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公开(公告)号：EP2208044A2
公开(公告)日：2010-07-21
申请号：EP08850238.0
申请日：2008-11-07
摘要： The invention relates to a method for examining a sample using a scanning tunneling microscope, characterised in that in at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact on taking an image, a contrast agent is applied before or during the image taking, whilst the temperature at said location is adjusted to be at or below the condensation temperature of the contrast agent. A corresponding scanning tunneling microscope is also disclosed.
摘要翻译： 公开了一种使用扫描隧道显微镜检查样品的方法，其中在图像记录之前或期间，将造影剂施加到扫描隧道显微镜的尖端上和/或样品上的至少一个位置，该样品是作为 图像记录期间的隧道接触，而在该位置处设定小于或等于造影剂的冷凝温度的温度。 公开了一种相应的扫描隧道显微镜。
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公开(公告)号：EP1966586A1
公开(公告)日：2008-09-10
申请号：EP06847091.3
申请日：2006-12-20
CPC分类号： G01Q60/12
摘要： The present invention relates to an indirect-gap semiconductor substrate, the gap being greater than that of silicon and preferably greater than 1.5 eV, to its use for imaging a specimen by photon-emission scanning tunnel microscopy, and to a photon-emission scanning tunnel imaging method using such an indirect-gap semiconductor substrate. Advantageously, the indirect-gap semiconductor substrate is made of silicon carbide. The present invention also relates to devices for implementing the imaging method according to the invention.
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公开(公告)号：EP1210715B1
公开(公告)日：2007-11-14
申请号：EP00954833.0
申请日：2000-09-06
CPC分类号： G01Q20/00 , G11B9/1418 , G11B21/21
摘要： A magnetic sensing unit for measuring displacements on a nanometer scale is disclosed. For that, a moveable part and a fixed part of a microdevice comprises a magnetic element having a magnetic field and a magnetic sensor. The magnetic element being located on the moveable part and the magnetic sensor on the fixed part, or the magnetic sensor being located on the moveable part and the magnetic element on the fixed part, the magnetic sensor and/or the magnetic element being an integral part of the microdevice. The magnetic element and the magnetic sensor being arranged relative to each other such that when the moveable part is displaced the change of the magnetic field at the magnetic sensor is detectable by use of the magnetic sensor. Applications are the deflection detection of the cantilever of a scanning probe microscope or in a flying head of a storage device.
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公开(公告)号：EP2263071A1
公开(公告)日：2010-12-22
申请号：EP09730429.9
申请日：2009-04-09
CPC分类号： G01Q60/44
摘要： The imaging apparatus comprises a micro-pipette (11) having a first electrode (12) within it and a second electrode (13) close to but outside of the micro-pipette (11). As the tip of the micro-pipette is brought close to a sample (14) variation of the current flowing between the two electrodes is representative of the distance separating the tip of the micro-pipette and the sample surface and monitoring variations in the current flow enables the topography of the sample surface to be imaged. To establish current flow between the two electrodes, an ionising source such as a UV lamp is used to ionise the environment in which the electrodes are located. The imaging apparatus enables scanning ion conductance microscopy to be performed without the need for the sample to be immersed in an electrolyte solution.
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5.发明公开Planar resonant tunneling sensor and method of fabricating and using same 审中-公开Flacher传感器电感共鸣器Tunneleffekt und dessen Herstellungs- und Anwendungsverfahren。
公开(公告)号：EP1712893A1
公开(公告)日：2006-10-18
申请号：EP05023694.2
申请日：2005-10-28
发明人： Barth, Philip W. , Stein, Derek , Flory, Curt , Pittaro, Rick , Roitman, Daniel
CPC分类号： G01Q30/02 , G01N15/1031
摘要： Planar resonant tunneling sensor devices and methods for using the same are provided. The subject devices include first 103 and second 105 electrodes present on a surface of a planar substrate 101 and separated from each other by a nanodimensioned gap 106. The devices also include a first member 107 for holding a sample, and a second member for moving the first member and planar resonant tunneling electrode relative to each other. Also provided are methods of fabricating such a device and methods of using such a device for improved detection and characterization of a sample.
摘要翻译： 提供了平面谐振隧道传感器装置及其使用方法。 目标装置包括存在于平面基板101的表面上的第一103和第二电极105，并且通过纳米尺寸的间隙106彼此分离。该装置还包括用于保持样品的第一构件107和用于移动 第一构件和平面谐振隧穿电极彼此相对。 还提供了制造这种装置的方法和使用这种装置来改进样品的检测和表征的方法。
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6.发明公开Method and apparatus for removing and/or preventing surface contamination of a probe 审中-公开方法和装置，以除去表面污染的探针和/或防止。
公开(公告)号：EP1592057A2
公开(公告)日：2005-11-02
申请号：EP05103367.8
申请日：2005-04-26
摘要： To remove and/or prevent contamination of a probe, at least a portion of the probe is positioned in a chamber having an inlet passage and an outlet passage, with a distal end of the probe extending through the outlet passage and terminating on a side thereof opposite the chamber. A gas is caused to flow through the inlet passage into the chamber and out the outlet passage, thereby modifying an environment surrounding the distal end of the probe. The gas may be heated prior to injection.
