摘要:
A NAND flash memory device includes a first and second memory blocks. A shared row selection circuit is provided between the first and second memory blocks, selectively or simultaneously selecting the first and second memory blocks, and transferring wordline voltages to a selected memory block by means in a multi-boosting manner.
摘要:
A flash memory device includes a flash memory and a buffer memory. The flash memory is divided into a main region and a spare region. The buffer memory is a random access memory and has the same structure as the flash memory. In addition, the flash memory device further includes control means for mapping an address of the flash memory applied from a host so as to divide a structure of the buffer memory into a main region and a spare region and for controlling the flash memory and the buffer memory to store data of the buffer memory in the flash memory or to store data of the flash memory in the buffer memory.
摘要:
In a read method for a memory device, a bit line is set with data in a first memory cell; and the data on the bit line is stored in a register. The data in the register is transferred to a data bus while setting the bit line with data in a second memory cell. In another read method for a memory device, a bit line of a first memory cell is initialized and the bit line is pre-charged with a pre-charge voltage. Data in a memory cell on the bit line is developed, and a register corresponding to the bit line is initialized. The data on the bit line is stored in the register. The data in the register is output externally while performing the initializing, pre-charging, making and initializing to set the bit line with data in a second memory cell.
摘要:
Multi-bit flash memory devices are provided. The multi-bit flash memory device includes an array of memory cells and a page buffer block including page buffers. Each of the page buffers has a single latch structure and performs a write operation with respect to memory cells according to loaded data. A buffer random access memory (RAM) is configured to store program data provided from an external host device during a multi-bit program operation. Control logic is provided that is configured to control the page buffer block and the buffer RAM so that program data stored in the buffer RAM is reloaded into the page buffer block whenever data programmed before the multi-bit program operation is compared with data to be currently programmed. The control logic is configured to store data to be programmed next in the buffer RAM before the multi-bit program operation is completed.
摘要:
Methods of performing multi-block erasing operations on a memory device that includes a plurality of memory blocks are provided. Pursuant to these methods, the rate at which a first voltage that is applied to the memory blocks that are to be erased during the multi-block erasing operation rises is controlled based on the number of memory blocks that are to be erased. The memory device may be a flash memory device, and the first voltage may be an erasing voltage that is applied to a substrate of the flash memory device. The rate at which the first voltage rises may be set so that the substrate of the flash memory device reaches the erasing voltage level at approximately the same time regardless of the number of memory blocks that are to be erased.
摘要:
A dual buffer memory system capable of improving system performance by reducing a data transmission time and a control method thereof are provided. The dual buffer memory system includes a flash memory block and a plurality of buffers. The dual buffer memory system uses a dual buffering scheme in which one buffer among the plurality of buffers interacts with the flash memory block and simultaneously a different buffer among the plurality of buffers interacts with a host. Therefore, it is possible to reduce a data transmission time between the flash memory and the host, thereby improving system performance.
摘要:
A flash memory device is disclosed and includes a memory cell array comprising memory cells arranged in rows and columns, a page buffer circuit having a single latch structure and configured to read data from a selected page in the memory cell array, and a controller controlling the page buffer circuit to detect memory cells having an improper voltage distribution causes by charge leakage within the selected page.
摘要:
A method of programming a flash memory device includes charging selection lines with a first voltage while applying program data to bit lines to during a bit line setup interval, then activating a block word line to electrically connect the selection lines to corresponding word lines, and then applying a second voltage, greater than the first voltage, to a selected one of the selection lines. Related devices are also disclosed.
摘要:
There is provided a flash memory device capable of manipulating multi-bit and single-bit data. The flash memory device can include a memory cell array with a plurality of memory blocks. The flash memory device can also include a judgment circuit for storing multi-bit/single-bit information indicating whether each of the memory blocks is a multi-bit memory block or not, determining whether or not a memory block of an inputted block address is a multi-bit memory block according to the stored multi-bit/single-bit information and outputting an appropriate flag signal. A read/write circuit for selectively performing multi-bit and single-bit read/program operations of the memory block corresponding to the block address is also included, as well as control logic for controlling the read/write circuit such that the read/write circuit can perform multi-bit or single-bit read/program operations based on the flag signal. An error checking and correction (ECC) circuit including a multi-bit ECC unit and a single-bit ECC unit for checking and correcting an error in a data of the read/write circuit can also be included.
摘要:
A wordline decoder for a non-volatile memory device includes a first inverter to invert a block selection signal into a first inverted result on a first node, a second inverter to invert the signal on the first node into a second inverted result on a second node, a first and a second transistor, each coupled to a power supply, coupled in series between the second node and a third node, a third transistor coupled between the third node and a fourth node having a gate coupled to the third node, a fourth transistor coupled between a high voltage supply and a fifth node having a source coupled to the high voltage supply and a gate coupled to the third node, and a fifth transistor coupled between the fifth node and the third node having a gate coupled to the first node.