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公开(公告)号:EP4264139B1
公开(公告)日:2024-09-11
申请号:EP21830504.3
申请日:2021-12-02
IPC分类号: F24F3/167 , H01L21/673 , H01L21/677
CPC分类号: F24F3/167 , F24F2221/12520130101 , H01L21/67724 , H01L21/67775 , B01D46/12
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公开(公告)号:EP4023568B1
公开(公告)日:2024-08-28
申请号:EP20857924.3
申请日:2020-06-24
IPC分类号: H01L21/677 , H01L21/67
CPC分类号: H01L21/67733 , H01L21/67253
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公开(公告)号:EP4394851A1
公开(公告)日:2024-07-03
申请号:EP22217347.8
申请日:2022-12-30
发明人: PARAYIL VENUGOPALAN, Syam , WARNAAR, Patrick , DE JAGER, Pieter, Willem, Herman , JANSEN, Bas , JANSSENS, Stef, Marten, Johan
IPC分类号: H01L21/67 , H01L21/677
CPC分类号: H01L21/67144 , H01L21/67259 , H01L21/67721
摘要: An apparatus for die placement comprising a first stage comprising a plurality of recesses, the plurality of recesses configured to accept a plurality of donor dies; a second stage comprising a support for one or more targets; and a measurement system, functionally coupled to the first stage, and configured to: obtain locations of the plurality of donor dies in the plurality of recesses of the first stage, and based at least on the obtained locations, provide output signals to adjust the locations of the plurality of donor dies supported by the first stage to correspond to locations of the one or more targets, and based at least in part on the adjusted locations, provide output signals to place the plurality of donor dies on the one or more targets supported by the second stage by relative movement between the first stage and the second stage.
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公开(公告)号:EP4388580A1
公开(公告)日:2024-06-26
申请号:EP22765779.8
申请日:2022-08-15
申请人: Metryx Limited
IPC分类号: H01L21/67 , H01L21/677
CPC分类号: H01L21/67103 , H01L21/67109 , H01L21/67253 , H01L21/67748
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公开(公告)号:EP4384650A1
公开(公告)日:2024-06-19
申请号:EP22855580.1
申请日:2022-08-12
申请人: Beneq Oy
IPC分类号: C23C16/455 , C23C16/458 , H01L21/677 , H01L21/673
CPC分类号: C23C16/45546 , H01L21/6723 , H01L21/67781
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公开(公告)号:EP4376058A1
公开(公告)日:2024-05-29
申请号:EP23207816.2
申请日:2023-11-04
发明人: Yiu Ming, CHEUNG , Man Hon, CHENG , Siu Cheung, SO , So Ying, KWOK , Ming, LI
IPC分类号: H01L21/67 , H01L21/677 , H01L21/683
CPC分类号: H01L21/6838 , H01L21/67144 , H01L21/677 , H01L24/75
摘要: When locating a semiconductor die on a substrate, the die is picked up and carried with a die-holding surface of a bonding tool having a protrusion. The protrusion of the bonding tool is configured to be movable between a retracted position within the die-holding surface and an extended position protruding from the die-holding surface. When the protrusion is located in the extended position, the die is bent when the bonding tool is carrying the die. Thereafter, the bonding tool is moved to flatten the die against the substrate while the substrate urges the protrusion to retract from the extended position towards the retracted position.
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公开(公告)号:EP4373912A1
公开(公告)日:2024-05-29
申请号:EP22754332.9
申请日:2022-07-18
申请人: Kyoobe Tech GmbH
发明人: BOTT, Mario , SCHOBER, Lena , WELLER, David
IPC分类号: C12M1/12 , B65B3/00 , B65B55/16 , B65G1/00 , F24F3/167 , G05B19/18 , H01L21/677 , G05B19/418
CPC分类号: C12M37/00 , F24F3/167 , B65B3/003 , F24F11/72 , F24F2110/1020180101 , F24F2110/2020180101 , G05B19/4155 , B65B55/027 , B65B2210/0620130101
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公开(公告)号:EP4365934A1
公开(公告)日:2024-05-08
申请号:EP22831824.2
申请日:2022-06-23
发明人: MA, Hongshuai , ZHAO, Hongyu , WANG, Ruiting
IPC分类号: H01L21/677 , H01L21/67
摘要: The present disclosure provides a wafer cleaning apparatus and a wafer transfer device. The wafer transfer device includes a machine bracket, a drive mechanism, a retractable bracket, and a plurality of wafer support brackets. The drive mechanism and the retractable bracket are arranged at the machine bracket. An end of the retractable bracket is fixedly connected to the machine bracket. The second end of the retractable bracket is movably arranged at the machine bracket and arranged along the movement direction of the second end. The drive mechanism is connected to the retractable bracket and is configured to drive the second end to move to cause the retractable bracket to retract. The plurality of wafer support brackets are arranged at the retractable bracket. The distance between any two neighboring wafer support brackets changes as the retractable bracket extends and retracts. The distance between any two neighboring wafer support brackets is the same. With the above technical solution, the problem that the distance between the neighboring wafers cannot be changed when the wafer transfer device transfers the wafer can be solved.
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公开(公告)号:EP4356421A1
公开(公告)日:2024-04-24
申请号:EP22743728.2
申请日:2022-06-15
申请人: Beier, Uwe
发明人: Beier, Uwe
IPC分类号: H01L21/677 , B65G49/04 , B25J15/00
CPC分类号: H01L21/67742 , H01L21/67766 , H01L21/67781 , H01L21/67754 , B25J15/0052 , B25J11/0095 , B25J15/0014 , B25J18/002 , B65G49/067
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公开(公告)号:EP4314378A1
公开(公告)日:2024-02-07
申请号:EP22779212.4
申请日:2022-03-29
申请人: Beneq Oy
IPC分类号: C23C16/455 , H01L21/677
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