Trash can
    1.
    外观设计

    公开(公告)号:USD1013997S1

    公开(公告)日:2024-02-06

    申请号:US29770906

    申请日:2021-02-17

    摘要: FIG. 1 is a perspective view of a trash can of our new design.
    FIG. 2 is a front view of FIG. 1.
    FIG. 3 is a rear view of FIG. 1.
    FIG. 4 is a left end view of FIG. 1.
    FIG. 5 is a right end view of FIG. 1; and,
    FIG. 6 is a top view of FIG. 1.
    The broken lines in the figures show portions of the trash can which form no part of the claimed design.

    Sterilization and Deodorization Waste Container

    公开(公告)号:US20230355828A1

    公开(公告)日:2023-11-09

    申请号:US18222383

    申请日:2023-07-14

    申请人: Shi Ping Wang

    IPC分类号: A61L11/00 B65F1/14

    CPC分类号: A61L11/00 B65F1/14

    摘要: A sterilization and deodorization waste container includes an isolation chamber provided on an inner side of a container lid and a dual-wave band ultraviolet lamp tube installed in the isolation chamber. The dual-wave band ultraviolet lamp tube is capable of simultaneously generating a direct ultraviolet light wave and an ozone ultraviolet light wave. The isolation chamber includes a reflector housing having a light transmitting window facing an inner cavity of a container body. The dual-wave band ultraviolet lamp tube is controlled by a control circuit to turn on to generate the ultraviolets into an inner cavity of the container body while the container lid is closed and to turn off to stop generating the ultraviolet while the container lid is opened.

    Method and apparatus for rapid measurement of heat capacity of a thin film material

    公开(公告)号:US20190391094A1

    公开(公告)日:2019-12-26

    申请号:US16365318

    申请日:2019-03-26

    IPC分类号: G01N25/00 G01N25/18

    摘要: The invention discloses a apparatus and a method for rapid measurement of heat capacity of a thin film material. Specifically, the apparatus comprises a control device, a clock synchronizer, a flat peak laser device, a rapid thermometer and a heat capacity output device; the control device and the clock synchronizer are signally connected, and the clock synchronizer is signally connected to the flat peak laser device and the rapid thermometer; In the working state, the control device sends a start signal to the clock synchronizer, and the flat peak laser device and the fast thermometer coordinately cooperate; the flat peak laser device irradiates a laser with a spatially flat peak to the surface of the sample; At the same time, the rapid thermometer captures the surface temperature of the sample at a certain point in time during the heating process of the sample, and inputs the measured data into the heat capacity output device to obtain the desired heat capacity parameter. The device of the invention has simple structure, high efficiency and accuracy, and can provide reliable parameter data for the current thermal property setting of various ultra-thin semiconductor films.

    Micro-zone laser heating apparatus and method

    公开(公告)号:US20190389002A1

    公开(公告)日:2019-12-26

    申请号:US16365350

    申请日:2019-03-26

    摘要: The embodiment of the invention discloses a micro-zone laser heating apparatus and method. The micro-zone laser heating apparatus comprises: a laser characteristic determination module, for obtaining first characteristic parameters of the laser required for heating based on the parameters of the current micro-zone to be heated of the sample; a controller, electrically connected to the laser characteristic determination module for generating a control signal based on the first characteristic parameters; a laser output module, electrically connected to the controller for outputting a laser based on the control signal to heat the sample micro-zone to be heated. The micro-zone laser heating apparatus and method provided by the embodiments of the present invention can accurately heat the micro-zone of the high-throughput composite material sample to be heated, while avoiding the phase change of the surrounding area caused by the heating of the material in the adjacent area of the micro-zone to be heated or the component contamination caused by the migration of molecules or atoms inside the sample due to heating. It can be applied to heat treatment or phase change research of low-dimensional and high-density materials.

    Resistive random-access memory with protected switching layer

    公开(公告)号:US10381557B2

    公开(公告)日:2019-08-13

    申请号:US16062414

    申请日:2016-12-14

    IPC分类号: H01L27/10 H01L27/24 H01L45/00

    摘要: Resistive RAM (RRAM) devices having increased reliability and related manufacturing methods are described. Greater reliability of RRAM cells over time can be achieved by avoiding direct contact of metal electrodes with the device switching layer. The contact can be avoided by cladding the switching layer in a material such as silicon or using electrodes that may contain metal but have regions that are adjacent the switching layer and lack free metal ions except for possible trace amounts.