摘要:
In one implementation, an integrated group III-V power stage (100) includes a control switch (108) including a first group III-V transistor coupled to a sync switch (106) including a second group III-V transistor. The integrated group III-V power stage may also include one or more driver stages (104), which may be fabricated in a group III-V die or dies. The driver stage or driver stages, the control switch, and the sync switch may all be situated in a single semiconductor package (101).
摘要:
There are disclosed herein various implementations of composite semiconductor devices. In one implementation, such a composite semiconductor device includes a semiconductor on insulator (SOI) substrate including a diode and an insulator layer. The composite semiconductor device also includes a transition body formed over the diode, and a transistor formed over the transition body. The diode is connected across the transistor using through-semiconductor vias, external electrical connectors, or a combination of the two.
摘要:
According to an exemplary implementation, a transistor includes a plurality of drain fingers interdigitated with a plurality of source fingers. The transistor further includes a gate configured to control current conduction between the plurality of drain fingers and the plurality of source fingers. Additionally, the transistor includes a plurality of drain fuses, each being configured to electrically disconnect a drain finger of the plurality of drain fingers from remaining ones of the plurality of drain fingers. At least one of the plurality of drain fuses can electrically couple the drain finger to a common drain pad. The transistor may further include a plurality of source fuses, each being configured to electrically disconnect a source finger of the plurality of source fingers from remaining ones of the plurality of source fingers.
摘要:
There are disclosed herein various implementations of a monolithically integrated high side block. Such a monolithically integrated high side block includes a level shifter, a high side driver coupled to the level shifter, and a high side power switch coupled to the high side driver. The high side power switch is monolithically integrated with the high side driver and the level shifter on a common die. Each of the level shifter, the high side driver, and the high side power switch includes at least one group III-V device.
摘要:
There are disclosed herein various implementations of a group III-V power conversion circuit including a monolithcially integrated half bridge having a depletion mode III-Nitride field-effect transistor (FET), and a normally OFF composite cascoded switch including a depletion mode III-Nitride FET and an enhancement mode group IV FET. In one exemplary implementation, the monolithcally integrated half bridge includes a high side depletion mode III-Nitride FET having an enable switch coupled in the conduction path of the high side depletion mode III-Nitride FET.
摘要:
In one implementation, an integrated group III-V power stage (100) includes a control switch (108) including a first group III-V transistor coupled to a sync switch (106) including a second group III-V transistor. The integrated group III-V power stage may also include one or more driver stages (104), which may be fabricated in a group III-V die or dies. The driver stage or driver stages, the control switch, and the sync switch may all be situated in a single semiconductor package (101).
摘要:
There are disclosed herein various implementations of a transistor having an increased breakdown voltage. Such a transistor includes a source finger electrode having a source finger electrode beginning and a source finger electrode end. The transistor also includes a drain finger electrode with a curved drain finger electrode end having an increased radius of curvature. The resulting decreased electric field at the curved drain finger electrode end allows for an increased breakdown voltage and a more robust and reliable transistor. In some implementations, the curved drain finger electrode end may be extended beyond the source finger electrode beginning to achieve the increased breakdown voltage.
摘要:
There are disclosed herein various implementations of nested composite diodes. In one implementation, a nested composite diode includes a primary transistor coupled to a composite diode. The composite diode includes a low voltage (LV) diode cascoded with an intermediate transistor having a breakdown voltage greater than the LV diode and less than the primary transistor. In one implementation, the primary transistor may be a group III-V transistor and the LV diode may be an LV group IV diode.
摘要:
There are disclosed herein various implementations of semiconductor structures including III-Nitride interlayer modules. One exemplary implementation comprises a substrate and a first transition body over the substrate. The first transition body has a first lattice parameter at a first surface and a second lattice parameter at a second surface opposite the first surface. The exemplary implementation further comprises a second transition body, such as a transition module, having a smaller lattice parameter at a lower surface overlying the second surface of the first transition body and a larger lattice parameter at an upper surface of the second transition body, as well as a III-Nitride semiconductor layer over the second transition body. The second transition body may consist of two or more transition modules, and each transition module may include two or more interlayers. The first and second transition bodies reduce strain for the semiconductor structure.