摘要:
A Magnetoresistive Random Access Memory (MRAM) integrated circuit includes a substrate, a magnetic tunnel junction region, a magnetic circuit element, and an integrated magnetic material. The magnetic tunnel junction region is disposed on the substrate, and includes a first magnetic layer and a second magnetic layer separated by a tunnel barrier insulating layer. The magnetic circuit element region is disposed on the substrate, and includes a plurality of interconnected metal portions. The integrated magnetic material is disposed on the substrate adjacent to the plurality of interconnected metal portions.
摘要:
L'invention concerne un dispositif magnétique (24, 240) comportant une couche magnétique (5), dite couche libre, présentant une direction d'aimantation variable et une première couche antiferromagnétique (6) au contact de ladite couche libre (5), ladite première couche antiferromagnétique (6) étant apte à piéger la direction d'aimantation de ladite couche libre (5). Le dispositif magnétique (24, 240) comporte en outre une couche réalisée dans un matériau ferromagnétique (7), dite couche de stabilisation, au contact de la première couche antiferromagnétique (6) par sa face opposée à la couche libre (5), les directions d'aimantation desdites couches libre (5) et de stabilisation (7) étant sensiblement perpendiculaires. Une première couche (5) parmi lesdites couches libre (5) et de stabilisation (7) présente une aimantation dont la direction est orientée dans le plan de ladite première couche (5) tandis que la deuxième (7) des deux couches parmi lesdites couches libre (5) et de stabilisation (7) présente une aimantation dont la direction est orientée hors du plan de ladite deuxième couche (7).
摘要:
A magnetoresistance effect device including a multilayer structure having a pair of ferromagnetic layers and a barrier layer positioned between them, wherein at least one ferromagnetic layer has at least the part contacting the barrier layer made amorphous and the barrier layer is an MgO layer having a single crystal structure.
摘要:
A magnetization reversal device includes a ferromagnetic 12 body which is provided in an interconnection of a non-ferromagnetic dot 11 so that a part or a whole of the ferromagnetic dot is three-dimensionally buried in the interconnection of said non-ferromagnetic dot, and a spin injection source 13 which generates a spin-polarized pure spin current without a flow of charges, and which is provided in the interconnection of the non-ferromagnetic dot 11 to be in contact therewith so that the interconnection of the non-ferromagnetic dot serves as a common electrode, and the pure spin current flows into the ferromagnetic dot 2 through the interconnection of the non-magnetic body by the spin injection source 13 due to a diffusion current, to thereby reverse magnetization of the ferromagnetic dot 12. By injecting the pure spin current, using this planar structure, it is possible to easily carry out the magnetization reversal of the ferromagnetic dot 12 even if it is a thick film ferromagnetic dot without being subjected to limitation of a spin diffusion length.
摘要:
A method is disclosed that includes controlling current flow direction for current sent over a source line or a bit line of a magnetic memory device. A current generated magnetic field assists switching of a direction of a magnetic field of a free layer of a magnetic element within a spin transfer torque magnetic tunnel junction (STT-MTJ) device.
摘要:
Disclosed are magnetoelectronic components that comprise: at least one elongate operating structure which is made of a ferromagnetic material and along which magnetic domain walls can migrate; means for applying to this operating structure an electric current; and at least one magnetic field sensor for the magnetic field emitted by the operating structure. According to the invention, the operating structure is designed such that it comprises domain walls, the transverse magnetizing direction of which has no preferred direction in the center thereof in the plane perpendicular to the migration direction of the domain walls along the operating structure, and/or such that the operating structure can form massless domain walls. It was detected that the kinetic energy of this type of moving domain walls disappears, and hence they are not subject to the Walker limit nor to intrinsic pinning. As a result, the components can input, save or process and ultimately output information more quickly. The invention also relates to a method for measuring a non-adiabatic spin transfer parameter ß of a ferromagnetic material. This method was developed during the course of an in-depth study of the phenomena detected.