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公开(公告)号:US20180102315A1
公开(公告)日:2018-04-12
申请号:US15290907
申请日:2016-10-11
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Roderick Alan AUGUR , Roger A. QUON , Shawn P. FETTEROLF
IPC: H01L23/522 , H01L21/311 , H01L49/02 , H01L21/768 , H01L23/528
CPC classification number: H01L23/5223 , H01L23/528 , H01L28/60
Abstract: The surface area of a surface area-dependent semiconductor device is increased by providing a dielectric layer, removing portion(s) of the dielectric layer, resulting in recession(s), and forming surface area-dependent semiconductor device(s), a portion of the device being formed along a sidewall of one, or more, of the recession(s). The resulting semiconductor structure includes a dielectric layer having recession(s) therein, and surface area-dependent semiconductor device(s) having a portion thereof formed along a sidewall of the recession(s).
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2.
公开(公告)号:US20180226294A1
公开(公告)日:2018-08-09
申请号:US15425478
申请日:2017-02-06
Applicant: GLOBALFOUNDRIES Inc.
Inventor: Jason Eugene STEPHENS , David Michael PERMANA , Guillaume BOUCHE , Andy WEI , Mark ZALESKI , Anbu Selvam KM MAHALINGAM , Craig Michael CHILD, JR. , Roderick Alan AUGUR , Shyam PAL , Linus JANG , Xiang HU , Akshey SEHGAL
IPC: H01L21/768 , H01L21/311 , H01L21/027 , H01L23/522 , H01L23/528
CPC classification number: H01L21/76897 , H01L21/0273 , H01L21/31144 , H01L21/76802 , H01L21/76808 , H01L21/76811 , H01L21/76816 , H01L21/7684 , H01L21/76843 , H01L21/76877 , H01L23/5226 , H01L23/528
Abstract: Semiconductor devices and methods of fabricating the semiconductor devices with chamfer-less via multi-patterning are disclosed. One method includes, for instance: obtaining an intermediate semiconductor device; performing a trench etch into a portion of the intermediate semiconductor device to form a trench pattern; depositing an etching stack; performing at least one via patterning process; and forming at least one via opening into a portion of the intermediate semiconductor device. An intermediate semiconductor device is also disclosed.
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