PROBE STRUCTURE AND PROBE DEVICE
    1.
    发明申请

    公开(公告)号:US20170192036A1

    公开(公告)日:2017-07-06

    申请号:US15334477

    申请日:2016-10-26

    CPC classification number: G01R1/06722 G01R1/06733 G01R31/2884

    Abstract: A probe structure includes a tube body and a pin body. The tube body has a central axis and includes a first rigid section, a first spring section, a second rigid section, and a second spring section. The first spring section surrounds the central axis and extends in a direction along the central axis. Two ends of the first spring section connect to one end of the first rigid section and one end of the second rigid section. The first spring section and the second spring section are different in spring constant. The pin body passes through and is disposed in the tube body. The pin body has a head section protruding out of the first rigid section, and the head section is fastened to the first rigid section.

    Spring probe
    2.
    发明授权
    Spring probe 有权
    弹簧探头

    公开(公告)号:US09506949B2

    公开(公告)日:2016-11-29

    申请号:US14605798

    申请日:2015-01-26

    CPC classification number: G01R1/06722 G01R1/06738

    Abstract: A spring probe includes a spring sleeve and a needle having a body located inside the spring sleeve and a head protruded out of a lower non-spring section of the spring sleeve and having a stopping block. The lower non-spring section is abutted against and fixed to the stopping block, facilitating assembly of the spring probe. A method for manufacturing the spring probe is disclosed including the steps of forming a spring sleeve having a lower non-spring section with a slot and a guiding sheet adjacent to the slot by photolithography technique, manufacturing a needle having a stopping block with a bonding pad and an engagement rib by MEMS manufacturing process, sleeving the spring sleeve onto the needle to engage the engagement rib into the slot, and fixing the guiding sheet and the needle together by reflow soldering the bonding pad.

    Abstract translation: 弹簧探针包括弹簧套筒和具有位于弹簧套筒内部的主体的针头以及从弹簧套筒的下部非弹簧部分突出并具有止动块的头部。 下部非弹簧部分抵靠固定在止动块上,便于弹簧探头的组装。 公开了一种用于制造弹簧探针的方法,包括以下步骤:通过光刻技术形成具有下部非弹性部分的弹簧套筒,该弹簧套筒具有狭槽和与狭槽相邻的引导片,用粘合垫制造具有止动块的针 以及通过MEMS制造工艺的接合肋,将弹簧套筒套在针上以将接合肋接合到槽中,并通过回焊焊接接合垫将引导片和针固定在一起。

    Assembling method and maintaining method for vertical probe device
    3.
    发明授权
    Assembling method and maintaining method for vertical probe device 有权
    垂直探针装置的组装方法和维护方法

    公开(公告)号:US09465050B2

    公开(公告)日:2016-10-11

    申请号:US14643780

    申请日:2015-03-10

    Abstract: An assembling method for a vertical probe device includes steps of disposing a lower die on a jig by inserting supporting columns through jig holes of the lower die, fastening a positioning film on the supporting columns, installing probe needles and an upper die in a way that the positioning film is located between the upper and lower dies without contacting the upper die, unfastening the positioning film, and removing the jig so that the upper and lower dies, positioning film and probe needles constitute the device. A maintaining method for the device includes steps of inserting the supporting columns through the jig holes, fastening the positioning film to the jig, and removing the upper die. The probe needles and upper die are easily removed and installed and the probe needles are reliable. The vertical probe device is applicable for accommodating electronic components on the top thereof.

