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公开(公告)号：US20210244373A1
公开(公告)日：2021-08-12
申请号：US16789100
申请日：2020-02-12
Applicant: General Electric Company
Inventor： Uwe Wiedmann , Biju Jacob , Peter Michael Edic , Brian David Yanoff
IPC: A61B6/00 , G01N23/041
Abstract: The present disclosure relates to fabrication and use of a phase-contrast imaging detector that includes sub-pixel resolution electrodes or photodiodes spaced to correspond to a phase-contrast interference pattern. A system using such a detector may employ fewer gratings than are typically used in a phase-contrast imaging system, with certain functionality typically provided by a detector-side analyzer grating being performed by sub-pixel resolution structures (e.g., electrodes or photodiodes) of the detector. Measurements acquired using the detector may be used to determine offset, amplitude, and phase of a phase-contrast interference pattern without multiple acquisitions at different phase steps.
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公开(公告)号：US10222489B2
公开(公告)日：2019-03-05
申请号：US15457558
申请日：2017-03-13
Applicant: General Electric Company
Inventor： Geng Fu , Xue Rui , Yannan Jin , Jianjun Guo , Peter Michael Edic , Brian David Yanoff
Abstract: The present approach relates to the use of reference pixels provided between the primary pixels of a detector panel. Coincidence circuitry or logic may be employed so that the measured signal arising from the same X-ray event may be properly, that is the signal measured at both a reference and primary pixel may be combined so as to provide an accurate estimate of the measured signal, at an appropriate location on the detector panel.
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公开(公告)号：US20180328863A1
公开(公告)日：2018-11-15
申请号：US15591926
申请日：2017-05-10
Applicant: General Electric Company
Inventor： Xue Rui , Yannan Jin , Biju Jacob , Brian David Yanoff , Uwe Wiedmann
CPC classification number: G01N23/046 , A61B6/032 , A61B6/4291 , G01T1/242 , G21K1/025
Abstract: The present approach relates to scatter correction of signals acquired using radiation detectors on a pixel-by-pixel basis. In certain implementations, the systems and methods disclosed herein facilitate scatter correction for signals generated using a detector having segmented detector elements, such as may be present in an energy-resolving, photon-counting CT imaging system.
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公开(公告)号：US10117626B2
公开(公告)日：2018-11-06
申请号：US14868826
申请日：2015-09-29
Applicant: General Electric Company
Inventor： Geng Fu , Peter Michael Edic , Brian David Yanoff , Jianjun Guo , Vladimir A. Lobastov , Yannan Jin
Abstract: Some embodiments are associated with an input signal comprising a first and a second photon event incident on a photon-counting semiconductor detector. A relatively slow charge collection shaping amplifier may receive the input signal and output an indication of a total amount of energy associated with the superposition of the first and second events. A relatively fast charge collection shaping amplifier may receive the input signal and output an indication that is used to allocate a first portion of the total amount of energy to the first event and a second portion of the total amount of energy to the second event.
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公开(公告)号：US20170285188A1
公开(公告)日：2017-10-05
申请号：US15087560
申请日：2016-03-31
Applicant: General Electric Company
Inventor： Xue Rui , Geng Fu , Jianjun Guo , Bruno Kristiaan Bernard De Man , Brian David Yanoff
CPC classification number: G01N23/046 , G01N23/083 , G01N2223/505 , G01T1/17 , G01T1/2985
Abstract: The present approach relates to a detector design that allows detector-based wobble using an electronic control scheme. In one implementation, each detector pixel is divided into sub-pixels. The readout of the sub-pixels can be binned with minimal noise penalty to enable the detector wobble without physically shifting the detector or alternating the physical focal spot location, though, as discussed herein alternation of the focal spot location may be used in conjunction with the present approach to further improve radial and longitudinal imaging resolution as well as suppressing artifacts resulted by limited spatial sampling.
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Patent Agency Ranking
公开(公告)号：US09594053B2
公开(公告)日：2017-03-14
申请号：US14264133
申请日：2014-04-29
Applicant: General Electric Company
Inventor： Feng Pan , Brian David Yanoff , Aaron Judy Couture , Hakan Erik Roos , Yu Zhao
IPC: G01N27/447
CPC classification number: G01N27/44726 , G01N27/44721 , G06T7/0012
Abstract: A system and method for generating a digital image in fluorescence gel imaging is disclosed. The method includes providing a gel sample and placing the gel sample on a flat panel detector having array of photodiodes and transistors that collect light generated from the gel sample. The gel sample is illuminated using a light source integrated into the flat panel imaging system and light emitted by the gel sample responsive to an excitation of the gel sample by light provided by the light source is then collected, with the light emitted by the gel sample being collected by the array of photodiodes of the flat panel detector and converted to electric charges to generate light data. The light data is then processed to generate a digital image of the gel sample.