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7.发明公开ELECTRONIC DEVICE SURFACE SIGNAL CONTROL PROBE AND METHOD OF MANUFACTURING THE PROBE 有权电子设备的表面信号命令probe及其制备方法
公开(公告)号：EP1054249A8
公开(公告)日：2002-01-30
申请号：EP99973122.7
申请日：1999-11-12
CPC分类号： G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q70/12 , Y10S977/869 , Y10S977/873 , Y10S977/876
摘要： The present invention realizes a probe with a high resolution, high rigidity and high bending elasticity which can be used in a scanning probe microscope and makes it possible to pick up images of surface atoms with a high resolution. Also, a high-precision input-output probe which can be used in high-density magnetic information processing devices is also realized. In order to accomplish the object, the electronic device surface signal operating probe of the present invention is constructed from a nanotube 24, a holder 2a which holds this nanotube 24, and a fastening means which fastens the base end portion 24b of the nanotube 24 to the surface of the holder so that the tip end portion 24a of the nanotube 24 protrudes; and the tip end portion 24a of the nanotube 24 is used as a probe needle. Furthermore, as one example of the fastening means, a coating film 29 which covers the base end portion 24b of the nanotube 24 is formed. If a coating film 30 is also formed on an intermediate portion 24c on the root side of the tip end portion, the strength of the probe needle and the resolution are further increased. As another example of the fastening means, the base end portion 24b of the nanotube 24 is fusion-welded to the holder surface. All or part of the base end portion 24b forms a fusion-welded part so that the nanotube 24 is firmly fastened to the holder. A common nanotube such as a carbon nanotube (CNT), BCN type nanotube or BN type nanotube, etc., can be used as the above-described nanotube. Since nanotubes have a small tip end curvature radius, signals can be operated at a high resolution. Furthermore, since nanotubes have a high rigidity and bending elasticity, they are extremely resistant to damage and have a long useful life. Moreover, since the raw materials are inexpensive, high-performance probes can be inexpensively obtained. Furthermore, such probes can be used as probe needles in scanning tunnel microscopes or atomic force microscopes, or as input-output probes in place of magnetic heads in magnetic disk drives.
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公开(公告)号：EP2160350A1
公开(公告)日：2010-03-10
申请号：EP08757141.0
申请日：2008-05-28
发明人： ZHOU, Chunqing , ROSCOE, Sharon G.
摘要： In the present invention, it has been discovered that Scanning Tunneling Microscopy is a useful tool for imaging a surface on a nanometer scale and/or fabricating on a nano-sized scale by transferring a particle (e.g., protein) from one location to another. This is accomplished by a method of transferring a material from a first location to a second location comprising the steps of providing a stylus, applying a bias to the stylus, providing a surface, and changing the bias of the stylus such that the material is transferred from the first location to the second location.
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9.发明授权ELECTRONIC DEVICE SURFACE SIGNAL CONTROL PROBE AND METHOD OF MANUFACTURING THE PROBE 有权电子设备的表面信号命令probe及其制备方法
公开(公告)号：EP1054249B1
公开(公告)日：2007-03-07
申请号：EP99973122.7
申请日：1999-11-12
CPC分类号： G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q70/12 , Y10S977/869 , Y10S977/873 , Y10S977/876
摘要： A surface signal control probe high in resolution, rigidity, and bending elasticity which can be used for a scanning probe microscope and a highly accurate surface signal control probe for inputting and outputting signals which can be used for a high density magnetic information processing device, comprising a nanotube (24) small in tip curvature radius and high in rigidity and bending elasticity, a holder (2a) holding the nanotube (24), and a fixing means fixing the base part (24b) of the nanotube to the surface of the holder with the tip part (24a) of the nanotube (24) projecting from the holder, wherein the tip part (24a) of the nanotube is used as a probe and the fixing means is formed of a coating film (29) covering the base part (24b) of the nanotube (24) and a fused part where the base part (24b) is fused to the surface of the holder.
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10.发明公开CONDUCTIVE PROBE FOR SCANNING MICROSCOPE AND MACHINING METHOD USING THE SAME 审中-公开LEITFÄHIGESONDEFÜREIN ABTASTMIKROSKOP UND BEARBEITUNGSVERFAHREN DAMIT
公开(公告)号：EP1336835A4
公开(公告)日：2005-03-16
申请号：EP01972624
申请日：2001-09-28
发明人： NAKAYAMA YOSHIKAZU , AKITA SEIJI , HARADA AKIO , OKAWA TAKASHI , TAKANO YUICHI , YASUTAKE M , SHIRAKAWABE Y
IPC分类号： B82B1/00 , B82B3/00 , G01Q60/16 , G01Q60/38 , G01Q60/40 , G01Q70/00 , G01Q70/12 , G01N13/12 , G12B21/02 , G12B21/04
摘要： A conductive probe for a scanning microscope capable of applying a voltage between a conductive nanotube serving as a probe and a specimen or a current to them. A conductive probe (20) for a scanning microscope for collecting physical properties of the surface of a specimen by means of the tip (14a) of a conductive nanotube probe (12) fixed to a cantilever (4) is characterized in that the conductive probe (20) is composed of a conductive coating (17) provided on the surface of the cantilever (4), a conductive nanotube (12) the root part (16) of which is provided in contact with the surface of the necessary portion of the cantilever (4), and a conductive deposit (18) covering from the root part (16) to a part of the conductive coating (17) and fixing the conductive nanotube (12), and the conductive nanotube (12) is electrically connected to the conductive coating (17) through the conductive deposit (18).
摘要翻译： 一种用于扫描型显微镜的导电探针，其通过固定到悬臂的导电性纳米管探针的尖端捕获试样表面的物质信息，其中导电探针由形成在表面上的导电膜构成 所述悬臂是其基端部固定成导电的非导管，其中预定悬臂的表面是接触的，以及导电沉积物，其通过从非管形管的基端部分覆盖到导电的一部分 电影。 导电非导体和导电膜通过导电沉积物彼此电连接。
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