公开(公告)号：US20150303933A1

公开(公告)日：2015-10-22

申请号：US14683325

申请日：2015-04-10

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Mauro GIACOMINI ,  Carmelo BURGIO

IPC: H03M1/08 ,  H03M1/46 ,  H03M1/12 ,  H03M1/10

CPC classification number: H03M1/0809 ,  H03M1/1033 ,  H03M1/1057 ,  H03M1/1245 ,  H03M1/464 ,  H03M1/466 ,  H03M1/687 ,  H03M1/804 ,  H03M1/806

Abstract: A method of calibrating a thermometer-code SAR-A/D converter is provided. The thermometer-code SAR-A/D converter includes an Nbit-bit digital-to-analog converter (DAC) for outputting an Nbit-bit output code. The DAC includes a first subconverter having a plurality of NTh thermometer elements Tj and a second subconverter having a plurality of NBin binary-weighted elements. The Nbit output code is equal to the sum of NBitTh and NBitBin where NTh=2NBitTh and NBitBin is equal to NBin=NBitBin. The calibration method includes determining an Integral Non-Linearity error value (εR) of an Rth thermometer-code level of the thermometer elements. The method further includes reducing the highest of the error value εR to obtain a reduced error value, and generating the output code according to said reduced error.

Abstract translation: 提供了一种校准温度计编码SAR-A / D转换器的方法。 温度计编码SAR-A / D转换器包括用于输出N位位输出代码的N位位数/模转换器（DAC）。 DAC包括具有多个NTh温度计元件Tj的第一子转换器和具有多个NBin二进制加权元件的第二子转换器。 Nbit输出代码等于NBitTh和NBitBin之和，其中NTh = 2NBitTh和NBitBin等于NBin = NBitBin。 校准方法包括确定温度计元件的Rth温度计代码电平的积分非线性误差值（＆amp; R）。 该方法还包括减小误差值的最高值，以获得减小的误差值，并根据所述减小的误差产生输出代码。

公开(公告)号：US20160149583A1

公开(公告)日：2016-05-26

申请号：US14835110

申请日：2015-08-25

Applicant: STMICROELECTRONICS S.R.L.

Inventor： Carmelo BURGIO ,  Mauro GIACOMINI

IPC: H03M1/10 ,  H03M1/12 ,  H03M1/80 ,  H03M1/46

CPC classification number: H03M1/1047 ,  H03M1/00 ,  H03M1/0695 ,  H03M1/1033 ,  H03M1/12 ,  H03M1/1245 ,  H03M1/462 ,  H03M1/466 ,  H03M1/687 ,  H03M1/802 ,  H03M1/804 ,  H03M1/806 ,  H03M1/808

Abstract: The present disclosure relates to a method of self-calibration of a successive approximation register-analog-to-digital converter. The method includes measuring an error value for each thermometer element of a plurality of thermometer elements and determining a mean value of measured error values. The method also includes generating a thermometer scale where each level of the thermometer scale will be an incremental sum of each value of a first subset, and each further level of the thermometer scale will be a sum of all values of a second subset plus the incremental sum of the elements of the first subset in any order. In addition, the method includes generating the output code according to the thermometer scale.

Abstract translation: 本公开涉及逐次逼近寄存器 - 模数转换器的自校准方法。 该方法包括测量多个温度计元件中每个温度计元件的误差值，并确定测量误差值的平均值。 该方法还包括生成温度计量表，其中温度计量表的每个水平将是第一子集的每个值的增量和，并且温度计量度的每个进一步水平将是第二子集的所有值加上增量 任何顺序的第一个子集元素的总和。 此外，该方法包括根据温度计量程生成输出代码。

公开(公告)号：US20210359657A1

公开(公告)日：2021-11-18

申请号：US17314905

申请日：2021-05-07

Applicant: STMicroelectronics S.r.l.

Inventor： Gaetano COSENTINO ,  Carmelo BURGIO

IPC: H03G3/30 ,  H03F3/19 ,  H03F3/21 ,  H03M1/66 ,  H03D3/00

Abstract: A receiver or transmitter circuit includes a signal propagation path between a radio-frequency (RF) signal node and a baseband processing circuit. Variable gain circuitry is configured to vary a gain applied to a signal propagating between the RF signal node and the baseband processing circuit. The variable gain circuitry varies the gain via first, coarse steps as well as via second, fine steps. This facilitates fine matching of the gains experienced by signals propagating over the in-phase and the quadrature branches in the transmitter and/or receiver circuit.

公开(公告)号：US20210385059A1

公开(公告)日：2021-12-09

申请号：US17335336

申请日：2021-06-01

Applicant: STMicroelectronics S.r.l.

Inventor： Carmelo BURGIO ,  Walter GIRARDI ,  Sergio LECCE

IPC: H04L7/00 ,  H04L1/00

Abstract: An input signal arranged in frames is received. The frames include a cyclic redundancy check (CRC) field including a number of bits having bit edges. A timing signal is generated to include adjustable duration waveforms at one of a first duration value and a second duration value. A CRC check determines the occurrence, over the duration, of a number of waveforms of the timing signal having their duration adjusted to one of the first duration value and the second duration value which corresponds to the number of bits. A check signal is produced having a pass/fail value. If pass, the duration of the waveforms in the timing signal is maintained adjusted to the one of the first duration value and the second duration value. If fail, the duration of the waveforms in the timing signal is re-adjusted to the other of the first duration value and the second duration value.

公开(公告)号：US20160191005A1

公开(公告)日：2016-06-30

申请号：US14860847

申请日：2015-09-22

Applicant: STMICROELECTRONICS S.r.l.

Inventor： Carmelo BURGIO

IPC: H03F3/217

CPC classification number: H03F3/68 ,  H03F3/183 ,  H03F3/211 ,  H03F3/2175 ,  H03F2200/03 ,  H03F2200/375 ,  H03M1/1023 ,  H03M1/1038 ,  H03M1/1076 ,  H03M1/66 ,  H04R29/001

Abstract: A signal processing chain, such as an audio chain, produces an analog output signal from a digital input signal. The signal processing chain is operated by generating a first flag signal for the analog output signal and one or more second flag signals for the digital input signal. Each flag signal assumes a first level or a second level and is set to the first level when a signal from which the flag is generated has a value within an amplitude window. An amount the first flag signal for the analog output signal and the second flag signal for the digital input signal match each other may be calculated for issuing an alert flag which indicates an impaired operation of the signal processing chain.

Abstract translation: 诸如音频链的信号处理链从数字输入信号产生模拟输出信号。 信号处理链通过产生用于模拟输出信号的第一标志信号和用于数字输入信号的一个或多个第二标志信号来操作。 每个标志信号呈现第一电平或第二电平，并且当产生标志的信号具有振幅窗内的值时，其被设置为第一电平。 可以计算用于模拟输出信号的第一标志信号和数字输入信号的第二标志信号相互匹配的量，用于发出指示信号处理链的操作受损的报警标志。