PLASMA ELECTRON TEMPERATURE MEASURING METHOD AND DEVICE
    143.
    发明公开
    PLASMA ELECTRON TEMPERATURE MEASURING METHOD AND DEVICE 审中-公开
    VERFAHREN UND VORRICHTUNG ZUR MESSUNG DER ELEKTRONENTEMPERATUR IN EINEM PLASMA

    公开(公告)号:EP2139300A1

    公开(公告)日:2009-12-30

    申请号:EP08738754.4

    申请日:2008-03-24

    Inventor: TAKIZAWA, Kazuki

    Abstract: A laser beam with a wavelength capable of exciting atoms of helium in the metastable state is directed to a generated plasma, and atoms in the metastable state are excited. Absorption amount information representing the amount of laser beam absorbed is acquired, and the density of atoms of helium in the metastable state in the plasma is computed from the absorption amount. The emissions of light from helium gas in the plasma caused by transition from two different excited states to the lower level are measured, and the ratio between the intensities of the emissions is determined. The electron temperature of the produced plasma is computed from the computed density of the atoms of helium gas in the metastable state and the computed emission intensity ratio. With this, the plasma electron temperature can be computed with a relatively high accuracy irrespective of the condition of the plasma atmosphere.

    Abstract translation: 具有能够激发亚稳态的氦原子的波长的激光束被引导到产生的等离子体,而亚稳态的原子被激发。 获取表示吸收的激光束的量的吸收量信息,根据吸收量计算等离子体中的亚稳态的氦原子的密度。 测量从两种不同的激发态转换到较低级的等离子体中由氦气引起的光的发射,确定发射强度之间的比例。 所产生的等离子体的电子温度是从亚稳态中氦气原子的计算密度和计算出的发射强度比计算的。 由此,与等离子体气氛的条件无关地,可以以相对高的精度计算等离子体电子温度。

    VERFAHREN ZUR KORREKTUR VON SPEKTRALEN STÖRUNGEN IN DER ICP EMISSIONSSPEKTROSKOPIE (OES)
    144.
    发明公开
    VERFAHREN ZUR KORREKTUR VON SPEKTRALEN STÖRUNGEN IN DER ICP EMISSIONSSPEKTROSKOPIE (OES) 审中-公开
    方法光谱的纠正措施干扰ICP发射光谱(OES)

    公开(公告)号:EP2030004A1

    公开(公告)日:2009-03-04

    申请号:EP06829133.5

    申请日:2006-11-27

    Inventor: NEITSCH, Lutz

    CPC classification number: G01J3/28 G01J3/443 G01N21/73

    Abstract: The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing contents of the elements of a liquid or gaseous sample, said method having the following steps of: A. recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration, B. recording the spectrum of the matrix solution with at least one dilution of the first concentration, C. regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions, D. calibrating the spectrometer, background correction using the values determined from the regression in step c and determining the calibration function c = f (I), E. recording the sample spectrum using at least one analyte which is contained therein, F. determining the concentration of the spectrally interfering components in the sample using the results obtained in step c. for wavelength positions at which there is no line of the analyte of the sample; and G. determining the sample signal which is characteristic of the analyte concentration by forming the difference between the spectrum from step e. and the calculated matrix spectrum with a dilution which was calculated in step f., wherein the calibration function c = f (I) is used.

    A METHOD AND APPARATUS FOR ELEMENTAL ANALYSIS OF A FLUID DOWNHOLE
    146.
    发明公开
    A METHOD AND APPARATUS FOR ELEMENTAL ANALYSIS OF A FLUID DOWNHOLE 有权
    方法和装置用于流体在孔元素分析

    公开(公告)号:EP1937937A2

    公开(公告)日:2008-07-02

    申请号:EP06815312.1

    申请日:2006-09-26

    Inventor: DIFOGGIO, Rocco

    Abstract: The present invention provides a method and apparatus for performing elemental analysis of a formation fluid downhole. The present invention provides elemental analysis of a formation fluid downhole using breakdown spectroscopy. In one aspect of the invention, a method and apparatus are provided for performing laser induced breakdown on a formation fluid sample is provided. In another aspect of the invention a method and apparatus are provided for performing spark induced breakdown spectroscopy. Plasma is induced in a fluid under test downhole. Emissions from the plasma are analyzed to determine the elemental composition of the fluid under test. Emissions include but are not limited to light in the ultraviolet, visible, and near infrared regions of the spectrum. A spectrometer is provided for elemental analysis of a fluid downhole. Elemental analysis yields information about the fluid and the formation from which the fluid originated.