    Abstract translation: 垂直探针装置的组装方法包括以下步骤:通过将支撑柱插入下模的夹具孔,将下模设置在夹具上,将定位膜紧固在支撑柱上,安装探针和上模, 定位膜位于上模和下模之间,不接触上模,松开定位膜,并移除夹具,使上,下模,定位膜和探针构成装置。 该装置的保持方法包括以下步骤:将支撑柱插入夹具孔中,将定位膜紧固到夹具上,并移除上模。 探头针和上模容易拆卸和安装,探针可靠。 垂直探针装置适用于在其顶部容纳电子部件。

    Probe module having cantilever MEMS probe and method of making the same

    公开(公告)号:US10436818B2

    公开(公告)日:2019-10-08

    申请号:US15652972

    申请日:2017-07-18

    Abstract: A method of making a cantilever MEMS probe module includes the steps of forming a cantilever MEMS probe on a first surface of a circuit substrate by a MEMS fabrication process in a way that the cantilever MEMS probe has a support post electrically and mechanically connected with an electric contact of the first surface, a cantilever arm connected with the support post, and a needle connected with the cantilever arm, and forming a through hole penetrating through the first surface and a second surface opposite to the first surface of the circuit substrate and corresponding in position to the needle and a part of the cantilever arm by using a cutting tool to cut the circuit substrate from the second surface toward the first surface of the circuit substrate. A probe module made by the method is disclosed too.

    Spring probe and probe card having spring probe

    公开(公告)号:US10393773B2

    公开(公告)日:2019-08-27

    申请号:US15274409

    申请日:2016-09-23

    Abstract: A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact pad against which the spring probe is abutted. At least one of the upper and lower dies has a stopping surface partially facing the probe accommodating hole and an extended portion inserting hole in alignment with the probe accommodating hole. At least one of the upper and lower non-spring sections has a cylinder portion abutted on the stopping surface and an extended portion inserted through the extended portion inserting hole.

    Probe head
    7.
    发明授权
    Probe head 有权
    探头头

    公开(公告)号:US09470715B2

    公开(公告)日:2016-10-18

    申请号:US14150745

    申请日:2014-01-08

    CPC classification number: G01R1/06761 G01R1/06722 G01R1/07314 G01R1/07357

    Abstract: A probe head includes a plate, a probe, and at least one composite coating layer. The plate has at least one through hole therein. The probe is at least partially disposed in the through hole of the plate. The composite coating layer includes a metal layer and a plurality of lubricating particles. The metal layer is disposed in the through hole of the plate and between the plate and the probe. The lubricating particles are dispersed in the metal layer.

    Abstract translation: 探头包括板,探针和至少一个复合涂层。 板中至少有一个通孔。 探针至少部分地设置在板的通孔中。 复合涂层包括金属层和多个润滑颗粒。 金属层设置在板的通孔中,并且在板和探针之间。 润滑颗粒分散在金属层中。

    Current-diverting guide plate for probe module and probe module using the same
    8.
    发明授权
    Current-diverting guide plate for probe module and probe module using the same 有权
    用于探针模块的电流转向导板和使用其的探头模块

    公开(公告)号:US09423424B2

    公开(公告)日:2016-08-23

    申请号:US14152755

    申请日:2014-01-10

    CPC classification number: G01R1/36 G01R1/067 G01R1/06711 G01R1/07357

    Abstract: A current-diverting guide plate for use in a probe module is disclosed to include a plate body having a first surface, a second surface opposite to the first surface, and a plurality of through holes penetrating through the first and second surfaces. A conducting layer is provided at a periphery wall of each through hole of the plate body and electrically coupled to a probe slidably inserted through the through holes. A current-diverting circuit trace is disposed on the first surface of the plate body and electrically connected with the conducting layers for diverting the electric current flowing through probes. Thus, the current-diverting guide plate can be used to prevent the probes from possible damage due to an excessive instantaneous current.

    Abstract translation: 公开了一种用于探针模块的电流转向导板,包括具有第一表面,与第一表面相对的第二表面和穿过第一表面和第二表面的多个通孔的板体。 导电层设置在板体的每个通孔的周壁处,并电耦合到可滑动地插入穿过通孔的探针。 电流转向电路迹线设置在板体的第一表面上并与导电层电连接,用于转移流过探针的电流。 因此,电流转向引导板可用于防止探针由于过大的瞬时电流而导致的可能损坏。

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