System and Method for Direct Writing to a Wafer
    1.
    发明申请
    System and Method for Direct Writing to a Wafer 有权
    直接写入晶片的系统和方法

    公开(公告)号:US20090268184A1

    公开(公告)日:2009-10-29

    申请号:US12203494

    申请日:2008-09-03

    IPC分类号: G03B27/54

    摘要: A direct-write (DW) exposure system is provided which includes a stage for holding a substrate and configured to scan the substrate along an axis during exposure, a data processing module for processing pattering data and generating instructions associated with the patterning data, and an exposure module that includes a plurality of beams that are focused onto the substrate such that the beams cover a width that is larger than a width of a field size and a beam controller that controls the plurality of beams in accordance with the instructions as the substrate is scanned along the axis. The widths are in a direction different from the axis.

    摘要翻译: 提供了一种直接写入(DW)曝光系统,其包括用于保持衬底并被配置为在曝光期间沿着轴扫描衬底的台,用于处理图案数据并产生与图案形成数据相关联的指令的数据处理模块,以及 曝光模块,其包括聚焦在基板上的多个光束,使得光束覆盖大于场大小的宽度的宽度;以及根据作为衬底的指令来控制多个光束的光束控制器 沿轴扫描。 宽度在与轴不同的方向。

    High-volume manufacturing massive e-beam maskless lithography system
    2.
    发明授权
    High-volume manufacturing massive e-beam maskless lithography system 有权
    大批量生产大规模电子束无掩模光刻系统

    公开(公告)号:US08143602B2

    公开(公告)日:2012-03-27

    申请号:US12411229

    申请日:2009-03-25

    IPC分类号: G21K5/08

    摘要: The present disclosure provides a maskless lithography apparatus. The apparatus includes a plurality of writing chambers, each including: a wafer stage operable to secure a wafer to be written and a multi-beam module operable to provide multiple radiation beams for writing the wafer; an interface operable to transfer wafers between each of the writing chambers and a track unit for processing an imaging layer to the wafers; and a data path operable to provide a set of circuit pattern data to each of the multiple radiation beams in each of the writing chambers.

    摘要翻译: 本公开提供一种无掩模光刻设备。 该装置包括多个写入室,每个写入室包括:可操作以固定要写入的晶片的晶片台和可操作以提供用于写入晶片的多个辐射束的多光束模块; 可操作以在每个写入室之间传送晶片的接口和用于将成像层处理到晶片的轨道单元; 以及数据路径,其可操作以向每个写入室中的每个多个辐射束提供一组电路图案数据。

    System and method for direct writing to a wafer
    3.
    发明授权
    System and method for direct writing to a wafer 有权
    用于直接写入晶片的系统和方法

    公开(公告)号:US07851774B2

    公开(公告)日:2010-12-14

    申请号:US12203494

    申请日:2008-09-03

    IPC分类号: H01J49/44

    摘要: A direct-write (DW) exposure system is provided which includes a stage for holding a substrate and configured to scan the substrate along an axis during exposure, a data processing module for processing pattering data and generating instructions associated with the patterning data, and an exposure module that includes a plurality of beams that are focused onto the substrate such that the beams cover a width that is larger than a width of a field size and a beam controller that controls the plurality of beams in accordance with the instructions as the substrate is scanned along the axis. The widths are in a direction different from the axis.

    摘要翻译: 提供了一种直接写入(DW)曝光系统,其包括用于保持衬底并被配置为在曝光期间沿着轴扫描衬底的台,用于处理图案数据并产生与图案形成数据相关联的指令的数据处理模块,以及 曝光模块,其包括聚焦在基板上的多个光束,使得光束覆盖大于场大小的宽度的宽度;以及根据作为衬底的指令来控制多个光束的光束控制器 沿轴扫描。 宽度在与轴不同的方向。

    HIGH-VOLUME MANUFACTURING MASSIVE E-BEAM MASKLESS LITHOGRAPHY SYSTEM
    4.
    发明申请
    HIGH-VOLUME MANUFACTURING MASSIVE E-BEAM MASKLESS LITHOGRAPHY SYSTEM 有权
    高容量制造大质量电子束MASTRESS LITHOGRAPHY系统

    公开(公告)号:US20100248158A1

    公开(公告)日:2010-09-30

    申请号:US12411229

    申请日:2009-03-25

    IPC分类号: G03F7/20 G21K5/04

    摘要: The present disclosure provides a maskless lithography apparatus. The apparatus includes a plurality of writing chambers, each including: a wafer stage operable to secure a wafer to be written and a multi-beam module operable to provide multiple radiation beams for writing the wafer; an interface operable to transfer wafers between each of the writing chambers and a track unit for processing an imaging layer to the wafers; and a data path operable to provide a set of circuit pattern data to each of the multiple radiation beams in each of the writing chambers.

    摘要翻译: 本公开提供一种无掩模光刻设备。 该装置包括多个写入室,每个写入室包括:可操作以固定要写入的晶片的晶片台和可操作以提供用于写入晶片的多个辐射束的多光束模块; 可操作以在每个写入室之间传送晶片的接口和用于将成像层处理到晶片的轨道单元; 以及数据路径,其可操作以向每个写入室中的每个多个辐射束提供一组电路图案数据。

    ERROR DIFFUSION AND GRID SHIFT IN LITHOGRAPHY
    5.
    发明申请
    ERROR DIFFUSION AND GRID SHIFT IN LITHOGRAPHY 有权
    误差扩展和网格移位在LITHOGRAPHY

    公开(公告)号:US20130232455A1

    公开(公告)日:2013-09-05

    申请号:US13409765

    申请日:2012-03-01

    IPC分类号: G06F17/50

    CPC分类号: G03F1/36

    摘要: The present disclosure involves a method of data preparation in lithography processes. The method of data preparation includes providing an integrated circuit (IC) layout design in a graphic database system (GDS) grid, and converting the IC layout design GDS grid to a second exposure grid by applying an error diffusion and a grid shift technique to a sub-pixel exposure grid.

