摘要:
Embodiments of the present invention may provide an analog-to-digital converter (ADC) system. The ADC system may include an analog circuit to receive an input signal and a reference voltage, and to convert the input signal into a raw digital output. The analog circuit may include at least one sampling element to sample the input signal during a sampling phase and reused to connect to the reference voltage during a conversion phase, and an ADC output to output the raw digital output. The ADC system may also include a digital processor to receive the raw digital output and for each clock cycle, to digitally correct reference voltage errors in the analog-to-digital conversion.
摘要:
An analog to digital converter apparatus arranged to convert a plurality C (= 4) of different input signals to digital representations therof. The apparatus comprises a multiplexer arranged sequentially to couple each of the 4 input signals to a fast a-to-d converter (such as a successive approximations converter) at a rate such that each input signal is coupled N (= 8) times in a period M (= 20m secs) of an a.c. series mode interfacing signal (at 50 Hz) and at equal time intervals M/N (20/8 = 2.5m secs). The N (= 8) digital values of each input signal are averaged to provide at the end of a conversion period a digital value for each of the 4 input signals (C) which is the mean magnitude of the signal during the 20m sec period (M).
摘要:
An A/D converter comprising conversion means (51) for converting an analog voltage to an analog current, current means (54) for producing a plurality of weighted values of currents, combining means (56) for selectively combining the weighted values of currents, detection means (52, 55, 63, 68) for detecting difference in current value between the analog current and the combined current by the combining means (56), a differential amplifier (CMP) having a pair of inputs (SUM, BIAS), one (SUM) of which is supplied with a signal corresponding to the detected difference value, said detection means (52, 55, 63, 68) comprise first and second current mirror circuits (52, 55) input means (53, Q17, R10) responsive to said analog signal for applying an analog current having a value proportional to said analog signal to said input terminal of said first current mirror circuit (52), means (62) for connecting the output terminal of said first current mirror circuit (52) to the input terminal of said second current mirror circuit (55), and means for applying a reference signal to the output terminal of said second current mirror circuit (55). Preferably there are switch means (Q16) arranged between the pair or inputs (SUM, BIAS) of the differential amplifier (CMP), and control means (CK,59) for controlling the switch means (Q 16), wherein the switch means (Q16) is periodically made conductive to delete potential difference between the pair of inputs (SUM, BIAS) through the A/D conversion operation.
摘要:
Der Erfindung liegt die Aufgabe zugrunde, den genannten Nullpunktabgleich so vorzunehmen, daß Langzeiteffekte berücksichtigt werden können. Erfindungsgemäß geschieht dies unter Verwendung eines an einen ersten Eingang des Vergleichers K angeschlossenen Nullabgleichkondensators CAZK, der zu Beginn der Abgleichphase, in der an beide Vergleichereingänge der Spannungswert Null gelegt ist, über ein Rückkopplungsnetzwerk RN mit den Vergleicherausgang in Verbindung gebracht wird, über das er in einen Ladungszustand versetzt wird, bei dem das Ausgangssignal des Vergleichers an der Entscheidungsschwelle zwischen den Gleichheit bzw. Ungleichheit der an den Vergleichereingängen anliegenden Analogwerten anzeigenden Ausgangssignalzuständen gelangt.
摘要:
A digital output capacitive transducer wherein two capacitors (C u, C u) are used, one (C u) providing a reference current and the other providing a varying signal current. The signal current is obtained from an oscillator (10) through a capacitor (C u), which varies in capacitance as a function of the parameter to be measured. The reference current offsets the signal current to attain a known relationship between the sampled parameter and the signal current. The circuit has a small number of components and operates on a relatively low voltage with an accurate digital output.
摘要:
A multi-stage comparator includes a first stage circuit, a second stage circuit, and a control circuit. The first stage circuit receives an input signal of the multi-stage comparator, generates a first-stage output signal according to the input signal, and outputs the first-stage output signal at an output port of the first stage circuit. The second stage circuit receives a second-stage input signal at an input port of the second stage circuit, and performs a second-stage operation to generate an output signal of the multi-stage comparator. The control circuit is coupled between the output port of the first stage circuit and the input port of the second stage circuit, and controls a start time of the second-stage operation.
摘要:
An interleaving successive approximation analog-to-digital converter (SAR ADC) with noise shaping having a first SAR block, a second SAR block, and a noise-shaping circuit is provided. The first and second SAR blocks take turns to sample an input voltage for successive approximation of the input voltage and observation of a digital representation of the input voltage. The noise-shaping circuit receives a first residue voltage from the first SAR block and receives a second residue voltage from the second SAR block alternately, and outputs a noise-shaping signal to be fed into the first SAR block and the second SAR block.
摘要:
The present invention relates to an Input circuit for a dynamic comparator comprising a positive and a negative branch, each branch comprising a transistor (T 1_n , T 1_p ) arranged for receiving an input voltage (V in,p , V in,n ) at its gate terminal and a first fixed voltage (V 1 ) at its drain terminal (D ip , D in ) via a first switch (SW 1n , SW 1p ) characterised in that the source terminal of said transistor in each of the positive and negative branch is connectable via a second switch (SW 2n , SW 2p ) to a first plate (S ip , S in ) of a first capacitor (C Sp ) in the positive branch and of a second capacitor (C Sn ) in the negative branch, respectively, with a second plate of the first capacitor and of the second capacitor being connected to a second fixed voltage (V 2p , V 2n ) and said input circuit further being arranged for receiving a first reset voltage (V hp ) on the first plate of the first capacitor in the positive branch and a second reset voltage (V hn ) on the first plate of the second capacitor in the negative branch, said first and second reset voltage being independent of each other.
摘要:
The present invention provides asynchronous successive approximation register analog-to-digital converter (ASAR ADC) circuits and signal conversion method thereof. An exemplary ASAR AC circuit includes a sample/hold circuit configured to input a first analog signal and output a second analog signal; a digital-to-analog converter circuit configured to output a third analog signal; a first voltage comparison circuit configured to respond to a valid level of a latch signal, and output a first logic level and a second logic level; a first logic circuit configured to respond to a valid level of a flag signal, and identify a comparison result of the first voltage comparison circuit and output the first digit signal; and a pulse generation circuit configured to generate the latch signal and the flag signal with a generation time of the valid levels independently from the first logic level and the second logic level.
摘要:
This disclosure describes techniques and methodologies of using passive continuous time (CT) delay line for high-speed CT analog-to-digital converter (ADC) applications. In a continuous-time residual producing stage common to these CT ADCs, a proper delay between the analog input and DAC output is crucial. Specifically, using an inductor-capacitor (LC) lattice based delay element to enable high-performance CT pipeline ADC and CT delta-sigma (ΔΣ) ADC. The use of an LC lattice based delay element provides wide-band group delay for continuous-time signals with well-controlled impedance. This will be an essential circuit component to build a high-performance CT ADCs especially in architectures where the generation of a low-noise and low-distortion residual between the CT signal and its digitized version is needed. LC lattice based delay element enables noise-free, distortion-free wideband delay that is required for high speed continuous-time pipeline ADC and delta-sigma ADC.