VERTICAL NON-VOLATILE MEMORY WITH LOW RESISTANCE SOURCE CONTACT

    公开(公告)号:US20230397419A1

    公开(公告)日:2023-12-07

    申请号:US17816651

    申请日:2022-08-01

    CPC classification number: H01L27/11582 G11C16/0483 H01L27/11556

    Abstract: For manufacturing a memory device, a system may form a trench between a first portion and a second portion of a stack. A bottom wall of the trench may include a spacer material. The system may remove a first and a second oxide material to reform the trench, and remove a polysilicon material in a lateral direction to expose a third oxide material and a channel structure. The third oxide material may form the bottom wall of the trench. The system may remove, in a lateral direction, the first oxide material, a portion of the second oxide material, the third oxide material, and a fourth oxide material of the channel structure. The system may deposit a metal material, in the trench, in contact with a doped polysilicon material of the channel structure.

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