TECHNIQUES FOR ANALOG MULTIBIT DATA REPRESENTATION FOR IN-MEMORY COMPUTING

    公开(公告)号:US20220406392A1

    公开(公告)日:2022-12-22

    申请号:US17353493

    申请日:2021-06-21

    Abstract: Various embodiments provide apparatuses, systems, and methods for multibit analog representation, e.g., for in-memory computing. Embodiments may include a single-ended or differential ladder network to generate an analog value (e.g., a voltage or charge) based on a set of bits from a memory array. The ladder network may include a plurality of branches coupled to an output line, wherein individual branches include a capacitor with a first terminal coupled to the output line and a switch coupled to a second terminal of the capacitor. The switch may be controlled by a respective bit of the set of bits to selectively couple the second terminal of the capacitor to a first voltage node or a second voltage node based on a value of the respective bit. Other embodiments may be described and claimed.

    BAYESIAN NEURAL NETWORK AND METHODS AND APPARATUS TO OPERATE THE SAME

    公开(公告)号:US20210034947A1

    公开(公告)日:2021-02-04

    申请号:US17075527

    申请日:2020-10-20

    Abstract: Methods, apparatus, systems, and articles of manufacture providing an improved Bayesian neural network and methods and apparatus to operate the same are disclosed. An example apparatus includes an oscillator to generate a first clock signal; a resistive element to adjust a slope of a rising edge of a second clock signal; a voltage sampler to generate a sample based on at least one of (a) a first voltage of the first clock signal when a second voltage of the second clock signal satisfies a threshold or (b) a third voltage of the second clock signal when a fourth voltage of the first clock signal satisfies the threshold; and a charge pump to adjust a weight based on the sample, the weight to adjust data in a model.

    Error-tolerant architecture for power-efficient computing

    公开(公告)号:US10969431B1

    公开(公告)日:2021-04-06

    申请号:US16724576

    申请日:2019-12-23

    Abstract: A semiconductor package comprises a controlled voltage domain (CVD) and a master voltage domain (MVD). The MVD comprises an error-tolerance control (ETC) circuit. A basic execution block in the CVD generates a basic output value, based on at least two input values. A test execution block in the CVD generates a test digital root, based on digital roots of the input values. A digital root comparator in the CVD determines whether a digital root of the basic output value matches the test digital root. An error reporter in the CVD sends an error report to the ETC circuit in response to a determination that the digital roots do not match. The ETC may automatically adjust at least one power characteristic of the CVD, based on the error report. Other embodiments are described and claimed.

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