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    OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME
    112.
    发明公开
    OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME 审中-公开
    光学系统，用于测量和LEUCHTKRAFTKOLORIMETER和SO色度计

    公开(公告)号：EP2562520A4

    公开(公告)日：2015-01-14

    申请号：EP11771704

    申请日：2011-03-15

    Applicant: KONICA MINOLTA OPTICS INC

    Inventor： TSURUTANI KATSUTOSHI

    IPC: G01J3/51 ,  G01J3/02 ,  G01J3/50

    CPC classification number: G01J3/51 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/506 ,  G01J3/513

    Abstract: In a measuring probe 40, a measuring beam is diffused by a first diffusion plate 19, and when received by a plurality of light-receiving sensors 13B, 14B, 15B via a plurality of interference filters 13A, 14A, 15B, the measuring beam is made incident on the interference filters 13A, 14A, 15B via second diffusion plates 13C, 14C, 15C. Those interference filters 13A, 14A, 15B are formed such that transmittance characteristics corresponding to a measurement parameter are obtained correspondingly to intensity distribution conditions for an angle of incidence of light incident on the interference filters 13A, 14A, 15B. Therefore, the measuring probe 40 can reduce the effect of displacement of the transmission characteristic caused by the angle of incidence, while using the interference filters 13A, 14A, 15B.

    Image capturing module and image capturing apparatus
    113.
    发明公开
    Image capturing module and image capturing apparatus 审中-公开
    图像捕获模块和摄像装置

    公开(公告)号：EP2421246A3

    公开(公告)日：2015-01-07

    申请号：EP11176659.8

    申请日：2011-08-05

    Applicant: Fujifilm Corporation

    Inventor： Ono, Shuji

    IPC: H04N5/225 ,  H04N9/04 ,  G02B27/00

    CPC classification number: H04N5/2254 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/2823 ,  G01J3/513 ,  G02B26/06 ,  G02B27/0075 ,  G02B27/1013 ,  G02B27/102 ,  H04N9/045 ,  H04N2209/048

    Abstract: A subject image with little blur is provided even when the subject exists in a wide range of distance. An image capturing module includes: a plurality of image capturing systems, each including an optical system and capturing a an image of a subject by light in a wavelength region different from each other to generate a wavelength component signal representing an image of light in the corresponding wavelength region; and an image generating section that combines the wavelength component signals generated by the plurality of image capturing systems thereby generating an image signal representing an image of the subject, where an image capturing system, from among the plurality of image capturing systems, which generates a wavelength component signal having a greater contribution to brightness in the image of the subject includes an optical system having a deeper focal depth.

    MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT POSITION ALIGNMENT METHOD USING THIS, AND MEASUREMENT POSITION ALIGNMENT PROGRAM
    114.
    发明公开
    MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT POSITION ALIGNMENT METHOD USING THIS, AND MEASUREMENT POSITION ALIGNMENT PROGRAM 审中-公开
    MESSVORRICHTUNG，MESSSYSTEM，MESSOSOSOSAUSRICHTUNGSVERFAHREN DAMIT UND MESSPOSITIONSAUSRICHTUNGSPROGRAMM

    公开(公告)号：EP2720015A1

    公开(公告)日：2014-04-16

    申请号：EP12796318.9

    申请日：2012-06-07

    Applicant: Prosper Creative Co., Ltd.

    Inventor： KAWABATA, Hideki ,  KIJIMA, Akira

    IPC: G01J3/50 ,  A61B5/055 ,  A61B6/00 ,  A61B6/03

    CPC classification number: G06T7/408 ,  G01J3/0208 ,  G01J3/0248 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0278 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/2823 ,  G01J3/50 ,  G01J3/513 ,  G06T7/90

    Abstract: A measurement system capable of accurately aligning the corresponding measurement points of a plurality of measurement targets to evaluate the measurement targets from measurement results at both measurement points is provided. A measurement system (100) includes a measuring instrument (10) and a PC (20), and the measuring instrument (10) includes a spectroscopic unit (12) that measures a measurement point of a measurement target and a camera (16) that images surroundings of the measurement point in real-time. The PC (20) displays an evaluation image of continuous image information of an evaluation medium, which is imaged and displayed by the camera (16) of the measuring instrument (10) on a display screen of a display unit (22) so as to be superimposed on a reference image of still image information of a reference medium, which has been imaged by the camera (16) and stored in a memory (24). By comparing the measurement data obtained by measuring the measurement point in the evaluation image when both images overlap each other substantially exactly and the measurement data of the measurement point in the reference image stored in the memory (24), it is possible to perform positioning easily and compare the measurement data.

    Abstract translation: 提供一种能够精确对准多个测量对象的相应测量点的测量系统，以便在两个测量点处从测量结果评估测量目标。 测量系统（100）包括测量仪器（10）和PC（20），测量仪器（10）包括测量测量对象的测量点的分光单元（12）和相机（16）， 测量点的图像环境实时。 PC（20）在显示单元（22）的显示屏幕上显示由测量仪器（10）的照相机（16）成像和显示的评估介质的连续图像信息的评估图像，以便 叠加在由摄像机（16）成像并存储在存储器（24）中的基准介质的静止图像信息的参考图像上。 通过比较当两个图像基本上精确地彼此重叠并且存储在存储器（24）中的参考图像中的测量点的测量数据时，通过测量评估图像中的测量点而获得的测量数据，可以容易地执行定位 并比较测量数据。

