公开(公告)号：EP2341280A3

公开(公告)日：2013-06-19

申请号：EP10197165.3

申请日：2010-12-28

申请人： Omron Corporation

发明人： Murai, Hideyuki ,  Nishimori, Naoki ,  Sugiyama, Kosuke ,  Matsui, Akira ,  Homma, Kenjii ,  Ota, Jun ,  Nakada, Sayuki ,  Masuda, Rie

IPC分类号： F21V5/00 ,  G01N21/88 ,  F21Y105/00 ,  F21Y101/02

CPC分类号： F21V5/007 ,  F21Y2105/00 ,  F21Y2115/10 ,  G01N21/8806 ,  G01N2021/8816 ,  G01N2201/0626

摘要： An object of the invention is to provide an illumination device lineup having many variations that respond to various illumination visual fields and work distances while the cost is controlled. Another object of the invention is to provide a producing method for implementing the illumination device having the many variations. Each cell includes a light emitting element mounted on a board and a lens that is disposed so as to be paired with the light emitting element. A relative positional relationship between the light emitting element and the lens in each cell varies according to a position on the board. Therefore, light is emitted from the light emitting element to the outside with a non-zero angle that is determined in each cell with respect to a direction perpendicular to the board.

摘要翻译： 本发明的目的是提供一种具有许多变化的照明装置阵容，其响应于各种照明视野和工作距离，同时控制成本。 本发明的另一个目的是提供一种用于实现具有许多变化的照明装置的制造方法。 每个单元包括安装在板上的发光元件和设置成与发光元件配对的透镜。 每个单元中的发光元件和透镜之间的相对位置关系根据板上的位置而变化。 因此，以相对于与板垂直的方向在每个单元中确定的非零角度将光从发光元件发射到外部。

公开(公告)号：EP2391884A1

公开(公告)日：2011-12-07

申请号：EP09810743.6

申请日：2009-12-23

申请人： Carl Zeiss OIM GmbH

发明人： REIMANN, Joachim ,  HUSS, Volker ,  SCHÖLLKOPF, Volker ,  KNUPFER, Klaus-Georg

IPC分类号： G01N21/88 ,  G01N21/95 ,  G01N21/15

CPC分类号： G01N21/8806 ,  G01N21/15 ,  G01N21/9515 ,  G01N2021/151 ,  G01N2021/1772 ,  G01N2021/1774 ,  G01N2021/8812 ,  G01N2021/8816 ,  G01N2021/8835 ,  G01N2201/0245 ,  G01N2201/0614 ,  G01N2201/0626 ,  G01N2201/0634 ,  G01N2201/0694

摘要： The invention relates to a device for optically inspecting an at least partially reflecting surface of an item, having a first and at least one second crossbeam (12, 14) each forming a section (32) largely in the shape of a circular segment. The crossbeams (12, 14) are disposed at a longitudinal distance (D) from one another, defining a longitudinal axis (17). The two crossbeams (12, 14) are held at the longitudinal distance (D) by means of a plurality of longitudinal beams (16). The longitudinal beams (16) are disposed at a defined radial distance (38) from the sections (32) in the shape of circular segments. The crossbeams (12, 14) support a light-transparent diffusing screen (34) forming a tunnel-shaped inspection space (36). A plurality of light sources (48) are disposed outside of the tunnel-shaped inspection space (36) behind the diffusing screen, said sources being controllable individually or in small groups in order to generate variable light-dark patterns (90) on the diffusing screen. At least one camera (74, 78) is set up in the tunnel-shaped inspection space (36).

