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    POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD
    1.
    发明申请
    POSITIONER OF PROBE CARD AND PROBE HEAD OF PROBE CARD 有权
    探索卡的位置和探针头的探头

    公开(公告)号：US20150377926A1

    公开(公告)日：2015-12-31

    申请号：US14558735

    申请日：2014-12-03

    Applicant: MPI Corporation

    Inventor： Tzu-Yang Chen ,  Shang-Jung Hsieh ,  Chung-Tse Lee ,  Tsung-Yi Chen ,  Tien-Chia Li ,  Chia-Yuan Kuo ,  Che-Wei Lin

    IPC: G01R1/073 ,  G01R31/28

    CPC classification number: G01R1/07364 ,  G01R1/07357 ,  G01R31/2891

    Abstract: A positioner and a probe head of a probe card are provided. The positioner has a main opening, a first sub-opening, a second sub-opening, a third sub-opening, a fourth sub-opening, a first positioning portion, a second positioning portion, a first elastic portion and a second elastic portion. The first sub-opening, the second sub-opening, the third sub-opening, and the fourth sub-opening are sequentially arranged at the periphery of the main opening and are communicated to the main opening. A stiffness of the first positioning portion and a stiffness of the second positioning portion are higher than a stiffness of the first elastic portion and a stiffness of the second elastic portion.

    Abstract translation: 提供探针卡的定位器和探针头。 定位器具有主开口，第一子开口，第二子开口，第三子开口，第四子开口，第一定位部分，第二定位部分，第一弹性部分和第二弹性部分 。 第一子开口，第二子开口，第三子开口和第四子开口依次布置在主开口的周边并且连通到主开口。 第一定位部的刚度和第二定位部的刚度高于第一弹性部的刚度和第二弹性部的刚度。

    Probe needle and probe module using the same
    2.
    发明授权
    Probe needle and probe module using the same 有权

    公开(公告)号：US09618536B2

    公开(公告)日：2017-04-11

    申请号：US14294958

    申请日：2014-06-03

    Applicant: MPI CORPORATION

    Inventor： Chia-Yuan Kuo ,  Tien-Chia Li ,  Ming-Chi Chen ,  Chien-Chou Wu ,  Tsung-Yi Chen

    IPC: G01D11/00 ,  G01R1/073 ,  G01R1/067

    CPC classification number: G01R1/07357 ,  G01R1/0675

    Abstract: A probe needle includes a head, a tail and a body connected between the head and the tail and provided with a first flat section curvedly extending from the head towards the tail for providing sufficient deformation when the tail is pressed on a device under test, and a second flat section neighbored to the first flat section for supporting the probe needle in between upper and lower dies. When the probe needles are used in a probe module, the probe needles can be arranged with a pitch same as that of the conventional probe needles even though the probe needles are formed from posts having a relatively greater diameter than that of the posts for making the conventional probe needles, such that the probe needles may have enhanced current withstanding capacity and prolonged lifespan.

    Assembling method and maintaining method for vertical probe device
    3.
    发明授权
    Assembling method and maintaining method for vertical probe device 有权
    垂直探针装置的组装方法和维护方法

    公开(公告)号：US09465050B2

    公开(公告)日：2016-10-11

    申请号：US14643780

    申请日：2015-03-10

    Applicant: MPI CORPORATION

    Inventor： Tsung-Yi Chen ,  Horng-Kuang Fan ,  Ching-Hung Yang ,  Chung-Tse Lee ,  Chia-Yuan Kuo ,  Tien-Chia Li ,  Ting-Ju Wu

    IPC: G01R31/01 ,  G01R3/00 ,  G01R1/073 ,  G01R31/26

    CPC classification number: G01R3/00 ,  G01R1/073 ,  G01R1/07307 ,  G01R1/07314 ,  G01R1/0735 ,  G01R31/2601 ,  Y10T29/49117 ,  Y10T29/49718 ,  Y10T29/49895

    Abstract: An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.

    Abstract translation: 垂直探针装置的组装方法包括以下步骤：通过将支撑柱插入下模的夹具孔，将下模设置在夹具上，将定位膜紧固在支撑柱上，安装探针和上模， 定位膜位于上模和下模之间，不接触上模，松开定位膜，并移除夹具，使上，下模，定位膜和探针构成装置。 该装置的保持方法包括以下步骤：将支撑柱插入夹具孔中，将定位膜紧固到夹具上，并移除上模。 探头针和上模容易拆卸和安装，探针可靠。 垂直探针装置适用于在其顶部容纳电子部件。

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