离，该距离大于凸起 部分和针中心，从而防止探头接收外力超过偏转和弯曲。

    Spring probe
    9.
    发明授权
    Spring probe 有权
    弹簧探头

    公开(公告)号：US09535092B2

    公开(公告)日：2017-01-03

    申请号：US14605776

    申请日：2015-01-26

    Applicant: MPI CORPORATION

    Inventor： Ting-Hsin Kuo ,  Tsung-Yi Chen ,  Tien-Chia Li ,  Yi-Lung Lee ,  Chien-Chou Wu

    IPC: G01R1/067 ,  G01R1/073

    CPC classification number: G01R1/06722 ,  G01R1/07307

    Abstract: A spring probe includes a needle, a spring sleeve sleeved onto the needle, and a protrusion. The spring sleeve has upper and lower non-spring sections, and at least a spring section therebetween. The needle has a bottom end portion protruding out from the lower non-spring section, and a top end portion located in the upper non-spring section. The protrusion is located at one of the top end portion and the upper non-spring section. The needle is movable relative to the upper non-spring section from an initial position to a connected position where the upper non-spring section is electrically connected with the needle through the protrusion when receiving an external force. As a result, the spring probe effectively prevents signals from being transmitted through the spring section, thereby improving stability of signal transmission and preventing the spring section from fracture.

    Abstract translation: 弹簧探针包括针，套在针上的弹簧套和突起。 弹簧套筒具有上下非弹簧部分，并且至少在其间具有弹簧部分。 针具有从下部非弹簧部分突出的底端部分和位于上部非弹簧部分中的顶端部分。 突起位于顶端部分和上部非弹性部分中的一个处。 针可以相对于上部非弹簧部分从初始位置移动到连接位置，在接收外部力时上部非弹簧部分通过突起与针体电连接。 结果，弹簧探针有效地防止信号通过弹簧部分传递，从而提高信号传输的稳定性并防止弹簧部分断裂。

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