公开(公告)号：EP2341280A2

公开(公告)日：2011-07-06

申请号：EP10197165.3

申请日：2010-12-28

申请人： Omron Corporation

发明人： Murai, Hideyuki ,  Nishimori, Naoki ,  Sugiyama, Kosuke ,  Matsui, Akira ,  Homma, Kenjii ,  Ota, Jun ,  Nakada, Sayuki ,  Masuda, Rie

IPC分类号： F21V5/00 ,  F21Y105/00 ,  F21Y101/02

CPC分类号： F21V5/007 ,  F21Y2105/00 ,  F21Y2115/10 ,  G01N21/8806 ,  G01N2021/8816 ,  G01N2201/0626

摘要： An object of the invention is to provide an illumination device lineup having many variations that respond to various illumination visual fields and work distances while the cost is controlled. Another object of the invention is to provide a producing method for implementing the illumination device having the many variations. Each cell includes a light emitting element mounted on a board and a lens that is disposed so as to be paired with the light emitting element. A relative positional relationship between the light emitting element and the lens in each cell varies according to a position on the board. Therefore, light is emitted from the light emitting element to the outside with a non-zero angle that is determined in each cell with respect to a direction perpendicular to the board.

公开(公告)号：EP2280270A1

公开(公告)日：2011-02-02

申请号：EP10171195.0

申请日：2010-07-29

申请人： UTPVision S.r.l.

发明人： Finazzi, Roberto

IPC分类号： G01N21/88 ,  G01N21/95

CPC分类号： G01N21/8806 ,  G01N21/952 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/0626 ,  G01N2201/0627

摘要： An optical detection device of surface defects for detecting a surface or parting line imperfection of an O-ring (1) comprising a first green light source (2) directed at the object to be inspected (1) according to a first direction and a second red light source (3) directed at said object to be inspected (1) according to a second direction distinct from said first direction and colour video camera (6) adapted to film said O-ring to be inspected and to detect, directly or indirectly, the intensity of the chromatic components of the colours emitted by said light sources.

摘要翻译： 一种用于检测O形环（1）的表面或分型线缺陷的表面缺陷的光学检测装置，包括根据第一方向指向待检查对象（1）的第一绿色光源（2） 红色光源（3）根据与所述第一方向不同的第二方向指向要检查的物体（1），并且适于使所述待检查的所述O形环成像的彩色摄像机（6）直接或间接地检测 ，由所述光源发射的颜色的色彩分量的强度。

公开(公告)号：EP3353512A1

公开(公告)日：2018-08-01

申请号：EP16849666.9

申请日：2016-09-23

申请人： University of South Alabama

发明人： LEAVESLEY, Silas ,  RICH, Thomas

IPC分类号： G01J3/28 ,  G01N21/88 ,  G01N21/25

CPC分类号： G01J3/021 ,  G01J3/0218 ,  G01J3/10 ,  G01J3/28 ,  G01J3/2823 ,  G01N21/6456 ,  G01N21/8806 ,  G01N2021/6419 ,  G01N2021/6463 ,  G01N2021/6471 ,  G01N2021/6478 ,  G01N2021/8816

摘要： An illumination system incorporating a multi-faceted mirror in operative communication with an array of discrete illumination sources. The multi-faceted mirror may accept incident light beams from discrete illumination sources located at different positions and then deliver a reflected output to a common location for direct acceptance by an optical/imaging device or by a light guide transmission device operatively connected to a downstream optical/imaging device. Individual light sources may be selected and/or combined in a defined sequence by selectively activating and deactivating such light sources electronically with no need for moving parts. By pulsing different illumination sources, the optical/imaging system may be provided with a feed of narrow-band illumination for use in imaging. Outputs from several illumination sources can also be combined if desired to produce a custom-tuned illumination spectrum for a particular application.

