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公开(公告)号:US20220199615A1
公开(公告)日:2022-06-23
申请号:US17133024
申请日:2020-12-23
Applicant: Intel Corporation
Inventor: Avyaya JAYANTHINARASIMHAM , Brian GREENE , Suresh Vishwanath
IPC: H01L27/07 , H01L27/088 , H01L29/861 , H01L29/78 , H01L29/06
Abstract: Substrate-less vertical diode integrated circuit structures, and methods of fabricating substrate-less vertical diode integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a semiconductor fin in a dielectric layer, the semiconductor fin having a top and a bottom, and the dielectric layer having a top surface and a bottom surface. A first epitaxial semiconductor structure is on the top of the semiconductor fin. A second epitaxial semiconductor structure is on the bottom of the semiconductor fin. A first conductive contact is on the first epitaxial semiconductor structure. A second conductive contact is on the second epitaxial semiconductor structure.
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公开(公告)号:US20220415881A1
公开(公告)日:2022-12-29
申请号:US17357754
申请日:2021-06-24
Applicant: Intel Corporation
Inventor: Rui MA , Kalyan KOLLURU , Nicholas THOMSON , Ayan KAR , Benjamin ORR , Nathan JACK , Biswajeet GUHA , Brian GREENE , Chung-Hsun LIN
IPC: H01L27/02
Abstract: Substrate-less silicon controlled rectifier (SCR) integrated circuit structures, and methods of fabricating substrate-less silicon controlled rectifier (SCR) integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a first fin portion and a second fin portion that meet at a junction. A plurality of gate structures is over the first fin portion and a second fin portion. A plurality of P-type epitaxial structures and N-type epitaxial structures is between corresponding adjacent ones of the plurality of gate structures. Pairs of the P-type epitaxial structures alternate with pairs of the N-type epitaxial structures.
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公开(公告)号:US20220415925A1
公开(公告)日:2022-12-29
申请号:US17358329
申请日:2021-06-25
Applicant: Intel Corporation
Inventor: Nicholas THOMSON , Kalyan KOLLURU , Ayan KAR , Rui MA , Benjamin ORR , Nathan JACK , Biswajeet GUHA , Brian GREENE , Lin HU , Chung-Hsun LIN
Abstract: Substrate-less lateral diode integrated circuit structures, and methods of fabricating substrate-less lateral diode integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a fin or a stack of nanowires. A plurality of P-type epitaxial structures is over the fin or stack of nanowires. A plurality of N-type epitaxial structures is over the fin or stack of nanowires. One or more spacings are in locations over the fin or stack of nanowires, a corresponding one of the one or more spacings extending between neighboring ones of the plurality of P-type epitaxial structures and the plurality of N-type epitaxial structures.
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公开(公告)号:US20210305436A1
公开(公告)日:2021-09-30
申请号:US16830112
申请日:2020-03-25
Applicant: Intel Corporation
Inventor: Ayan KAR , Saurabh MORARKA , Carlos NIEVA-LOZANO , Kalyan KOLLURU , Biswajeet GUHA , Chung-Hsun LIN , Brian GREENE , Tahir GHANI
Abstract: Gate-all-around integrated circuit structures including varactors are described. For example, an integrated circuit structure includes a varactor structure on a semiconductor substrate. The varactor structure includes a plurality of discrete vertical arrangements of horizontal nanowires. A plurality of gate stacks is over and surrounding corresponding ones of the plurality of discrete vertical arrangements of horizontal nanowires. The integrated circuit structure also includes a tap structure adjacent to the varactor structure on the semiconductor substrate. The tap structure includes a plurality of merged vertical arrangements of horizontal nanowires. A plurality of semiconductor structures is over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires.
