SYSTEM AND APPARATUS FOR ANALYSIS OF A GUAYULE PLANT IN SITU& xA;
    42.
    发明公开
    SYSTEM AND APPARATUS FOR ANALYSIS OF A GUAYULE PLANT IN SITU& xA; 审中-公开
    系统和设备分析GUAYULENPFLANZE原位

    公开(公告)号:EP2861967A1

    公开(公告)日:2015-04-22

    申请号:EP13787995.3

    申请日:2013-05-07

    Inventor: FRALEY, Michael

    Abstract: A system and method for in-field near infrared spectroscopy (NIRS) analysis of rubber and resin concentrations a guayule plant is provided. The system includes a wagon or other vehicle with the NIRS device mounted on the wagon. A computer or processor electrically coupled to the NIRS device is also housed within an area or extension of the wagon. During measurement of a guayule plant in the field, a guayule plant covering is placed over the guayule plant and a light shield coupled to the NIRS device is inserted into an opening on the guayule plant covering. The NIRS device is configured to perform a reading of the guayule plant within the plant covering and communicate results of the reading to the computer. A calibration equation is then preferably applied to the guayule plant readings to produce the rubber and resin concentrations of the guayule plant.

    VERFAHREN ZUR DETEKTION VERGRABENER SCHICHTEN
    43.
    发明公开
    VERFAHREN ZUR DETEKTION VERGRABENER SCHICHTEN 审中-公开
    检测方法的埋层

    公开(公告)号:EP2831570A1

    公开(公告)日:2015-02-04

    申请号:EP13713769.1

    申请日:2013-03-18

    Abstract: An arrangement for optically detecting buried layers of flat objects (10) having a plurality of layers, in particular wafers, containing a radiation source (14) for illuminating the surface (12) of the object at an angle (a); a polarization filter (24) arranged in the beam path; and a detector (22) for detecting radiation reflected by the surface of the object or transmitted by the object; is characterized in that that layer of the object which is closest to the radiation source at least partially transmits the radiation from the radiation source; the polarization filter transmits only radiation which is polarized parallel to the plane of incidence; and the surface of the object is illuminated at the Brewster angle. The surface of the object is preferably illuminated with unpolarized radiation and the polarization filter is arranged in the beam path between the surface of the object and the detector.

    FLUORESCENCE OBSERVATION METHOD AND FLUORESCENCE OBSERVATION APPARATUS
    44.
    发明公开
    FLUORESCENCE OBSERVATION METHOD AND FLUORESCENCE OBSERVATION APPARATUS 有权
    FLUORESZENZBEOBACHTUNGSVERFAHREN

    公开(公告)号:EP2831567A1

    公开(公告)日:2015-02-04

    申请号:EP13719187.0

    申请日:2013-03-25

    Abstract: A fluorescence observation method in which it is possible to observe plural types of fluorescence emitted from plural kinds of fluorescent molecules simultaneously without the necessity of plural kinds of exciting wavelengths and with a simple optical structure, an observed object for which a fluorescent molecule is used as a fluorescent label suffers little damage, and it is possible to use glass that is in common use as an optical material used for fluorescence observation, and a fluorescence observation apparatus are offered. A fluorescence observation method of the present invention for detecting plural types of fluorescence emitted from two or more kinds of fluorescent molecules includes: subjecting each of the two or more kinds of fluorescent molecules to multi-photon excitation by exciting light having an exciting wavelength equal to or shorter than 700nm in a visible region, to generate fluorescence upon making use of an absorption wavelength band in a deep ultraviolet region of each of the two or more kinds of fluorescent molecules; and simultaneously detecting plural types of fluorescence generated on a shorter-wavelength side or on both of the shorter-wavelength side and a longer-wavelength side of the exciting wavelength of the exciting light.

    Abstract translation: 本发明的用于检测从两种或更多种荧光分子发射的多种荧光的荧光观察方法包括:通过激发具有等于或等于的激发波长的光来使两种或更多种荧光分子中的每一种发生多光子激发 或在可见光区域中短于700nm,在使用两种或更多种荧光分子的深紫外区域中的吸收波长带产生荧光; 并且同时检测在激发光的激发波长的短波长侧或短波长侧和长波长侧的两端产生的多种荧光。

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