公开(公告)号：US12228509B2

公开(公告)日：2025-02-18

申请号：US17273631

申请日：2019-09-06

Applicant: THE WAVE TALK, INC. ,  KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： YongKeun Park ,  KyeoReh Lee ,  Seungwoo Shin ,  Geon Kim ,  Young Dug Kim

IPC: G16B40/00 ,  C12Q1/06 ,  G01N21/47 ,  G06N20/00 ,  G06V10/764 ,  G06V10/82 ,  G06V20/69

Abstract: According to an embodiment of the present disclosure, provided is an apparatus for providing microorganism information, including: a receiving unit configured to receive a plurality of images obtained by photographing in time series an outgoing wave emitted from a sample; a detecting unit configured to extract a feature of a change over time from the plurality of images obtained by photographing in time series; a learning unit configured to machine-learn classification criteria based on the extracted feature; and a determining unit configured to classify the type or concentration of a microorganism included in the sample based on the classification criteria, wherein each of the plurality of images includes speckle information generated by multiple scattering by the microorganism due to waves incident on the sample.

公开(公告)号：US20170357084A1

公开(公告)日：2017-12-14

申请号：US15243265

申请日：2016-08-22

Applicant: Korea Advanced Institute of Science and Technology ,  Tomocube, Inc.

Inventor： YongKeun Park ,  Seungwoo Shin ,  Gwang Sik Park

IPC: G02B21/36 ,  G01N21/64 ,  G03H1/00 ,  G01N21/41 ,  G02B21/16 ,  G02B27/46 ,  G02B26/08

CPC classification number: G02B21/367 ,  G01N21/4133 ,  G01N21/45 ,  G01N21/6458 ,  G01N21/6486 ,  G01N2021/1787 ,  G01N2201/0635 ,  G02B21/16 ,  G02B26/0833 ,  G02B27/46 ,  G03H1/0005 ,  G03H2001/005

Abstract: An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.

公开(公告)号：US11821834B2

公开(公告)日：2023-11-21

申请号：US17753479

申请日：2021-01-07

Applicant: TOMOCUBE, INC. ,  KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Yongkeun Park ,  Seungwoo Shin

IPC: G01N21/23 ,  G01B9/02 ,  G01N21/41 ,  G01N21/45 ,  G01N21/17

CPC classification number: G01N21/23 ,  G01B9/02 ,  G01N21/41 ,  G01N21/45 ,  G01N2021/1787

Abstract: A method and apparatus for measuring a 3-D refractive index tensor are presented. The method for measuring a 3-D refractive index tensor according to an embodiment comprises the steps of: controlling incident light of a plane wave with respect to at least one angle and polarization; and measuring, in a polarization-dependent manner, the 2-D diffracted light of a specimen with respect to the incident light incident at the at least one angle and polarization, wherein the birefringence value and the 3-D structure of an alignment direction of molecules in the specimen having birefringence may be measured.

公开(公告)号：US10215697B2

公开(公告)日：2019-02-26

申请号：US14981355

申请日：2015-12-28

Applicant: Korea Advanced Institute of Science and Technology

Inventor： YongKeun Park ,  Kyoohyun Kim ,  Seungwoo Shin

IPC: G01N21/45

Abstract: A method and apparatus for measuring 3D refractive-index tomograms using a wavefront shaper in ultra-high speed and high precision is provided. The method includes the steps of modifying at least one of an illumination angle and a wavefront pattern of an incident ray through the wavefront shaper and leading the modified incident ray to a sample, measuring a 2D optical field, which passes through the sample, through an interferometry along at least one or more of the incident rays, and obtaining 3D refractive-index tomograms through measured information of the 2D optical field.

公开(公告)号：US10082662B2

公开(公告)日：2018-09-25

申请号：US15243265

申请日：2016-08-22

Applicant: Korea Advanced Institute of Science and Technology ,  Tomocube, Inc.

Inventor： YongKeun Park ,  Seungwoo Shin ,  Gwang Sik Park

IPC: G02B21/36 ,  G01N21/41 ,  G01N21/64 ,  G02B21/16 ,  G02B26/08 ,  G02B27/46 ,  G03H1/00 ,  G01N21/45 ,  G01N21/17

CPC classification number: G02B21/367 ,  G01N21/4133 ,  G01N21/45 ,  G01N21/6458 ,  G01N21/6486 ,  G01N2021/1787 ,  G01N2201/0635 ,  G02B21/16 ,  G02B26/0833 ,  G02B27/46 ,  G03H1/0005 ,  G03H2001/005

Abstract: An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.