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公开(公告)号:US20230317808A1
公开(公告)日:2023-10-05
申请号:US17700002
申请日:2022-03-21
Applicant: Intel Corporation
Inventor: Rishabh MEHANDRU , Cory WEBER , Clifford ONG , Sukru YEMENICIOGLU , Tahir GHANI , Brian GREENE
IPC: H01L29/423 , H01L27/088 , H01L29/786 , H01L29/06
CPC classification number: H01L29/42392 , H01L27/088 , H01L29/0673 , H01L29/78696
Abstract: Embodiments of the present disclosure include integrated circuit structures having differentiated channel sizing, and methods of fabricating integrated circuit structures having differentiated channel sizing. In an example, a structure includes a memory region having a first vertical stack of horizontal nanowires having a first number of nanowires. The integrated circuit structure also includes a logic region having a second vertical stack of horizontal nanowires spaced apart from the first vertical stack of horizontal nanowires. The second vertical stack of horizontal nanowires has a second number of nanowires less than the first number of nanowires.
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公开(公告)号:US20220416022A1
公开(公告)日:2022-12-29
申请号:US17357767
申请日:2021-06-24
Applicant: Intel Corporation
Inventor: Nicholas THOMSON , Kalyan KOLLURU , Ayan KAR , Rui MA , Benjamin ORR , Nathan JACK , Biswajeet GUHA , Brian GREENE , Lin HU , Chung-Hsun LIN , Sabih OMAR
IPC: H01L29/06 , H01L29/423 , H01L27/12
Abstract: Substrate-less nanowire-based lateral diode integrated circuit structures, and methods of fabricating substrate-less nanowire-based lateral diode integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a stack of nanowires. A plurality of P-type epitaxial structures is over the stack of nanowires. A plurality of N-type epitaxial structures is over the stack of nanowires. One or more gate structures is over the stack of nanowires. A semiconductor material is between and in contact with vertically adjacent ones of the stack of nanowires.
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公开(公告)号:US20220102385A1
公开(公告)日:2022-03-31
申请号:US17033418
申请日:2020-09-25
Applicant: Intel Corporation
Inventor: Biswajeet GUHA , Brian GREENE , Avyaya JAYANTHINARASIMHAM , Ayan KAR , Benjamin ORR , Chung-Hsun LIN , Curtis TSAI , Kalyan KOLLURU , Kevin FISCHER , Lin HU , Nathan JACK , Nicholas THOMSON , Rishabh MEHANDRU , Rui MA , Sabih OMAR
IPC: H01L27/12
Abstract: Substrate-free integrated circuit structures, and methods of fabricating substrate-free integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a fin, a plurality of gate structures over the fin, and a plurality of alternating P-type epitaxial structures and N-type epitaxial structures between adjacent ones of the plurality of gate structures.
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公开(公告)号:US20220344519A1
公开(公告)日:2022-10-27
申请号:US17860056
申请日:2022-07-07
Applicant: Intel Corporation
Inventor: Ayan KAR , Saurabh MORARKA , Carlos NIEVA-LOZANO , Kalyan KOLLURU , Biswajeet GUHA , Chung-Hsun LIN , Brian GREENE , Tahir GHANI
Abstract: Gate-all-around integrated circuit structures including varactors are described. For example, an integrated circuit structure includes a varactor structure on a semiconductor substrate. The varactor structure includes a plurality of discrete vertical arrangements of horizontal nanowires. A plurality of gate stacks is over and surrounding corresponding ones of the plurality of discrete vertical arrangements of horizontal nanowires. The integrated circuit structure also includes a tap structure adjacent to the varactor structure on the semiconductor substrate. The tap structure includes a plurality of merged vertical arrangements of horizontal nanowires. A plurality of semiconductor structures is over and surrounding corresponding ones of the plurality of merged vertical arrangements of horizontal nanowires.
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公开(公告)号:US20220199610A1
公开(公告)日:2022-06-23
申请号:US17131616
申请日:2020-12-22
Applicant: Intel Corporation
Inventor: Biswajeet GUHA , Brian GREENE , Daniel SCHULMAN , William HSU , Chung-Hsun LIN , Curtis TSAI , Kevin FISCHER
Abstract: Substrate-less electrostatic discharge (ESD) integrated circuit structures, and methods of fabricating substrate-less electrostatic discharge (ESD) integrated circuit structures, are described. For example, a substrate-less integrated circuit structure includes a first fin and a second fin protruding from a semiconductor pedestal. An N-type region is in the first and second fins. A P-type region is in the semiconductor pedestal. A P/N junction is between the N-type region and the P-type region, the P/N junction on or in the semiconductor pedestal.
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