Abstract:
Apparatuses and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device. The ion trap device may comprise a first end cap having a first aperture and a second end cap having a second aperture, wherein the first aperture and the second aperture may define an ejection axis. The ion trap device may also comprise a ring electrode substantially coaxially aligned between the first and second end caps. The ring electrode may include an opening extending along a radial direction of the ring electrode, wherein the radial direction is substantially perpendicular to the ejection axis. One such method may include ionizing a sample in an ion trap through an opening separating at least part of first and second ring sections of the ion trap and detecting ions ejected though an aperture on an end cap of the ion trap.
Abstract:
Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture. The method may include obtaining a mass spectrum of a defocused ion beam generated from the sample.
Abstract:
Systems and methods for automatic gain control in mass spectrometers are disclosed. An exemplary system may include a mass spectrometer, comprising a lens configured to receive a supply of ions, and a mass analyzer. The mass analyzer may include an ion trap for trapping the supplied ions. The mass analyzer may also include an ion detector for detecting ions that exit the ion trap. The lens may focus the ions non-uniformly based on mass of the ions to compensate for space charge effects reflected in a measurement output of the mass spectrometer. An exemplary method may include focusing an ion beam into a mass analyzer. The method may also include obtaining a mass spectrum and identifying a space charge characteristic based on the mass spectrum. The method may further include defocusing the lens based on the identified space charge characteristic, wherein defocusing the lens is configured to divert lighter ions away from the entrance aperture. The method may include obtaining a mass spectrum of a defocused ion beam generated from the sample.
Abstract:
A mass spectrometer system is disclosed. The mass spectrometer includes a vacuum chamber defining an enclosed evacuated space and an ion trap disposed in the enclosed space. The ion trap is configured to trap an ionized sample. The mass spectrometer further includes an ion detector coupled to the chamber at a location external to the chamber such that sample ions may exit the evacuated space and into the externally-coupled detector without loss of vacuum pressure.
Abstract:
An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapole field.
Abstract:
A mass spectrometer comprises an ion trap configured to trap ions and to eject ions. The ion trap comprises an electrode. The mass spectrometer further comprises a detector configured to detect ions ejected from the ion trap, a radio frequency (RF) generator electrically coupled to the electrode and configured to generate an RF signal, a sampling circuit electrically coupled to electrode and configured to measure a voltage of the RF signal at the electrode, and a signal processor electrically coupled to the sampling circuit and the detector. The signal processor is configured to receive outputs from the detector and the sampling circuit and to correct the output from the detector based on the output from the sampling circuit.
Abstract:
A chemical pre-concentrator includes a conduit defining a flow path between two ends and having a heating element disposed within the conduit, such that the heating element has at least one sorbent material deposited directly on at least a portion of a conductive surface of the heating element. Some such heating elements are in the form of electrically conductive strips defining both a plurality of apertures through the strip and a series of undulations spaced along the flow path.
Abstract:
A mass spectrometer is disclosed. The mass spectrometer may include an ion trap configured to trap and analyze an ionized sample. A first aperture may be provided having a first diameter, and a second aperture may be provided having a second diameter. The first aperture may be configured to receive electrons for the purpose of ionizing sample ions within the ion trap. The second aperture may be configured to receive photons for the purpose of ionizing sample ions within the ion trap.
Abstract:
A method and apparatus for performing mass spectrometry using an electron source, an ion trap, and a voltage-controlled lens located between the electron source and the ion trap. A controller applies a voltage to the lens. Features of the resulting output spectrum can be analyzed to determine whether to adjust the lens voltage.
Abstract:
A mass spectrometer system is disclosed. The mass spectrometer includes a vacuum chamber defining an enclosed evacuated space and an ion trap disposed in the enclosed space. The ion trap is configured to trap an ionized sample. The mass spectrometer further includes an ion detector coupled to the chamber at a location external to the chamber such that sample ions may exit the evacuated space and into the externally-coupled detector without loss of vacuum pressure.