Abstract translation: 公开了一种用于在荧光凝胶成像中产生数字图像的系统和方法。 该方法包括提供凝胶样品并将凝胶样品放置在具有阵列的光电二极管和晶体管的平板检测器上，所述光电二极管和晶体管收集凝胶样品产生的光。 使用集成到平板成像系统中的光源照射凝胶样品，然后响应于由光源提供的光的凝胶样品的激发而响应于凝胶样品发出的光，然后用凝胶样品发射的光 由平板检测器的光电二极管阵列收集，并转换成电荷以产生光数据。 然后处理光数据以产生凝胶样品的数字图像。
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公开(公告)号：US20150285762A1
公开(公告)日：2015-10-08
申请号：US14277830
申请日：2014-05-15
Applicant: General Electric Company
Inventor： Feng Pan , Brian David Yanoff , Aaron Judy Couture , Hakan Erik Roos , Yu Zhao
IPC: G01N27/447
CPC classification number: G01N27/44726 , G01N27/44721 , G06T7/0012
Abstract: A system and method for generating a digital image in fluorescence gel imaging is disclosed. The method includes providing a gel sample and placing the gel sample on a flat panel detector having array of photodiodes and transistors that collect light generated from the gel sample. The gel sample is illuminated using a light source integrated into the flat panel imaging system and light emitted by the gel sample responsive to an excitation of the gel sample by light provided by the light source is then collected, with the light emitted by the gel sample being collected by the array of photodiodes of the flat panel detector and converted to electric charges to generate light data. The light data is then processed to generate a digital image of the gel sample.
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公开(公告)号：US11054532B2
公开(公告)日：2021-07-06
申请号：US16279328
申请日：2019-02-19
Applicant: Prismatic Sensors AB , General Electric Company
Inventor： Torbjörn Hjärn , Brian David Yanoff , Brian Breuer , Brian Joseph Graves , Cheng Xu , Biju Jacob , Peter Michael Edic , Gregory Scott Zeman
IPC: G01T1/24
Abstract: There is provided an x-ray detector having a number of x-ray detector sub-modules. Each detector sub-module is an edge-on detector sub-module having an array of detector elements extending in at least two directions, wherein one of the directions has a component in the direction of incoming x-rays. The detector sub-modules are stacked one after the other and/or arranged side-by-side. For at least part of the detector sub-modules, the detector sub-modules are arranged for providing a gap between adjacent detector sub-modules, where at least part of the gap is not directed linearly towards the x-ray focal point of an x-ray source.
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公开(公告)号：US10433811B2
公开(公告)日：2019-10-08
申请号：US15591932
申请日：2017-05-10
Applicant: General Electric Company
Inventor： Biju Jacob , Brian David Yanoff , Xue Rui
IPC: A61B6/00 , A61B6/03 , G01N23/046
Abstract: The present approach relates to self-calibration of CT detectors based on detected misalignment of the detector and X-ray source. The present approach make the detector more robust to changes against temperature and focal spot movements. The diagnostic image generated by energy resolving calibrated response signals is able to present enhanced features compared to conventional CT based diagnostic images.
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公开(公告)号：US10283557B2
公开(公告)日：2019-05-07
申请号：US14985785
申请日：2015-12-31
Applicant: General Electric Company
Inventor： Biju Jacob , Habib Vafi , Brian David Yanoff , Jeffery Jon Shaw , Jianjun Guo
IPC: H01L27/00 , H01L27/146 , G01T1/20 , G01T1/24
Abstract: Various approaches are discussed for using four-side buttable CMOS tiles to fabricate detector panels, including large-area detector panels. Fabrication may utilize pads and interconnect structures formed on the top or bottom of the CMOS tiles. Electrical connection and readout may utilize readout and digitization circuitry provided on the CMOS tiles themselves such that readout of groups or sub-arrays of pixels occurs at the tile level, while tiles are then readout at the detector level such that readout operations are tiered or multi-level.
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