摘要:
A pseudo dual port memory includes a set of dual port memory cells having a read port and a write port, and configured to store data words in each of a plurality of addressed locations, and a set of single port memory cells having a read/write port, and configured to store data words in each of a plurality of addressed locations. A valid data storage unit is configured to store valid bits corresponding to the addressed locations of the set of dual port memory cells and the set of single port memory cells. Control circuitry is configured to access the addressed locations of the set of dual port memory cells and the set of single port memory cells. The control circuitry performs a simultaneous write operation using the write port of the set of dual port memory cells and the read/write port of the set of single port memory cells, and updates corresponding valid bits in the valid data storage unit, and performs a parallel read operation, at a same addressed location of the set of dual port memory cells and the set of single port memory cells, using the read port of the set of dual port memory cells and the read/write port of the set of single port memory cells, and determining which stored data word is valid based upon the corresponding valid bits in the valid data storage unit.
摘要:
An integrated circuit (10) for storing data comprises a memory cell array (100) comprising a plurality of bit cells (BC1, ..., BCn) comprising a first and a second one of the bit cells (BC1, BC2) having a static random access memory architecture. The first and the second bit cells (BC1, BC2) are coupled to a common wordline (WL_TOP) and are arranged in different columns (C1, C2) of the memory cell array (100). During a write access to the first bit cell (BC1), the first bit cell (BC1) undergoes a write operation, whereas the second bit cell (BC2) is a half-selected bit cell which undergoes a pseudo read operation. The integrated circuit (10) uses a two-phase write scheme to improve the write-ability in low operating voltage environment.
摘要:
Systems and methods for detecting and improving writeability of a static random access memory (SRAM) cell. A bias voltage value (114) corresponding to an operating condition, such as, a process, a voltage, or a temperature operation condition that indicates a cell write failure condition of an external SRAM array comprising the SRAM cell is generated (110). This bias voltage value is applied to word lines of SRAM cells in a model SRAM array (130). A first delay (164) for a trigger signal (124) rippled through the model SRAM array is detected and compared to a reference delay (122). A write assist indication (162) is generated if the first delay is greater than or equal to the reference delay. Based on the write assist indication, a write assist is provided to the SRAM cell.
摘要:
Techniques for generating clock and control signals to achieve good performance for read and write operations in memory devices are described. In one design, a clock and control signal generator within a memory device includes first and second clock generators, first and second control signal generators, and a reset circuit. The first clock generator generates a first clock signal used for read and write operations. The second clock generator generates a second clock signal used for write operations. The reset circuit generates at least one reset signal for the first and second clock generators. The reset signal(s) may have timing determined based on loading due to dummy cells. The first control signal generator generates control signals used for read and write operations based on the first clock signal. The second control signal generator generates control signals used for write operations based on the second clock signal.
摘要:
Random-access memory device (20) comprising select lines (27; 47), bit lines (21.1 - 21.3), and several RAM cells (22.1 - 22.3), each RAM cell (22.1 - 22.3) being connected to a corresponding one of said select lines (27; 47)and to a corresponding one of said bit lines (21.1 - 21.3). The random-access memory device (20) further comprises select buffers (26; 46) for selecting the read-out of one out of the select lines (27; 47) when receiving a selection signal. Each of the select buffers (26; 46) comprises an inverter (29) serving as driver. The inverter (29) is being followed by a diode (30) for limiting output voltage swings at the respective select line (27; 47).
摘要:
A semiconductor memory device includes a memory cell provided at each of intersections of word lines and bit lines and connected to the corresponding word line and the corresponding bit line; an address transition detection circuit; an address latch circuit; an address decoder; a pre-charging circuit; and a control signal generation circuit. The address latch circuit is controlled by a bit line pre-charging signal, such that while the bit line pre-charging signal is at a first logic level, the address signal is input to the address latch circuit, and while the bit line pre-charging signal is at a second logic level, the input address signal is maintained by the address latch circuit. The address decoder is activated by the decoder activating signal. The address decoder is activated, the word line corresponding to the address signal is activated, and the memory cell connected to the corresponding word line is accessed.
摘要:
This invention relates to a synthesizable, synchronous static RAM comprising custom built memcells and a semi-custom IO / precharge section in form of bit slice, a semi-custom built decoder connected to said bit slice and a semi-custom built control clock generation section, which is connected to said semi-custom built decoder and IO section. The arrangement being such as to provides high speed access, easy testability and asynchronous initialization capabilities while reducing design time in a size that is significantly smaller than existing semi custom or standard cell base memory design.