摘要:
An adaptive control circuit of SRAM (Static Random Access Memory) includes a switch circuit, a forward diode-connected transistor, a backward diode-connected transistor, and a first delay circuit. The switch circuit is supplied by a supply voltage, and is coupled to a first node. The backward diode-connected transistor is coupled in parallel with the forward diode-connected transistor between the first node and a second node. The first delay circuit is coupled between the second node and a ground voltage.
摘要:
Provided is an electronic circuit including a cell array including memory cells each including a bistable circuit that includes a first inverter circuit and a second inverter circuit, each of the first inverter circuit and the second inverter circuit having a first mode characterized by there being substantially no hysteresis in transfer characteristics and a second mode characterized by there being hysteresis in transfer characteristics, wherein each of the first inverter circuit and the second inverter circuit are configured to be switchable between the first mode and the second mode, an output node and an input node of the first inverter circuit being coupled to an input node and an output node of the second inverter circuit, respectively, and a control circuit configured to, after powering off one or more first memory cells that are not required to retain data among the memory cells, put the bistable circuits in remaining one or more second memory cells of the memory cells into the second mode, and supply a second power supply voltage, at which the bistable circuit in the second mode can retain data, to the bistable circuits in the one or more second memory cells while maintaining the second mode, the second power supply voltage being lower than a first power supply voltage that is supplied to the bistable circuit when data is read and/or written.
摘要:
La présente description concerne un circuit mémoire (200) comportant : - une pluralité de cellules élémentaires de stockage (10) agencées en matrice selon des rangées et des colonnes, les cellules d'une même colonne partageant une même ligne de bit de lecture (RBL) et une même ligne de bit d'écriture (WBL) ; - un circuit interne de contrôle (CTRL) adapté à mettre en oeuvre une opération de calcul comprenant l'activation simultanée en lecture d'au moins deux rangées de la matrice ; et - un circuit de permutation (30) comportant un registre d'entrée de données (32), un registre de configuration (36), et un port de sortie (34), le circuit de permutation (30) étant adapté à fournir sur son port de sortie (34) les données mémorisées dans son registre d'entrée (32) permutées selon une permutation définie en fonction de l'état de son registre de configuration (36) .
摘要:
A method includes measuring a temperature of a sensor associated with a memory array. The method also includes calculating, at a voltage regulating device, an operating voltage based on the temperature and based on fabrication data associated with the memory array. The method further includes regulating, at the voltage regulating device, a voltage provided to the memory array based on the operating voltage.
摘要:
A memory circuit includes a plurality of divided memory cell blocks, a write circuit and a read circuit which connect via a pair of bit lines to each of the divided memory cell blocks. The output of write data to one of the bit line of the write circuit is made to be performed by one system. It is possible to achieve an increase of speed by bit lien division while reducing increase in the memory circuit area accompanying the bit line division.
摘要:
A method and system are provided for maintaining a virtual ground node of an SRAM memory array at a minimum level sufficient for maintaining data retention. A circuit can maintain the virtual ground node at a virtual ground reference voltage of VDD-(1.5*Vth), or maintain 1.5*Vth across the memory cells, where Vth is a threshold voltage of an SRAM memory cell transistor and VDD is a positive supply voltage. By tracking the Vth of the memory cell transistors in the SRAM array, the circuit reduces leakage current while maintaining data integrity. A threshold voltage reference circuit can include one or more memory cell transistors (in parallel), or a specially wired memory cell to track the memory cell transistor threshold voltage. The value of the virtual ground reference voltage can be based on a ratio of feedback chain elements in a multiplier circuit.