    摘要翻译: 本公开涉及在光刻工艺中的数据准备方法。 数据准备的方法包括在图形数据库系统(GDS)网格中提供集成电路(IC)布局设计,并且通过向第二曝光网格应用误差扩散和网格移位技术将IC布局设计GDS网格转换为第二曝光网格 子像素曝光网格。

    NON-DIRECTIONAL DITHERING METHODS
    6.
    发明申请
    NON-DIRECTIONAL DITHERING METHODS 有权
    非方向抖动方法

    公开(公告)号:US20130232453A1

    公开(公告)日:2013-09-05

    申请号:US13409653

    申请日:2012-03-01

    IPC分类号: G06F17/50

    摘要: A method of data preparation in lithography processes is described. The method includes providing an integrated circuit (IC) layout design in a graphic database system (GDS) grid, converting the IC layout design GDS grid to a first exposure grid, applying a non-directional dither technique to the first exposure, coincident with applying dithering to the first expose grid, applying a grid shift to the first exposure grid to generate a grid-shifted exposure grid and applying a dither to the grid-shifted exposure grid, and adding the first exposure grid (after receiving dithering) to the grid-shifted exposure grid (after receiving dithering) to generate a second exposure grid.

    摘要翻译: 描述了光刻工艺中数据准备的方法。 该方法包括在图形数据库系统(GDS)网格中提供集成电路(IC)布局设计,将IC布局设计GDS网格转换为第一曝光网格,将非定向抖动技术应用于第一曝光,与应用 将第一曝光栅格抖动到第一曝光栅格,将栅格移位施加到第一曝光栅格以产生栅格移动的曝光栅格并向栅格曝光栅格施加抖动,并将第一曝光栅格(在接收抖动之后)添加到栅格 转换曝光网格(在接收到抖动之后)以产生第二曝光网格。

    Pattern generator for a lithography system
    7.
    发明授权
    Pattern generator for a lithography system 有权
    光刻系统的图案发生器

    公开(公告)号:US09001308B2

    公开(公告)日:2015-04-07

    申请号:US13757477

    申请日:2013-02-01

    IPC分类号: G03F7/20

    摘要: A pattern generator includes a minor array plate having a mirror, at least one electrode plate disposed over the minor array plate, a lens let disposed over the minor, and at least one insulator layer sandwiched between the mirror array plate and the electrode plate. The electrode plate includes a first conducting layer and a second conducting layer. The lens let has a non-straight sidewall formed in the electrode plate. The pattern generator further includes at least one insulator sandwiched between two electrode plates. The non-straight sidewall can be a U-shaped sidewall or an L-shaped sidewall.

    摘要翻译: 图案发生器包括具有反射镜的次阵列板,设置在次阵列板上的至少一个电极板,设置在副镜上的透镜,以及夹在反射镜阵列板和电极板之间的至少一个绝缘体层。 电极板包括第一导电层和第二导电层。 透镜让具有形成在电极板中的非直的侧壁。 图案发生器还包括夹在两个电极板之间的至少一个绝缘体。 非直的侧壁可以是U形侧壁或L形侧壁。

    Multiple-patterning overlay decoupling method
    9.
    发明授权
    Multiple-patterning overlay decoupling method 有权
    多图案叠加去耦方法

    公开(公告)号:US09134627B2

    公开(公告)日:2015-09-15

    申请号:US13328264

    申请日:2011-12-16

    IPC分类号: H01L21/66 G03F7/20 H01L23/544

    摘要: A method for fabricating a semiconductor device is disclosed. An exemplary method includes forming a first structure in a first layer by a first exposure and determining placement information of the first structure. The method further includes forming a second structure in a second layer overlying the first layer by a second exposure and determining placement information of the second structure. The method further includes forming a third structure including first and second substructures in a third layer overlying the second layer by a third exposure. Forming the third structure includes independently aligning the first substructure to the first structure and independently aligning the second substructure to the second structure.

    摘要翻译: 公开了一种制造半导体器件的方法。 一种示例性方法包括通过第一曝光在第一层中形成第一结构并确定第一结构的放置信息。 该方法还包括通过第二曝光在覆盖第一层的第二层中形成第二结构,并确定第二结构的放置信息。 该方法还包括在第三层中形成第三结构,该第三结构包括通过第三次曝光覆盖第二层的第三层中的第一和第二子结构。 形成第三结构包括将第一子结构独立地对准第一结构并且将第二子结构独立地对准到第二结构。

    Error diffusion and grid shift in lithography
    10.
    发明授权
    Error diffusion and grid shift in lithography 有权
    光刻中的误差扩散和栅格位移

    公开(公告)号:US08510687B1

    公开(公告)日:2013-08-13

    申请号:US13409765

    申请日:2012-03-01

    IPC分类号: G06F17/50

    CPC分类号: G03F1/36

    摘要: The present disclosure involves a method of data preparation in lithography processes. The method of data preparation includes providing an integrated circuit (IC) layout design in a graphic database system (GDS) grid, and converting the IC layout design GDS grid to a second exposure grid by applying an error diffusion and a grid shift technique to a sub-pixel exposure grid.

    摘要翻译: 本公开涉及在光刻工艺中的数据准备方法。 数据准备的方法包括在图形数据库系统(GDS)网格中提供集成电路(IC)布局设计,并且通过向第二曝光网格应用误差扩散和网格移位技术将IC布局设计GDS网格转换为第二曝光网格 子像素曝光网格。