    SENSING OF PHOTONS
    116.
    发明公开
    SENSING OF PHOTONS 审中-公开
    检测光子

    公开(公告)号：EP2673805A1

    公开(公告)日：2013-12-18

    申请号：EP12744509.6

    申请日：2012-02-03

    Applicant: Nokia Corporation

    Inventor： VOUTILAINEN, Martti ,  ROUVALA, Markku ,  PASANEN, Pirjo

    IPC: H01L27/146 ,  H01L29/16

    CPC classification number: G01J1/42 ,  G01J1/0488 ,  G01J3/513

    Abstract: In accordance with an example embodiment of the present invention, an apparatus is provided, including a photodetecting structure with one or more photon sensing layers of graphene; and an integrated graphene field effect transistor configured to function as a pre-amplifier for the photodetecting structure, where the graphene field effect transistor is vertically integrated to the photodetecting structure.

    COLOR DETECTOR HAVING AREA SCALED PHOTODETECTORS
    117.
    发明公开
    COLOR DETECTOR HAVING AREA SCALED PHOTODETECTORS 审中-公开
    与地域的比例光电检测色标检测器

    公开(公告)号：EP2243011A4

    公开(公告)日：2013-12-18

    申请号：EP08729745

    申请日：2008-02-13

    Applicant: HEWLETT PACKARD CO

    Inventor： CLARK STEPHAN ,  VANBROCKLIN ANDREW ,  DAHLGREN BRETT

    IPC: G01J3/50 ,  G01J3/51 ,  G01N21/27

    CPC classification number: G01J3/26 ,  G01J3/2803 ,  G01J3/51 ,  G01J3/513

    Abstract: A color detector includes a light source, a first filter, and a first photodetector. The light source generates light within a spectrum of wavelengths. The first filter is in optical communication with the light source and is configured to pass light within a first predetermined spectrum of wavelengths. The first photodetector is in optical communication with the first filter and is configured to output a first color signal if light passes through the first filter. The photodetector has an area configured to equalize the first color signal and maximize a signal-to-noise ratio of the first color signal.

    COLOR DETECTOR
    118.
    发明公开
    COLOR DETECTOR 审中-公开
    色标检测器

    公开(公告)号：EP2243009A4

    公开(公告)日：2013-11-20

    申请号：EP08729654

    申请日：2008-02-12

    Applicant: HEWLETT PACKARD DEVELOPMENT CO

    Inventor： CLARK STEPHAN ,  MONROE MICHAEL ,  VALENCIA MELINDA ,  KEARL DANIEL

    IPC: G01J3/46 ,  G01J3/26 ,  G02B5/28 ,  H01L27/146 ,  H01L31/0216

    CPC classification number: G01J3/51 ,  G01J3/26 ,  G01J3/513 ,  G02B5/284 ,  H01L31/02162 ,  Y10T428/23

    Abstract: A color detector includes a light source, a photodiode, and a filter tuned to only allow light of a specific color to pass through to the photodiode. When the light reaches the photodiode, the photodiode outputs a current that indicates that the color is present in the light. The filter may include a pair of partially reflective layers consisting of a reflective metal, such as silver. To prevent the metal from oxidizing or reacting with the environment, the partially reflective layers may be coated with a protective layer, such as aluminum nitride. The color detector may further include a color enhancing layer. Finally, the color detector may include a capping layer. Accordingly, the color detector provided herein allows for the filter to use metals for partially reflective layers that would normally oxidize, as well as detect light of a specific spectrum of wavelengths.

    OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME
    119.
    发明公开
    OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME 审中-公开
    优化系统FÜRMESSUNGEN SOWIE LEUCHTKRAFTKOLORIMETER UND KOLORIMETER DAMIT

    公开(公告)号：EP2562520A1

    公开(公告)日：2013-02-27

    申请号：EP11771704.1

    申请日：2011-03-15

    Applicant: Konica Minolta Optics, Inc.

    Inventor： TSURUTANI, Katsutoshi

    IPC: G01J3/51

    CPC classification number: G01J3/51 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0216 ,  G01J3/0218 ,  G01J3/506 ,  G01J3/513

    Abstract: In a measuring probe 40, a measuring beam is diffused by a first diffusion plate 19, and when received by a plurality of light-receiving sensors 13B, 14B, 15B via a plurality of interference filters 13A, 14A, 15B, the measuring beam is made incident on the interference filters 13A, 14A, 15B via second diffusion plates 13C, 14C, 15C. Those interference filters 13A, 14A, 15B are formed such that transmittance characteristics corresponding to a measurement parameter are obtained correspondingly to intensity distribution conditions for an angle of incidence of light incident on the interference filters 13A, 14A, 15B. Therefore, the measuring probe 40 can reduce the effect of displacement of the transmission characteristic caused by the angle of incidence, while using the interference filters 13A, 14A, 15B.

    Abstract translation: 在测量探头40中，测量光束被第一扩散板19扩散，并且当多个受光传感器13B，14B，15B经由多个干涉滤光器13A，14A，15B接收时，测量光束为 通过第二扩散板13C，14C，15C入射到干涉滤光器13A，14A，15B上。 这些干涉滤光片13A，14A，15B形成为与入射到干涉滤光片13A，14A，15B上的光的入射角的强度分布条件对应地获得与测定参数对应的透射率特性。 因此，在使用干涉滤光片13A，14A，15B的同时，测量探头40可以减小由入射角引起的透射特性的位移的影响。

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