    VERFAHREN ZUM BETRIEB EINES OPTISCHEN EMISSIONSSPEKTROMETERS
    148.
    发明公开
    VERFAHREN ZUM BETRIEB EINES OPTISCHEN EMISSIONSSPEKTROMETERS 审中-公开
    一种用于操作光发射光谱仪

    公开(公告)号:EP1839038A1

    公开(公告)日:2007-10-03

    申请号:EP05803479.4

    申请日:2005-11-04

    CPC classification number: G01J3/28 G01J3/20 G01J3/443 G01N21/67

    Abstract: The invention relates to a method for the spectral analysis of metallic samples, said method comprising the following steps: (a) a spectrum of an unknown sample with a number of preset excitation parameters is recorded; (b) the spectrum is compared with the stored spectra of a number of control samples; (c) the control samples are determined by the best concordance of the spectra; (d) the excitation parameters stored for the best successive control samples determined in step (c) are set; (e) the spectrum of the unknown sample with the excitation parameters set in step (d) is recorded; and (f) the intensity ratios of analysis lines stored for the control sample and internal standards of the spectrum recorded in step (e) are calculated.

    ANALYTICAL METHOD AND ANALYZER CAPABLE OF SUBSTANTIALLY SIMULTANEOUSLY ANALYZING ABSORPTION/EMISSION/SCATTERING SPECTRUM AND MASS SPECTRUM, AND ANALYTICAL METHOD AND MASS SPECTROSCOPE UTILIZING ELECTROSPRAY IONIZATION TECHNIQUE
    150.
    发明公开
    ANALYTICAL METHOD AND ANALYZER CAPABLE OF SUBSTANTIALLY SIMULTANEOUSLY ANALYZING ABSORPTION/EMISSION/SCATTERING SPECTRUM AND MASS SPECTRUM, AND ANALYTICAL METHOD AND MASS SPECTROSCOPE UTILIZING ELECTROSPRAY IONIZATION TECHNIQUE 审中-公开
    分析方法,并且基本上同时分析吸收/发射/散射光谱与质谱分析未受过训练的装置和分析方法与MASSESPEKTROSKOP,THE ELEKTROSPRAYIONISIERUNGSTECHNIK用途

    公开(公告)号:EP1724574A1

    公开(公告)日:2006-11-22

    申请号:EP05719442.5

    申请日:2005-02-23

    Abstract: An ionization chamber of an analytical apparatus (10) in which high concentration test sample ions are evaporated is provided with an ion introduction control means (8) to control the quantity of the test sample ions introduced to an ion attracting electrode (9). Therefore, an analytical apparatus can be provided that is capable of substantially simultaneous mass spectrometry and absorption, emission, and scattering spectroscopy. The apparatus also includes: a low temperature bath (106) which cools the test sample solution before it is introduced to the sprayer (104); and a cooling gas introduction tube (108), constructed separately from the sprayer, which cools the sprayer and the test sample solution introduced to the sprayer (104). The inclusion enables effective restriction of test sample heating upon high voltage application. Mass spectrometry and absorption, emission, and scattering spectroscopy can be substantially simultaneously carried out even when the test sample used is stable only at extremely low temperatures.

    Abstract translation: 在其中高浓度的测试样品离子的分析装置(10)的电离室蒸发是在离子导入控制装置设置有(8),以控制在离子引入到测试样品的离子的吸引量电极(9)。 因此,在分析装置中,可以确实能够基本上同时质谱和吸收,发射和散射光谱的。 因此,该装置包括:低温浴(106)之前被引入到喷雾器(104),其冷却所述测试样品溶液; 并且从喷雾器分开构造的冷却气体导入管(108),用于冷却喷雾器和测试样品溶液引入到喷雾器(104)。 包含允许在高电压施加测试样品加热的有效限制。 质谱和吸收,发射和散射光谱可以基本同时地执行,即使当所使用的测试样品是只在非常低的温度下是稳定的。

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