APPARATUS FOR ERROR SIMULATION AND METHOD THEREOF
    4.
    发明申请
    APPARATUS FOR ERROR SIMULATION AND METHOD THEREOF 有权
    用于错误模拟的装置及其方法

    公开(公告)号:US20150293827A1

    公开(公告)日:2015-10-15

    申请号:US14677297

    申请日:2015-04-02

    CPC classification number: G06F11/2215

    Abstract: The present invention relates to an apparatus for computing an error rate comprising: a first circuit interface being connected to a first sub-circuit receiving data and computing output data through a predetermined computation process; a second circuit interface and being connected to a first test circuit receiving the same data, which is inputted to the first sub-circuit, and computing output data through the predetermined computation process; an error injecting part injecting an error to the first test circuit; an error detecting part comparing output data of the first sub-circuit to output data of the first test circuit; and an error rate computing part computing input node error probability of the first sub-circuit by statistic processing of the compared result. The apparatus and method for computing error rate of the present invention is able to shorten the time required to obtain error probability, compared to the direct simulation of the full circuit.

    Abstract translation: 本发明涉及一种用于计算错误率的装置,包括:第一电路接口,连接到第一子电路,接收数据并通过预定的计算过程计算输出数据; 第二电路接口,并连接到接收相同数据的第一测试电路,其被输入到第一子电路,并通过预定的计算过程来计算输出数据; 向第一测试电路注入错误的误差注入部分; 将所述第一子电路的输出数据与所述第一测试电路的输出数据进行比较的误差检测部; 以及错误率计算部分通过对比结果的统计处理来计算第一子电路的输入节点误差概率。 与全电路的直接模拟相比,本发明的计算误差率的装置和方法能够缩短获得误差概率所需的时间。

    APPARATUS AND METHOD FOR DETECTING FAULT OF PROCESSOR
    5.
    发明申请
    APPARATUS AND METHOD FOR DETECTING FAULT OF PROCESSOR 有权
    检测处理器故障的装置和方法

    公开(公告)号:US20140344623A1

    公开(公告)日:2014-11-20

    申请号:US14255481

    申请日:2014-04-17

    Inventor: Jin-Ho HAN

    CPC classification number: G06F11/0724 G06F11/0721 G06F11/0751

    Abstract: An apparatus and method for detecting the fault of a processor are disclosed. The apparatus includes a fetch fault control unit, a decoding fault control unit, and an execution fault control unit. The fetch fault control unit detects the fault of each of fetch units of a plurality of processor cores connected to memory. The decoding fault control unit detects the fault of each of decoding units of the plurality of processor cores connected to the memory. The execution fault control unit detects the fault of each of execution units of the plurality of processor cores connected to the memory, executes the same instruction in the plurality of processor cores, determines a processor core where a fault has occurred, and provides notification of the determined processor to the fetch fault control unit and the decoding fault control unit.

    Abstract translation: 公开了一种用于检测处理器故障的装置和方法。 该装置包括取出故障控制单元,解码故障控制单元和执行故障控制单元。 获取故障控制单元检测连接到存储器的多个处理器核心中的每个提取单元的故障。 解码故障控制单元检测连接到存储器的多个处理器核心中的每个解码单元的故障。 执行故障控制单元检测连接到存储器的多个处理器核心中的每个执行单元的故障,在多个处理器核心中执行相同的指令,确定出现故障的处理器核心,并且提供 确定处理器到获取故障控制单元和解码故障控制单元。

    MULTIPLY-ACCUMULATE OPERATION METHOD AND APPARATUS

    公开(公告)号:US20240176590A1

    公开(公告)日:2024-05-30

    申请号:US18522797

    申请日:2023-11-29

    Inventor: Jin-Ho HAN

    CPC classification number: G06F7/5443 G06F5/01 G06F7/483

    Abstract: An embodiment of the present disclosure may provide a multiply-accumulate operation method performed by a multiply-accumulate operation apparatus, the multiply-accumulate operation method including accumulating, by an accumulation register, a value within a preset bit value of a mantissa bitwidth in a result of an addition operation of a shifted first mantissa value and a shifted second mantissa value, determining, by an overflow counter, an overflow count based on an overflow value by which the result of the addition operation of the shifted first mantissa value and the shifted second mantissa value exceeds the preset bit value of the mantissa bitwidth, performing normalization and rounding based on the value accumulated in the accumulation register and the overflow count, and updating, by an exponent updater, the exponent using a normalized and rounded value.

    CACHE MEMORY WITH FAULT TOLERANCE
    10.
    发明申请
    CACHE MEMORY WITH FAULT TOLERANCE 有权
    具有容错能力的缓存记忆

    公开(公告)号:US20160110250A1

    公开(公告)日:2016-04-21

    申请号:US14858448

    申请日:2015-09-18

    CPC classification number: G06F11/1064 G06F12/0895 G06F2212/1032

    Abstract: The exemplary embodiments of the invention relates to fault tolerance of a cache memory which recovers an error occurred in the cache memory or reports an error. A cache memory may include a first layer cache configured to store data requested from a processor, together with a tag related to the data and parity check bits for detecting data error and tag error; a second layer cache configured to store data requested from the first layer cache, together with parity check bits and an error correction code(ECC) bit for detecting data error and tag error; and a fault tolerance unit configured to generate an error signal indicating whether the data error or tag error occurred in at least one of the first layer cache and the second layer cache is recoverable.

    Abstract translation: 本发明的示例性实施例涉及高速缓冲存储器的容错,其恢复在高速缓冲存储器中发生的错误或报告错误。 高速缓冲存储器可以包括配置成存储从处理器请求的数据的第一层缓存以及与数据有关的标签和用于检测数据错误和标签错误的奇偶校验位; 第二层缓存,配置为存储从第一层高速缓存请求的数据,以及奇偶校验位和用于检测数据错误和标签错误的纠错码(ECC)位; 以及容错单元,被配置为生成指示在所述第一层高速缓冲存储器和所述第二层高速缓冲存储器中的至少一个中发生的数据错误或标签错误是否可恢复的错误信号。

Patent Agency Ranking