摘要:
The present invention relates to an apparatus for forming a pattern on a radiation sensitive material comprising a source to form a radiation beam, a scanning element to scan at least one beam from said radiation source over said radiation sensitive material, a modulator to modulate said at least one beam during scanning according to an input pattern data file, where said modulation of the beam creates a coherent sub-image on the workpiece and several sub-images are non-coherently superposed to create a final image. The invention also relates to a method of patterning a workpiece and a workpiece as such.
摘要:
The invention concerns a device (10) for generating an output radiation through an output aperture (5), said device (10) comprising a plurality of radiation sources (11-14) and a temporal multiplexer (15) for temporally- multiplexing the radiation sources (11-14). Each radiation source comprises a plasma (211) in which an elementary radiation is generated and in which rays of this elementary radiation are selectively deviated as a function of their wavelength. Such sources have a small size and a small etendue. The device can comprise for example one hundred or more radiation sources. Each radiation source can be used to generate a dynamically modified radiation pattern (24, 25, 26), or as a reserve source that replaces a broken down source, or as a supportive source that generates a radiation only if the power of the output radiation is lower than a minimum threshold value. The invention also relates to a process implemented by said device, and to a photolithography apparatus comprising said device.
摘要:
The present invention relates to an exposure equipment and an exposure method that generates pulsed light by producing plasma from a target material to carry out exposure with the pulsed light and aims at obtaining a high degree of uniformity in the quantity of exposure light even when the pulsed light generated by producing plasma from the target material is used for a light source of exposure. The exposure equipment is characterized by having a light emitting portion that generates the pulsed light by producing plasma from the target material supplied intermittently, a reticle stage on which a reticle is arranged and irradiated with the pulsed light, a photosensitive substrate stage on which a photosensitive substrate irradiated with the pulsed light is arranged, the pulsed light being patterned by the reticle, and a control portion that controls the photosensitive substrate stage so that, before exposure onto the photosensitive substrate is started, the exposure starting point or the exposure ending point and the light emission timing coincide with each other based on the drive timing of the photosensitive substrate stage and the light emission timing of the pulsed light.
摘要:
A method for exposing a polymer or other substrate (S) to patterned illumination from a pulsed laser source (12) at a suitable energy density in order to cause ablation of the surface to form a dense, regular array of 2-D or 3-D microstructures, characterised by the steps of: locating a mask (13) containing a series of identical or different features on a fixed pitch relative to a target area (14) of the substrate (S); projecting a uniform laser beam (18) through the mask (13) in order to project an image made up of a multiplicity of the features of the mask (13) onto the target area (14), de-magnifying the image carried by the beam (18) between the mask (13) and the target area (14); locating a substrate (S) for ablation in the target area (14); moving the substrate (S), at least while in the target area, in a first direction (Dl) parallel to one axis of the projected array of microstructures and also in a second direction (D2) perpendicular to the first direction; and controlling (20) the firing of the pulsed laser (12) in relation to the exact position of the substrate (S) in the target area (14). The invention further comprises a unit for ablating the surface of a polymer or other substrate (S) to form a dense, regular array of 2D or 3D microstructures by patterned illumination comprising: a pulsable laser source (12); a mask (13) containing a series of identical or different features on a fixed pitch and disposed between the laser source (12) and a target area (14); an illumination system (15) for creating a uniform laser beam (16) that exposes a multiplicity of the features on the mask (13) and disposed between the laser source (12) and the mask (13); an optical projection system (17) to de-magnify the mask image onto the target area (12) and disposed between the mask (13) and the target area (12); a 2- axis stage system (19) for the substrate (s) adapted to move the substrate (S) in the target area (14) in a first direction parallel to one axis of the regular array of microstructures and also in a second direction perpendicular to the first direction; and a control system (20) that links the firing of the pulsed laser (12) to the exact position of the substrate (S) in the target area (14).
摘要:
Apparatus and methods for compensating for the movement of a substrate (W) in a lithographic apparatus during a pulse of radiation include providing a pivotable mirror (10) configured to move a patterned radiation beam incident on the substrate in substantial synchronism with the substrate.
摘要:
A system and method provides high speed variable attenuators. The attenuators can be used within a lithographic apparatus to control intensity of radiation in one or more correction pulses used to correct a dose of the radiation following an initial pulse of radiation.
摘要:
The present invention relates to a method to improve at least one feature edge steepness in an image to be exposed onto a moving workpiece, comprising the actions of: moving the image in essentially the same direction relative to the direction of movement of the workpiece, synchronizing said moving of the image with a pulse length of an exposure radiation source. The invention also relates to a pattern generator for creating patterns on a workpiece
摘要:
Apparatus and methods for compensating for the movement of a substrate (W) in a lithographic apparatus during a pulse of radiation include providing a pivotable mirror (10) configured to move a patterned radiation beam incident on the substrate in substantial synchronism with the substrate.