公开(公告)号：EP3190401A4

公开(公告)日：2018-05-09

申请号：EP15838785

申请日：2015-04-28

申请人： SCREEN HOLDINGS CO LTD

发明人： NAGATA YASUSHI

IPC分类号： G01N21/88 ,  G01N21/95 ,  G01N21/956 ,  G06T7/00

CPC分类号： G01N21/95 ,  G01N21/88 ,  G01N21/8806 ,  G01N21/8851 ,  G01N21/95607 ,  G01N21/95684 ,  G01N2021/8816 ,  G01N2021/8867 ,  G01N2201/062 ,  G06T7/001 ,  G06T2207/10152

摘要： In an inspection apparatus, a plurality of light source parts (42, 43) for irradiating an object area on a surface of an object (9) with light from a plurality of directions, respectively, are provided, and a first picked-up image representing an object area is acquired in one image pickup part (32, 33) by light irradiation from one of the plurality of light source parts and a second picked-up image is acquired in the image pickup part by light irradiation from the plurality of light source parts. Further, a first defect candidate area is detected by comparing the first picked-up image with a first reference image corresponding to the first picked-up image and a second defect candidate area is detected by comparing the second picked-up image with a second reference image corresponding to the second picked-up image. Then, an overlapping area in the first defect candidate area and the second defect candidate area is specified as a defect area in the object area. It is thereby possible to detect a defect on the satin-finished surface of the object with high accuracy.

公开(公告)号：EP3315952A1

公开(公告)日：2018-05-02

申请号：EP16814396.4

申请日：2016-06-22

申请人： JFE Steel Corporation

发明人： ONO, Hiroaki ,  TATE, Masami ,  OSHIGE, Takahiko ,  KODAMA, Toshifumi ,  KOSHIHARA, Takahiro ,  OGAWA, Akihiro ,  IIZUKA, Yukinori

IPC分类号： G01N21/892

CPC分类号： G01N21/892 ,  G01N21/8806 ,  G01N21/952 ,  G01N2021/8816 ,  G01N2021/8918 ,  G01N2021/8924

摘要： A surface defect detection method according to the present invention is a method of optically detecting a surface defect of a steel product, and includes an irradiating step of irradiating illumination lights from different directions to an identical inspection target portion by using at least two distinguishable light sources; and a detecting step of acquiring images by reflection lights of the respective illumination lights and detecting a surface defect in the inspection target portion by performing difference processing between the acquired images. An incident angle of the illumination lights of the respective light sources are within a range of 60° to 82.5° relative to the inspection target portion.

摘要翻译： 根据本发明的表面缺陷检测方法是光学检测钢制品的表面缺陷的方法，并且包括照射步骤，该照射步骤通过使用至少两个可区分的光源将来自不同方向的照明光照射到相同的检查目标部分 ; 以及检测步骤，通过各个照明光的反射光获取图像，并且通过执行所获取的图像之间的差异处理来检测检查目标部分中的表面缺陷。 各个光源的照明光的入射角相对于检查目标部分在60°至82.5°的范围内。

公开(公告)号：EP3315951A1

公开(公告)日：2018-05-02

申请号：EP16814392.3

申请日：2016-06-22

申请人： JFE Steel Corporation

发明人： TATE, Masami ,  ONO, Hiroaki ,  OSHIGE, Takahiko

IPC分类号： G01N21/892 ,  G01N21/952

CPC分类号： G01N21/952 ,  G01N21/8806 ,  G01N21/892 ,  G01N2021/8816 ,  G01N2021/8918 ,  G01N2021/8924

摘要： First illumination light and second illumination light that are distinguishable from each other are each applied to an inspection target part of a surface of a steel material with substantially the same incident angle from directions inclined opposite to each other. A first image of the inspection target part illuminated with first illumination light and a second image of the inspection target part illuminated with second illumination light are each captured. A difference image between the first image and second image is generated. A combination of a bright part and a dark part of a protruding part in the inspection target part is removed from among bright parts and dark parts of the difference image based on an arrangement of a bright part and a dark part in a predetermined direction corresponding to the irradiation direction of the first or second illumination light. The presence or absence of a recessed part in the inspection target part is determined based on a shape feature amount of the remainder of the bright parts and the dark parts after this removal processing or an arrangement of the remainder of the bright parts and the dark parts in the predetermined direction. The recessed part that has been determined to be present is detected as a surface defect of the steel material.

