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公开(公告)号：US20250003865A1
公开(公告)日：2025-01-02
申请号：US18886739
申请日：2024-09-16
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US20230236112A1
公开(公告)日：2023-07-27
申请号：US18162385
申请日：2023-01-31
Applicant: Photothermal Spectroscopy Corp
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC classification number: G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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3.发明申请公开(公告)号：US20230063843A1
公开(公告)日：2023-03-02
申请号：US17796822
申请日：2021-02-01
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Derek Decker , David Grigg
Abstract: A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
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公开(公告)号：US10969405B2
公开(公告)日：2021-04-06
申请号：US15826147
申请日：2017-11-29
Applicant: Photothermal Spectroscopy Corp.
Inventor： Roshan Shetty , Kevin Kjoller , Craig Prater
IPC: G01N21/17 , G01N21/31 , G01N21/65 , G01Q30/02 , G01N21/3563
Abstract: Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 μm or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip. The methods and apparatus also include the ability to analyze light reflected/scattered from the sample via a Raman spectrometer for complementary analysis by Raman spectroscopy. Using a UV/vis source or IR source at higher intensity it is possible to thermally desorb material from a sample for analysis by mass spectrometry. The AFM tip can also be heated to desorb material for mass spec analysis at even higher spatial resolution.
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公开(公告)号：US20190120753A1
公开(公告)日：2019-04-25
申请号：US16155089
申请日：2018-10-09
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC: G01N21/35 , G01N21/65 , G01N21/59 , G01N21/552 , G01N23/20091 , G01N23/207 , H01J49/26 , H01J37/26
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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Patent Agency Ranking
公开(公告)号：US12209950B2
公开(公告)日：2025-01-28
申请号：US18162385
申请日：2023-01-31
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US11680892B2
公开(公告)日：2023-06-20
申请号：US17316453
申请日：2021-05-10
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC classification number: G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
Abstract: System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US11486761B2
公开(公告)日：2022-11-01
申请号：US16427866
申请日：2019-05-31
Applicant: Photothermal Spectroscopy Corp.
Inventor： Derek Decker , Craig Prater
Abstract: Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
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公开(公告)号：US11480518B2
公开(公告)日：2022-10-25
申请号：US16702094
申请日：2019-12-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US20210164894A1
公开(公告)日：2021-06-03
申请号：US16702094
申请日：2019-12-03
Applicant: Photothermal Spectroscopy Corp.
Inventor： Craig Prater , David Grigg , Derek Decker
Abstract: Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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