Abstract:
The invention relates to a spectrometer for analysing the optical emission of a sample by the pulsed excitation of an optical spectral emission, said spectrometer comprising an excitation source, a gap arrangement, at least one dispersive element, and detectors for the emitted spectrum. According to the invention, two beam paths are provided with two dispersive elements, the first dispersive element imaging the spectrum of the emission onto a number of spatially resolving detectors, and the second dispersive element imaging the spectrum of the emission onto a number of time-resolving detectors.
Abstract:
A system and a method for acquiring an image of a particle (120,122,124) flowing in a vessel (116), the system comprising a light source (102) for generating an illuminating light (108), an imaging probe (106) for laterally statically illuminating at least a portion of said vessel with the illuminating light, a detection unit (110) for detecting emitted light from an illuminated portion of said particle, and a processor unit (112) for reproducing an image of the illuminated portion of said particle from the emitted light.
Abstract:
A laser beam with a wavelength capable of exciting atoms of helium in the metastable state is directed to a generated plasma, and atoms in the metastable state are excited. Absorption amount information representing the amount of laser beam absorbed is acquired, and the density of atoms of helium in the metastable state in the plasma is computed from the absorption amount. The emissions of light from helium gas in the plasma caused by transition from two different excited states to the lower level are measured, and the ratio between the intensities of the emissions is determined. The electron temperature of the produced plasma is computed from the computed density of the atoms of helium gas in the metastable state and the computed emission intensity ratio. With this, the plasma electron temperature can be computed with a relatively high accuracy irrespective of the condition of the plasma atmosphere.
Abstract:
The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing contents of the elements of a liquid or gaseous sample, said method having the following steps of: A. recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration, B. recording the spectrum of the matrix solution with at least one dilution of the first concentration, C. regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions, D. calibrating the spectrometer, background correction using the values determined from the regression in step c and determining the calibration function c = f (I), E. recording the sample spectrum using at least one analyte which is contained therein, F. determining the concentration of the spectrally interfering components in the sample using the results obtained in step c. for wavelength positions at which there is no line of the analyte of the sample; and G. determining the sample signal which is characteristic of the analyte concentration by forming the difference between the spectrum from step e. and the calculated matrix spectrum with a dilution which was calculated in step f., wherein the calibration function c = f (I) is used.
Abstract:
The invention relates to an optical emission spectroscopy method for qualitatively and quantitatively analyzing samples involving excitation by laser (18) using a database created on monoelementary aqueous solutions all having the same concentration of a pure element, this database containing, for each element, wavelengths of emission lines and their respective intensity.
Abstract:
The present invention provides a method and apparatus for performing elemental analysis of a formation fluid downhole. The present invention provides elemental analysis of a formation fluid downhole using breakdown spectroscopy. In one aspect of the invention, a method and apparatus are provided for performing laser induced breakdown on a formation fluid sample is provided. In another aspect of the invention a method and apparatus are provided for performing spark induced breakdown spectroscopy. Plasma is induced in a fluid under test downhole. Emissions from the plasma are analyzed to determine the elemental composition of the fluid under test. Emissions include but are not limited to light in the ultraviolet, visible, and near infrared regions of the spectrum. A spectrometer is provided for elemental analysis of a fluid downhole. Elemental analysis yields information about the fluid and the formation from which the fluid originated.
Abstract:
An analyzer suitable for performing continuous gas analysis in ultra-high purity applications. The analyser combines a low-level emission source and a gaseous emission spectrometer (10) having a charge coupled device (CCD) diode array as a detector. The CCD detector replaces one or more photomultipliers and narrow bandpass filters typically used in spectrometers. The analyser performs various processing operations to evaluate and eliminate the effect of background light level, or dark spectrum.
Abstract:
The invention relates to a method for the spectral analysis of metallic samples, said method comprising the following steps: (a) a spectrum of an unknown sample with a number of preset excitation parameters is recorded; (b) the spectrum is compared with the stored spectra of a number of control samples; (c) the control samples are determined by the best concordance of the spectra; (d) the excitation parameters stored for the best successive control samples determined in step (c) are set; (e) the spectrum of the unknown sample with the excitation parameters set in step (d) is recorded; and (f) the intensity ratios of analysis lines stored for the control sample and internal standards of the spectrum recorded in step (e) are calculated.
Abstract:
An apparatus (10) for analyzing lubricant oils and functional fluids includes an optical emission spectrometer (OES) (26) having a substantially continuously valued wavelength versus intensity output (140). The OES (26) analyzes light captured from a spark emission stand (58) through which the fluid sample is flowed. An expert system (160-172) operates according to a set of Rules, and generates diagnostic text (174) for an operator based on the information about the fluid sample provided by the OES (26) and other measurement devices. The apparatus (10) is reduced in size, weight and cost.
Abstract:
An ionization chamber of an analytical apparatus (10) in which high concentration test sample ions are evaporated is provided with an ion introduction control means (8) to control the quantity of the test sample ions introduced to an ion attracting electrode (9). Therefore, an analytical apparatus can be provided that is capable of substantially simultaneous mass spectrometry and absorption, emission, and scattering spectroscopy. The apparatus also includes: a low temperature bath (106) which cools the test sample solution before it is introduced to the sprayer (104); and a cooling gas introduction tube (108), constructed separately from the sprayer, which cools the sprayer and the test sample solution introduced to the sprayer (104). The inclusion enables effective restriction of test sample heating upon high voltage application. Mass spectrometry and absorption, emission, and scattering spectroscopy can be substantially simultaneously carried out even when the test sample used is stable only at extremely low temperatures.