摘要翻译： 彼此可区分的第一照明光和第二照明光各自以彼此相反倾斜的方向以基本相同的入射角施加到钢材表面的检查目标部分。 用第一照明光照明的检查目标部分的第一图像和用第二照明光照射的检查目标部分的第二图像各自被捕获。 生成第一图像和第二图像之间的差异图像。 基于明亮部分和暗部分在与预定方向相对应的预定方向上的排列，从差异图像的亮部分和暗部分中去除检查目标部分中的凸出部分的亮部分和暗部分的组合 第一或第二照明光的照射方向。 基于在该去除处理之后亮部分和暗部分的其余部分的形状特征量或者亮部分和暗部分的其余部分的布置来确定检查目标部分中凹部的存在或不存在 在预定的方向上。 检测出判定为存在的凹部作为钢材的表面缺陷。

公开(公告)号：EP2564111A4

公开(公告)日：2017-08-30

申请号：EP11774522

申请日：2011-04-28

申请人： KLA-TENCOR CORP

发明人： HILL ANDY

IPC分类号： F21S2/00 ,  F21V5/00 ,  F21V8/00 ,  F21V29/00 ,  F21W131/406 ,  F21Y115/10 ,  G01N21/88 ,  G02B21/08 ,  G02B21/10 ,  G02B27/09

CPC分类号： G02B21/084 ,  F21W2131/406 ,  F21Y2115/10 ,  G01N21/8806 ,  G01N2021/8816 ,  G01N2021/8822 ,  G01N2201/0631 ,  G01N2201/0638 ,  G02B21/10 ,  G02B27/0927

摘要： A ring light illuminator with annularly arranged light sources is disclosed. To each light source there corresponds a beam shaper comprising a light collector, a homogenizing means for light from the light source, and an imaging means for imaging an output of the homogenizing means into an area to be illuminated. The homogenizing means in embodiments is a rod, into which light from the light collector is directed. The end of the rod opposite the light collector is imaged by the imaging means into the area to be illuminated.

摘要翻译： 公开了具有环形布置的光源的环形灯照明器。 对于每个光源，对应于包括光收集器，用于来自光源的光的均化装置以及用于将均化装置的输出成像到要被照明的区域的成像装置的光束整形器。 实施例中的均化装置是棒，来自光收集器的光被引导到该棒中。 杆的与集光器相对的端部通过成像装置成像到待照亮的区域中。

公开(公告)号：EP2798337A1

公开(公告)日：2014-11-05

申请号：EP11878545.0

申请日：2011-12-31

申请人： Saint-Gobain Glass France

发明人： GUO, Xiaofeng ,  LI, Huifen ,  LIN, Xiaofeng ,  SUN, Xiaowei ,  DENG, Wenhua

IPC分类号： G01N21/958 ,  G01N21/896

CPC分类号： G01N21/8806 ,  F21K9/27 ,  F21Y2103/10 ,  F21Y2115/10 ,  G01N21/896 ,  G01N21/958 ,  G01N2021/8816 ,  G01N2201/0633 ,  G01N2201/105

摘要： This invention relates to illumination device for providing near isotropic illumination, and particularly to an illumination system for detecting the defect in a transparent substrate and a detection system comprising the same. According to an embodiment of the invention, an illumination system is provided, which comprises: an illumination system for detecting the defect in a transparent substrate, comprising light source receptacle in bar shape; a plurality of first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and a plurality of second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle, wherein the first line of spot light sources and the second line of spot light sources are substantially arranged in a line, the first line of spot light sources and the second line of spot light sources locate in difference half of the receptacle in the longitudinal direction, the first light and the second light converge to a scan line, and the projections of the first and the second lights, which are converged at each point on the scan line, in a plane P passing the scan line and perpendicular to the transparent substrate are located at different sides of a line in the plane P, which passes the point and is perpendicular to the scan line.