摘要:
A scanning probe microscope includes a cantilever 12 having a probe 11 at a free thereof, a displacement detection unit 15 to output a displacement signal of the cantilever 12, a vibrating unit 14 to vibrate the cantilever 12, and a scanning unit 20 to three-dimensionally relatively move the sample 19 and probe 11. A mixed signal generation unit 30 includes an amplitude information detecting section 31 to provide a vibrating signal to the vibrating unit 14 and generate an amplitude signal including information of an amplitude of the displacement signal, and a phase difference information detecting section 32 to generate a phase signal including information of a phase difference between the displacement signal and the synchronous signal, and adds the displacement signal and the synchronous signal to generate a mixed signal. A controller 25 to control the scanning unit 20 includes a Z control section 26, which controls the distance between the sample 19 and the probe 11 on the basis of the mixed signal.
摘要:
Provided is a sealed atomic force microscope (AFM) cell in which measurement accuracy does not decrease and the types of observation liquids are not limited. A sealed AFM cell (100) according to the present invention includes: a cantilever (120) including a probe; a sample holder (132) for fixing the sample; a scanner (134) for moving the sample holder (132); a lid part (122) which holds the cantilever (120) so as to position the probe near a measurement surface of the sample; and a main body part (136) which is a component for holding the scanner (134) and positioned opposite the lid part (122) with the sample in between, in which the lid part (122) and the main body part (136) are joined via a sealing liquid to seal the observation liquid inside a space formed by the lid part (122), the main body part (136), and the sealing liquid, the sealing liquid being different from the observation liquid and not in contact with the observation liquid.
摘要:
The present invention relates to a microscope having a multimode local probe comprising: a resonator (1); a first electrode (9) and a second electrode (8); an excitation source suitable for generating mechanical resonance in the resonator; a metal tip (4) attached to the resonator; means allowing relative movement between the local probe and a sample, which can move the end of the tip so that it is at a distance Z between 0 and 100 nm from the sample; and means for detecting at least one electrical signal representing shear forces on the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said second output electrode (9), and the microscopy apparatus comprises means for amplifying and filtering the signals relative to the shear forces and to the tunneling current in a single electronic circuit; and means for controlling the distance Z between the end of the tip and the surface of the sample.
摘要:
The present disclosure provides a procedure to obtain the absorption profiles of molecular resonance with ANSOM. The method includes setting a reference field phase to phi=0.5 pi relative to the near-field field, and reference amplitude A>=5|alphaeff|. The requirement on phase precision is found to be
摘要:
A potential measurement device (100) according to the present invention includes: an electrode (104); a displacement measurement unit (212) which outputs a voltage corresponding to an electrostatic force between the electrode and the sample; a first alternating-current power supply (101) which applies a first alternating-current voltage between the electrode and the sample; a second alternating-current power supply (102) which adds, to the first alternating-current voltage, a second alternating-current voltage having a frequency different from a frequency of the first alternating-current voltage, and applies the added voltage; and a signal detection unit (218) which outputs a magnitude of a particular frequency component contained in the output from the displacement measurement unit, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit which calculates potential, (i) a magnitude and a phase of a frequency component of a frequency identical to the frequency of the first alternating-current voltage and (ii) a magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequency of the first alternating-current voltage and the frequency of the second alternating-current voltage, so that the potential measurement device measures the surface potential of the sample.
摘要:
The method relates to a method of scanning a sample. Scanning a sample is typically done by scanning the sample with a probe along a multitude of parallel lines. In prior art scan methods a sample is scanned multiple times with a nominally identical scan pattern. The invention is based on the insight that the coherence between adjacent points in a direction along the scan direction is much better than the coherence of adjacent points perpendicular to the scan direction. By combining two images that are scanned perpendicular to each other, it should thus be possible to form an image making use of the improved coherence (due to shorter temporal distance) in both directions. The method thus involves scanning the sample with two scan patterns, the lines of one scan pattern preferably perpendicular to the lines of the other scan pattern. Hereby it is possible to use the temporal coherence of scan points on a line of one scan pattern to align the lines of the other scan pattern, and vice versa.
摘要:
A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
摘要:
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently "perfect" in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.